Printed strain sensors will be important in applications such as wearable devices, which monitor breathing and heart function. Such sensors need to combine high sensitivity and low resistance with other factors such as cyclability, low hysteresis, and minimal frequency/strain-rate dependence. Although nanocomposite sensors can display a high gauge factor (G), they often perform poorly in the other areas. Recently, evidence has been growing that printed, polymer-free networks of nanoparticles, such as graphene nanosheets, display very good all-round sensing performance, although the details of the sensing mechanism are poorly understood. Here, we perform a detailed characterization of the thickness dependence of piezoresistive sensors based on printed networks of graphene nanosheets. We find both conductivity and gauge factor to display percolative behavior at low network thickness but bulk-like behavior for networks above ∼100 nm thick. We use percolation theory to derive an equation for gauge factor as a function of network thickness, which well-describes the observed thickness dependence, including the divergence in gauge factor as the percolation threshold is approached. Our analysis shows that the dominant contributor to the sensor performance is not the effect of strain on internanosheet junctions but the strain-induced modification of the network structure. Finally, we find these networks display excellent cyclability, hysteresis, and frequency/strain-rate dependence as well as gauge factors as high as 350.
Printed strain sensors will be important in applications such as wearable devices, which monitor breathing and heart function. Such sensors need to combine high sensitivity and low resistance with other factors such as cyclability, low hysteresis, and minimal frequency/strain-rate dependence. Although nanocomposite sensors can display a high gauge factor (G), they often perform poorly in the other areas. Recently, evidence has been growing that printed, polymer-free networks of nanoparticles, such as graphene nanosheets, display very good all-round sensing performance, although the details of the sensing mechanism are poorly understood. Here, we perform a detailed characterization of the thickness dependence of piezoresistive sensors based on printed networks of graphene nanosheets. We find both conductivity and gauge factor to display percolative behavior at low network thickness but bulk-like behavior for networks above ∼100 nm thick. We use percolation theory to derive an equation for gauge factor as a function of network thickness, which well-describes the observed thickness dependence, including the divergence in gauge factor as the percolation threshold is approached. Our analysis shows that the dominant contributor to the sensor performance is not the effect of strain on internanosheet junctions but the strain-induced modification of the network structure. Finally, we find these networks display excellent cyclability, hysteresis, and frequency/strain-rate dependence as well as gauge factors as high as 350.
The rise of nanomaterials
has led to a renaissance in sensor development,
allowing the detection of a multitude of parameters including pressure,[1] magnetic fields,[2] temperature,[3] as well as the presence of unwanted gases,[4] ions,[5] chemicals,[6] or bacteria.[7] More
recently, growth in the wearable technology industry has seen personal
sensors enter our daily lives, for example, providing personalized[8] real-time health and activity monitoring.[9] Of particular importance in sensing are electromechanical
strain sensors, which detect mechanical deformation, converting strain
(or stress/pressure) into a change in electrical properties, typically
a change in the sensor resistance.[10] In
such piezoresistive sensors, the sensor sensitivity is expressed via
the gauge factor (G), which is defined as ΔR/R0 = Gε
in the limit of low strain (i.e., where the resistance response is
linear with strain[10,11]). This parameter is one of the
most important and certainly the most studied in piezoresistor research.
However, for sensors to be useful, as well as having high G, they also need to have a good linear range, low load/unload
hysteresis, and minimal variation of G with frequency.[12−15] Ideally, they would also be relatively easy to fabricate and install
where needed.[16−18] In terms of commercial sensors, while metal foil
strain gauges are relatively cheap and simple to produce,[10] these have a relatively low G-value of ∼2 as the resistance change is based entirely on
geometric changes.[19]Much effort
has been made to develop sensors with gauge factors
well beyond G ≈ 2. Many researchers have turned
to materials science to fabricate sensing materials with high G-values while minimizing negative properties such as hysteresis
and frequency dependence.[16−18,20] Nanocomposites have shown great promise due to their versatility
and the ability to tune sensor response by varying the matrix, the
filler, and the composition[11,21] with hundreds of papers
reporting results for piezoresistive nanocomposites with gauge factors
as high as 2600.[22] However, composite sensors
have a number of limitations: for example, the conductivity can be
low, partly due to polymer coatings around the conducting filler particles.[23] In addition, high load/unload hysteresis has
been reported in some composites.[13,16] Particularly
in soft composites, hysteresis and frequency/strain-rate dependence
have been linked directly to the viscoelasticity of the polymer matrix.[11]One possible way to address problems associated
with the polymer
matrix would be to avoid it altogether. In this way, a number of groups
have reported systems where the piezoresistive element is simply a
network of conductive nanoparticles[24] (e.g.,
CNTs,[25] graphene,[26,27] gold nanoparticles,[28] MXenes,[29] TMDs,[30] and silver
NPs/graphene[31]). A considerable advantage
of such systems is that the absence of interparticle polymer coatings
results in a network conductivity considerably higher than that found
in nanocomposites.[23] Such networks have
the added advantages that they are printable.[13,24,32−34] As with nanocomposites,
the received wisdom is that such networks are piezoresistive due to
the effect of stain on interparticle charge transport,[11] although a variety of mechanisms have been hypothesized
for different networks.[15]Graphene
is a particularly important component of nanostructured
piezoresistive sensors, both as a conductive filler in nanocomposites,[11] as well as in (polymer-free) films and networks.
Mono- and bilayer graphene sheets have a relatively low intrinsic
gauge factor of <10.[35−38] However, much higher values can be obtained by fabricating
nanostructured films consisting of arrays of graphene sheets or nanographene
films of weakly coupled grains. In this way, graphene-only piezoresistive
films have been fabricated through a range of methods including drop
casting,[39] laser scribing,[40,41] inkjet printing,[32] spray coating,[33] and CVD[26,42,43] (tabulated in the Supporting Information). In these reports, gauge factors as high as ∼600[42] were obtained for CVD-grown nanographene films.
Similarly, strain sensors based on CVD-grown films[44,45] and nanocomposites[46] of other 2D materials
have also been demonstrated.Although networks of nanoparticles
in general and graphene in particular
have some advantages as electromechanical sensors, their performance
tends to be poorly characterized in published works with very little
data given about sensor hysteresis or frequency dependence. In addition,
the effect of network thickness on electromechanical response has
not been quantitatively examined, while the piezoresistive mechanism
appears to be very poorly understood, beyond the general assumption
that the effect of strain on internanosheet transport is dominant.
While attempts have been made to model nanomaterial-based strain sensors,[47,48] the proposed models are not comprehensive and do not appear to fully
consider the effects of strain on both network dimensions and network
conductivity. In addition, analysis of the latter contribution should
consider all strain-induced changes in conductivity, not just the
effect of strain on junction resistance.Here, we show that
printed semitransparent graphene strain sensors
can exhibit an extremely high gauge factor while also having low hysteresis,
good frequency independence, and cyclability over thousands of cycles.
Furthermore, we have developed a model that relates gauge factor to
both conductivity and network thickness for percolating networks of
nanoparticles, which can hopefully guide future studies toward creating
higher gauge factor sensors, through a mechanistic understanding of
the piezoresistive effect in these systems.
Results and Discussion
Material
Production and Characterization
The strain
sensors were deposited by spray-casting of a graphene-based ink. The
graphene ink was produced by liquid-phase exfoliation (LPE)[49−51] as described in the Experimental Methods (Figure A). A typical
extinction spectrum is shown in Figure B, along with the characteristic high frequency plateau
and graphitic π–π* transition just below 300 nm.[52] The ink concentration and estimated mean number
of monolayers were determined from published metrics[53] to be C = 2 mg/mL and ⟨N⟩ ≈ 10–15 layers. A typical transmission
electron microscopy (TEM) image is shown in Figure C and shows the nanosheets to be irregularly
shaped as is typical for those produced by LPE.[50] TEM images were used to extract the nanosheet length distribution
as shown in Figure D: sampling 376 nanosheets, the mean nanosheet length was found to
be 330 ± 14 nm.
Figure 1
Graphene ink characterization. (A) Image of the graphene/chloroform
ink. (B) Extinction spectrum of the ink with the chloroform background
removed. As described in the text, this spectrum is consistent with
a mean nanosheet thickness of 10–15 monolayers (3–5
nm). (C) Transmission electron microscope (TEM) image of the nanosheets
found in the ink. (D) Nanosheet length distribution histogram from
TEM images, 376 nanosheets measured, mean length of 330 ± 14
nm. (E) Image of a printed, semitransparent graphene sensor on PDMS
substrate. (F) Scanning electron microscope (SEM) image of spray-printed
graphene film on PDMS. (G) Raman spectrum of a nanosheet network produced
from ink drop cast onto Si/SiO2 with the position of the
D, G, and 2D bands indicated.
Graphene ink characterization. (A) Image of the graphene/chloroform
ink. (B) Extinction spectrum of the ink with the chloroform background
removed. As described in the text, this spectrum is consistent with
a mean nanosheet thickness of 10–15 monolayers (3–5
nm). (C) Transmission electron microscope (TEM) image of the nanosheets
found in the ink. (D) Nanosheet length distribution histogram from
TEM images, 376 nanosheets measured, mean length of 330 ± 14
nm. (E) Image of a printed, semitransparent graphene sensor on PDMS
substrate. (F) Scanning electron microscope (SEM) image of spray-printed
graphene film on PDMS. (G) Raman spectrum of a nanosheet network produced
from ink drop cast onto Si/SiO2 with the position of the
D, G, and 2D bands indicated.Dispersions such as that in Figure A can be used to deposit thin films by spray casting[54] (Experimental Methods). Figure E is an
image of a thin, spray cast film deposited on a polydimethylsiloxane
(PDMS) substrate. It has been bent back on itself showing the substrate
flexibility along with the semitransparency of the thin graphene film
deposited on the surface. It is worth noting that, because they are
held together solely by internanosheet van der Waals forces, binder-free
nanosheet networks are mechanically very weak.[55] As such, they are not particularly durable and can be easily
removed from the substrate by abrasion. Thus, care must be taken when
handling them. Any real application would certainly require encapsulation,
perhaps via a sprayed polymer coating. A scanning electron microscope
(SEM) image of the printed network, Figure F, shows a generally continuous network of
nanosheets with some small pinholes. The Raman spectrum in Figure G shows the characteristic
D, G and 2D graphene peaks, with the relatively low D peak intensity
indicating that relatively few defects are present in the graphene,
and the Lorentzian shape of the 2D peak is consistent with that expected
for few-layer graphene.[53]
Variation of
Conductivity with Thickness
We fabricated
the piezoresistive sensors by using the dispersion described above
as an ink, which was spray-coated onto highly stretchable PDMS substrates.
This procedure resulted in semitransparent thin films (Figure E) consisting of disordered
arrays of nanosheets (Figure F). We produced approximately 50 such films, varying the films
thickness (measured by optical transmission, which was correlated
to profilometry thickness (Supporting Information)) between ∼45 and 200 nm. For each film, we measured the
electrical conductivity (in the absence of strain), σ0, which is plotted against film thickness (unstrained), t0, in Figure A. In all cases, the “0” subscript refers to
zero-strain. This graph shows the conductivity increases with increasing
thickness from ∼10–3 S/m for films of ∼45
nm thick before saturating above ∼150 nm at a conductivity
of ∼260 S/m. We note that no measurable conductivity was found
for networks thinner than 40 nm.
Figure 2
Printed nanosheet sensor characterization.
(A) Plot of nanosheet
film conductivity with thickness, measured at zero-strain (zero-strain
data indicated by the subscript “0”). Inset log–log
plot of σ0 versus (t0 – tc,0) with overlaid fit using eq for t0 < 110 nm. The data for t0 > 110 nm are considered bulk-like and plotted in red with the
average
value indicated by the dashed line. (B) Fractional resistance change
plotted versus strain for three representative sensors of varying
film thickness. The solid lines are linear fits. (C) Gauge factor
plotted against the thickness of the nanosheet film, with overlaid
fit from eq for t0 < 110 nm. The gauge factor plateaus for t0 > 110 nm in the bulk-like regime with an
average
of 39.5. (D) Plot of gauge factor as a function of conductivity, with
overlaid fit from eq . Again, the data for t0 > 110 nm
are
considered bulk-like and plotted in red. (E–G) SEM images of
three distinct sensors with thicknesses of 200, 95, and 40 nm, respectively.
The decreasing surface coverage is evident as the thickness is decreased,
and the few remaining nanosheet pathways can be seen in the 40 nm
sample. Fit parameters for (A), (C), and (D) are given in Table .
Printed nanosheet sensor characterization.
(A) Plot of nanosheet
film conductivity with thickness, measured at zero-strain (zero-strain
data indicated by the subscript “0”). Inset log–log
plot of σ0 versus (t0 – tc,0) with overlaid fit using eq for t0 < 110 nm. The data for t0 > 110 nm are considered bulk-like and plotted in red with the
average
value indicated by the dashed line. (B) Fractional resistance change
plotted versus strain for three representative sensors of varying
film thickness. The solid lines are linear fits. (C) Gauge factor
plotted against the thickness of the nanosheet film, with overlaid
fit from eq for t0 < 110 nm. The gauge factor plateaus for t0 > 110 nm in the bulk-like regime with an
average
of 39.5. (D) Plot of gauge factor as a function of conductivity, with
overlaid fit from eq . Again, the data for t0 > 110 nm
are
considered bulk-like and plotted in red. (E–G) SEM images of
three distinct sensors with thicknesses of 200, 95, and 40 nm, respectively.
The decreasing surface coverage is evident as the thickness is decreased,
and the few remaining nanosheet pathways can be seen in the 40 nm
sample. Fit parameters for (A), (C), and (D) are given in Table .
Table 1
Fit Parameters Obtained from Fitting
Data in Figure to
the Relevant Percolation Equations
parameter
value
From σ0 versus t0 (eq 2b)
σB,0
260 ± 20 S/m
tc,0
37 ± 5 nm
tx,0
120 ± 5 nm
n0
3.3 ± 0.3
From G versus t0 (eq 5)
GTNS
22 ± 4
tTNS
2.3 ± 0.3 μm
tc,0
27 ± 3 nm
From G versus σ0 (eq 6)
GTNS
21 ± 5
σTNS
(3 ± 1) × 107 S/m
n0
3.7 ± 0.3
To understand this behavior, we note that conductivity is usually
considered as an intrinsic material property, which is independent
of the sample dimensions. However, this is not the case in thin, disordered,
nanostructured films such as networks of graphene nanosheets or carbon
nanotubes.[56] While thick nanostructured
films do indeed show thickness-independent, bulk-like conductivity,
σB, this is not the case for thin networks. Once
the film thickness, t, falls below a critical value
(tx), it has been observed that the conductivity
decreases with decreasing film thickness. This effect is often referred
to as percolation and is largely associated with disorder. The falloff
in conductivity is linked with the reduction in number and connectivity
of conductive pathways through the film, reducing its current carrying
capacity. Eventually, for very thin films, a critical thickness, tc, is reached where only a single conductive
pathway remains. This critical thickness (tc) is known as the percolation threshold, the minimum thickness where
current will flow through the network.Within this framework,
the high-thickness, saturated conductivity
observed in Figure A represents the bulk-like conductivity, σB, while
the thickness-varying conductivity at low film thickness represents
the percolation regime. Such behavior has been observed in a number
of systems including very thin networks of nanomaterials such as nanotubes,
nanowires, and nanosheets and even thin evaporated metal films.[56,57]Below tx, the thickness-dependent
conductivity,
σ, can be described quantitatively via percolation theory:[56,58]where σc is a proportionality
constant without physical meaning and with poorly defined units and n is the percolation exponent. However, as described above,
when the network thickness exceeds a critical value (tx), then the conductivity saturates at a thickness-independent
value, σB, which can be associated with thick, bulk-like
networks.[56] At this critical thickness,
σB = σc(tx – tc), allowing us to replace σc in eq , leading toThis equation is superior to eq as all parameters have clear physical meanings and
well-defined units. Equation is general and should apply even when strain is applied to
the network, which means it can be used to analyze piezoresistive
sensors. We expect the effect of strain will be to change the values
of some or all of the parameters within the equation as compared to
their unstrained values. In the absence of strain, each parameter
simply takes on its zero-strain value, which we indicate via the subscript
zero:Equation has been
fit to the data in Figure A for t0 < 110 nm (allowing
for a transition region between thickness-dependent and thickness-independent
regimes), as shown in the inset of Figure A. The fit is represented by the solid black
line (reproduced in Figure A, main panel), which is consistent with n0 = 3.3 and tc,0 = 37 nm.
In addition, for thick films, the data saturate at a constant value
(dashed line) of σB,0 = 260 S/m, while the crossover
point of the solid and dashed lines yields tx,0 = 120 nm, values that are perfectly consistent with the
fit. These parameters and their errors are summarized in Table .
Electromechanical Properties
The literature would lead
us to expect solution-processed nanosheet networks such as those above
to display piezoresistive properties.[32,33,39,41] However, it is not
known whether, like the conductivity, the electromechanical response
displays bulk-like and percolative regimes. To investigate this, the
networks studied in Figure A were also subjected to electromechanical tests by straining
from 0% to 1% strain at a rate of 1%/s with examples shown in Figure B. At low strain,
the fractional resistance changes scales linearly with strain (ε)
according to ΔR/R0 = Gε, allowing the networks to be used as
strain sensors.[10] Here, G is most properly considered as the slope of the ΔR/R0 versus ε curve at low strain.
It is worth noting that these curves tend to be linear only up to
∼0.75–1% strain, which limits their utility to low-strain
sensing. This is consistent with the literature where the linear response
region for nanosheet-only strain sensors is typically below ∼5%
strain.[41,42] At higher strains, nonlinearities arise,
with cracking of the network suggested as a major contributor.[59,60] For comparison, we note that in composite systems the linear region
generally extends well beyond 1% as shown comprehensively in a recent
review.[12] In that paper, linear regions
as high as 100% strain were reported.[12,61] A negative
correlation between gauge factor and linear-strain-range was identified,
suggesting that for systems where higher gauge factors are possible,
the linear region only exists at low strain.The gauge factor
is plotted as a function of network thickness in Figure C. For thinner networks, G is highly thickness-dependent, behavior that has been
alluded to in a small number of papers but not explored in detail.[33,41,48] Interestingly, we observe a sharp
increase in G for very low thickness leading to very
high gauge factors of ∼350 for networks with thickness around
45 nm. Given that the percolation threshold is close to 40 nm, these
data are consistent with a divergence in G as tc is approached from above, behavior that is
reminiscent of piezoresistive nanocomposites.[47] Interestingly, similar to the conductivity data, G appears to be thickness-independent for thicknesses above about
120 nm. This behavior implies that, as with the conductivity data,
the gauge factor displays both bulk-like and percolative regimes.These low-thickness G-values compare favorably
with literature reports for solution-processed graphene nanosheet
films. Previous researchers have prepared strain sensors from graphene
networks prepared by drop casting,[41] inkjet
printing,[32] spray casting,[33] and self-assembly,[39] achieving
gauge factors (at low-strain) of ∼10, 125, 170, and ∼300,
respectively. Our best gauge factors (∼350) also compare favorably
to polymer-based nanocomposite sensors. A 2019 study of 200 nanocomposite
strain sensors[12] ranked the reported G-values, which ranged from 0.01 to 2600.[22] Our best sensors would rank fifth on this scale. While
nanosheet networks and nanocomposite films are cheap and easy to prepare,
more sophisticated methods have been used to make the highest sensitivity
published sensors. For example, CVD grown films have yielded sensitivities
as high as G = 300 [ref (26)] or even G = 600 for remote
plasma-enhanced chemical vapor deposition (RPECVD) grown films.[42]As mentioned above, for thicknesses greater
than ∼120 nm,
the gauge factor saturates with a mean value of 39 ± 1.6. The
fact that both conductivity and gauge factor show thickness-independent
behavior above tx ≈ 120 nm but
thickness-dependent behavior below this value suggests these parameters
to be linked. To test this, we plot G versus σ0 in Figure D. We find a well-defined power-like decay, similar to that previously
reported by Hu et al. for epoxy resin/carbon nanotube composites[62] and by Garcia et al. for Sylgard/graphene composites.[47] This relationship will be discussed in more
detail below.To better understand the nature of the significant
increase in G as the thickness is reduced below t0 = tx = 120 nm,
we performed SEM
analysis (Figure E–G)
on networks of different thicknesses sprayed onto PDMS (note that tx is the thickness where the electrical conductivity
transitions from percolative to bulk-like). As the film thickness
is reduced from 200 to 40 nm, the morphology of the networks changes
drastically. Figure E shows a nanosheet network with t = 200 nm. This
is in the bulk-like conductivity regime and is continuous with very
few holes. Shown in Figure F is a t = 95 nm network, which is just below tx = 120 nm. Here, the network is less uniform,
with the PDMS substrate visible through numerous gaps in network.
The SEM image in Figure G is of a t = 40 nm thick sprayed film, which is
very close to the percolation threshold, tc. Here, the network is extremely nonuniform with the PDMS substrate
clearly visible and individual current carrying pathways easily identifiable.
These nonuniformities are responsible for the percolating conductivity
below tx and probably play a role in the
increased gauge factor in this regime. For highly nonuniform networks,
the current carrying capacity of the film is now dependent on fewer
current paths. This means that the strain-induced disruption of a
few nanosheet junctions can have a significant impact on network resistance.
Modeling the Piezoresistance of Thin Networks
This
observed dependence of G on both network thickness
and conductivity is reminiscent of nanocomposite strain sensors where
similar behavior is observed (although there, σ0 and G scale with the filler volume fraction, rather than the
film thickness). Recently, we were able to quantitatively explain
such behavior in composites using a simple model.[47] When a material is strained, the resistance changes partly
because of a relatively small change in sample dimensions, but more
importantly due to variations in the material conductivity with strain.[10] The second effect can be positive[11,63] or negative[46] and can be very large in
some systems,[11] especially nanocomposites.
It is well-known that considering both effects leads to a simple equation
[see refs (11), (19), and the Supporting Information]:where the subscript
zero means the quantity
must be taken at low-strain such that σ0 denotes
the zero-strain conductivity. This low-strain condition comes from
approximations in the derivation that are valid only at low-strain
(see the Supporting Information).Following our previous approach, we can apply this equation to a
nanosheet (or any other nanoparticle) network by differentiating eq with respect to strain,
assuming σB, n, tx, tc, and t all depend on strain. Performing this differentiation (see the Supporting Information) yields an expression
for G in terms of all five parameters in eq and their zero-strain
derivatives:Although it looks complicated, this equation is actually quite
simple and shows how the gauge factor G should depend
on the film thickness at zero-strain, t0. In fact, it is quite similar to the equivalent equation for piezoresistive
nanocomposites,[47] although the third, square-bracketed
term does not exist in nanocomposites.In addition, (dt/dε)0 does not
appear explicitly in the nanocomposite model[47] (although it is included implicitly). Defining the relevant Poisson
ratio as the ratio of strain in the film transverse (thickness) direction
(εt) to that in the longitudinal (in-plane) direction
(ε), vtL = −dεt/dε, it is straightforward to show that (dt/dε)0 = −vtLt0. For highly porous, nanostructured systems,
the Poisson ratio can be very small (often −0.1 < vtL < 0.1).[64−66] We argue that this allows
us to neglect the (dt/dε)0 term,
although this approximation should be made on a case by case basis
and properly justified (as we do below). This analysis can also be
applied to the third term: (d(tx – tc)/dε)0 = −vtL(tx,0 – tc,0). This means the third term is equal to −vtLn0, which can
be neglected if we assume vtL is small.
N.B. This process cannot be used to eliminate (dtc/dε)0 in the fourth term in eq as it is clear from
the experimental data that this term is dominant, especially for thin
networks, and cannot be neglected.Combining these approximations, eq becomeswhich is a reasonably simple yet physically
descriptive representation of the piezoresistive response in nanosheet
networks. We note that the physical significance of the three square-bracketed
terms is defined by the physical significance of the percolation parameters
(σB, n, and tc), whose strain-derivatives are contained in each. The physical
significance of these parameters has been discussed elsewhere.[47] In brief, dσB/dε (and
so the first term) is controlled by the effect of strain on internanosheet
charge transport; dn/dε is determined by the
effect of strain on network structure and dimensionality, while dtc/dε is determined by the effect of strain
on the network structure.[11,47,67]
Simple Equations for Data Fitting
Even in its simplified
form, eq has too
many parameters for effective data fitting. However, a further simplification
can be achieved by noting that, although the second, square-bracketed
term depends on t0, the dependence is
weak as compared to the final term (see ref (47)). This allows us to approximate
the first two terms as thickness-independent, writing their sum as GTNS, where TNS stands for “thin network
sensor”.We then can write eqs and 4b aswhere tTNS is
a constant (units: m) given by tTNS ≈ n0(dtc/dε)0. Both GTNS and tTNS are figures-of-merit for thin network sensors with
larger values of both parameters leading to higher sensor sensitivity.As shown in Figure C, we have fit the G versus t0 data using eq . We have limited the fit to values of t0 less than 110 nm, consistent with the region where the electrical
percolation data (Figure A) were fitted. We find a good fit with values of GTNS = 22 ± 4, tTNS = 2.3 ± 0.3 μm, and tc,0 =
27 ± 3 nm (Table ). We note that tc,0 is similar but not
identical to that found from the electrical percolation fit. Combining
this value of tTNS with the value of n0 = 3.3 obtained from the electrical percolation
fitting, and assuming (dtc/dε)0 ≫ |vtLt0| as described above, allows us to estimate (dtc/dε)0 = 700 nm, which is equivalent
to an increase in tc by 7 nm for every
percentage of applied strain. Given that the maximum value of t0 in the percolative regime is ∼120 nm
and the Poisson ratio cannot be greater than 0.5,[68]vtLt0 has a maximum value of 60 nm, validating our initial assumption.From a physics standpoint, eq sheds light on what factors most strongly influence the piezoresistive
response. For thin networks (t0 ≪ tx) with large G-values, the
second term in eq completely
dominates the gauge factor. The magnitude of this term is largely
set by tTNS, which is in turn sensitive
to (dtc/dε)0 (n0 is usually quite close to 2 for such networks[69]). Because (dtc/dε)0 is a measure of the sensitivity of the percolation threshold
to strain, and hence is a measure of the impact of strain on the structure
of the network, this means the second term in eq is associated with the network morphology
rather than the effect of strain on interparticle junctions as is
usually thought (this effect is contained in the first term in eqs and 4b and so the first term in eq ).We can also combine eq with eq to express G as a function of the
zero-strain conductivity of the network
(σ0):where σTNS = σB,0(tTNS/(tx,0 – tc,0)) is a constant for which large values
are associated with higher G. This equation can be
used to fit the G versus σ0 data
plotted in Figure D (for t0 < 110 nm). Fitting yields GTNS = 22 ± 4, σTNS = (3
± 1) × 107 S/m, and n0 = 3.7 ± 0.3 (Table ). Clearly, the values of GTNS and n0 are very similar to those quoted
above. The utility of eq is that it predicts and explains the well-defined power-law relationship
between G and conductivity that has been alluded
to by previous authors.[47]
Contribution
of Intrananosheet versus Internanosheet Charge
Transport to G
The first term in eq contains information
about the strain dependence of σB, the conductivity
of a bulk-like nanosheet network. It has been argued previously that
the conductivity of a nanosheet network scales inversely with RNS + RJ, the sum
of the resistances of an individual nanosheet and an individual junction.[11,67] As shown in the Supporting Information, this allows us to writewhere, as usual, the subscript zeros indicate
zero-strain. If we define gauge factors associated with the nanosheet
itself and the internanosheet junction as (dRNS/dε)0 = GNSRNS,0 and (dRJ/dε)0 = GJRJ,0, then eq can be
rearranged asThis equation allows us to
separate
the contributions of the intrinsic piezoresistive mechanism associated
with the graphene nanosheet from that of the internanosheet junction.
It has recently been shown that for networks of graphene nanosheets
(as well as other conducting 2D nanosheets), the ratio (RNS/RJ)0 ≪
1.[67] In addition, once extrinsic factors
such as cracking or intergrain tunneling are absent, it is known that GNS is quite small, <10 for graphene sheets.[35−37] This means we expect the contribution of nanosheet piezoresistance
to the network piezoresistance to be very small. Applying the approximations
above allows us to writeThis shows that the first term in eq is dominated by the effect of strain on
internanosheet junctions. In fact, it is widely believed that this
phenomenon dominates the piezoresistance of the conducting networks.[62,70−72]However, it
must be emphasized that the fit in Figure C shows that the first term
in eq and so the first
two terms in eq (i.e.,
those terms related to GJ) only make a
significant contribution to G for thick networks.
For thinner networks, G is dominated by the last
term in these equations, which is controlled by (dtc/dε)0, and so network structure.[47] This means that those networks with the highest
gauge factors are not predominantly limited by the effect of strain
on internanosheet junctions as is commonly believed.Incidentally,
because the first term in eq is the only one that applies to bulk-like
films, this means that eq coupled with eq determines the gauge factor of thick films: Gbulklike = 2 + GJ. Combined
with the data for thicknesses greater than ∼120 nm, this means
that GJ = 37 ± 1.6.
Cyclability,
Hysteresis, and Frequency Dependence
Academic
literature on strain sensors usually focuses on the gauge factor.
However, as mentioned in the Introduction,
other factors are also important. These include low hysteresis, minimal
frequency dependence of G, and good cyclability.
Here, we will investigate these.Hysteresis is present when
the resistance–strain curve during unloading does not follow
the initial path traced out during loading and implies that the loading
process has (at least temporarily) altered the structure of the network.[14,15] We note that, to the authors’ knowledge, there are no detailed
explanations of the origin of hysteresis in the literature. We define
the hysteresis of a strain sensor as the area within the hysteresis
loop in a resistance versus strain plot as the sensor is loaded and
released, divided by the area under the resistance versus strain curve
for loading. An example of a hysteresis loop is shown in Figure A for a t0 = 63 nm sensor deformed at a strain rate of 0.024%/s
to a maximum strain of 0.6% before unloading. In this case, the hysteresis
value was 5%. As shown in Figure B, the hysteresis is roughly constant across 2 orders
of magnitude of strain rate for three different film thicknesses,
all of which show less than 10% hysteresis. Interestingly, the thinner
films appear to have higher hysteresis with a well-defined inverse
relationship observed empirically. It is very difficult to put the
hysteresis values in context as, although some papers measure hysteresis,[74,75] very few quote a numerical value. However, we can say that these
results compare favorably to printed polymer–graphene composites,
which demonstrated a hysteresis of ∼15% [ref (13)].
Figure 3
Hysteresis and cyclability
testing. (A) Resistance hysteresis profile
as a function of strain for the t0 = 63
nm film, measured with a strain rate of 0.024%/s. (B) Comparison of
hysteresis as a function of strain rate for three sensors of different
thicknesses, showing the reasonable stability of hysteresis across
two decades of strain rate and the increase of hysteresis at lower
thicknesses (max strain used was 0.6% except for the 45 nm sample
where it was reduced to 0.4% to avoid damage after repeated cycling).
(C) Cyclic resistance response of 97 nm thick sensor with 0.05 Hz
sawtooth cycling profile as shown. (D) Comparison of gauge factor
as a function of cyclic frequency for three sensors, showing near
frequency independence from 0.01 to 1 Hz. Note that the strain amplitudes
were 0.4% for the 45 nm thick film and 0.6% for the 63 and 97 nm films.
(E) Cyclic testing (sawtooth ∼1.5 Hz), 0–0.4% strain)
for the t0 = 45 nm film showing stability
over 3000 cycles. The inset shows the magnified regions at the start
and end of the cycling profile.
Hysteresis and cyclability
testing. (A) Resistance hysteresis profile
as a function of strain for the t0 = 63
nm film, measured with a strain rate of 0.024%/s. (B) Comparison of
hysteresis as a function of strain rate for three sensors of different
thicknesses, showing the reasonable stability of hysteresis across
two decades of strain rate and the increase of hysteresis at lower
thicknesses (max strain used was 0.6% except for the 45 nm sample
where it was reduced to 0.4% to avoid damage after repeated cycling).
(C) Cyclic resistance response of 97 nm thick sensor with 0.05 Hz
sawtooth cycling profile as shown. (D) Comparison of gauge factor
as a function of cyclic frequency for three sensors, showing near
frequency independence from 0.01 to 1 Hz. Note that the strain amplitudes
were 0.4% for the 45 nm thick film and 0.6% for the 63 and 97 nm films.
(E) Cyclic testing (sawtooth ∼1.5 Hz), 0–0.4% strain)
for the t0 = 45 nm film showing stability
over 3000 cycles. The inset shows the magnified regions at the start
and end of the cycling profile.For real applications, strain sensors must be able to monitor cyclic
strains at multiple frequencies. Under these circumstances,
it is imperative that G is frequency-invariant across
a range of frequencies and over thousands of straining cycles. To
test this, we applied a sawtooth 0.05 Hz cyclic strain profile to
a t0 = 97 nm sensor (Figure C, top). The corresponding
resistance shows the high stability of the gauge factor from cycle
to cycle. Figure D
shows the resultant dynamic gauge factor plotted versus frequency
(all sawtooth profiles), for three different network thicknesses.
There is good stability in the gauge factor across over 2 orders of
magnitude of frequency in all three sensors. The thinnest films show
a high dynamic gauge factor of G ≈ 200. Although
very few papers report frequency-dependent piezoresistive results,
our results are consistent with those of Qiao et al. and Li et al.,
which both report frequency-invariant behavior.[39,40]Figure E demonstrates
the stability of the 45 nm thick film over 3000 cycles. The inset
plots show zoomed-in profiles at the start and end of the 3000 cycles
showing good fidelity and consistent gauge factors of G ≈ 187 and G ≈ 184, respectively.Finally, to put our results in context, we compare our gauge factor
data with literature data for graphene-only strain sensors prepared
by both solution processing as well as CVD (Figure ). To do this, we plot the gauge factor versus
the sensor resistance (at zero strain). Plotting versus resistance
rather than conductivity is necessary as most papers do not quote
sensor thickness, making calculation of conductivity impossible. The
most obvious feature of this graph is that all data sets show a roughly
power law correlation between gauge factor and resistance. To explain
this, we note that, according to eq , so long as the network is well above the percolation
threshold (t0 ≫ tc,0), then σ0 ∝ t0, which means that the zero-strain resistance scales
with (unstrained) film thickness as R0 ∝ t0–(. Applying eq means
that G – GTNS ∝ R01/( (when t0 ≫ tc,0). Assuming
both tc,0 and GTNS are relatively small, this predicts the observed power law relationship G ∝ R01/(. To confirm this, we plot the dashed line, which has an exponent
of 1/4.66, consistent with the percolation exponent of 3.66. Perhaps
usefully, this relationship allows the percolation exponent to be
extracted from the measurements on a set of films of unknown thickness.
In addition, it is worth pointing out that the gauge factors reported
here are competitive with the best graphene-based gauge factors reported
in the literature, even for CVD-based sensors.
Figure 4
Comparison of our results
with previous literature plotted as gauge
factor versus zero-strain sensor resistance. Papers used in the analysis:
Zhao et al. (CVD),[26] Hempel et al. (spray),[33] Casiraghi et al. (inkjet on paper),[32] and Chen et al. (electrochemical exfoliation/EE-small
(sonicated after exfoliation)/solvent exfoliated).[78] The dashed line shows power law dependence with an exponent
of 1/(n0 + 1) = 1/4.66.
Comparison of our results
with previous literature plotted as gauge
factor versus zero-strain sensor resistance. Papers used in the analysis:
Zhao et al. (CVD),[26] Hempel et al. (spray),[33] Casiraghi et al. (inkjet on paper),[32] and Chen et al. (electrochemical exfoliation/EE-small
(sonicated after exfoliation)/solvent exfoliated).[78] The dashed line shows power law dependence with an exponent
of 1/(n0 + 1) = 1/4.66.Because of their excellent performance and ease of fabrication,
we believe printed graphene networks have significant potential for
use as practical strain sensors. However, much engineering work is
required to move these structures from promising sensing materials
to practical components within sensors. For example, as indicated
above, methods will have to be developed to encapsulate the networks
without significant reduction in either conductivity or gauge factor.
In addition, it will be important to quantify the effects of humidity
on the network properties[76] and assess
whether any negative impact can also be ameliorated by encapsulation.
Moreover, it is well-known that nanonetworks can have gauge factors
that have nontrivial temperature dependences.[77] It will be important to assess the temperature dependence of G and identify a regime where the temperature variation
is minimized. In this particular area, our results may be useful.
Any dependence of G on temperature is likely to stem
from the first term in eqs and 4b as this term is linked to internanosheet
hopping, which is temperature-dependent. However, this work shows
the relative influence of this term to be minimized as the network
thickness is reduced toward tc,0. Thus,
thickness control may be a strategy to minimize the temperature variation
of the gauge factor.
Conclusion
We have performed a detailed
study on the dependence of both electrical
conductivity and piezoresistive properties, notably gauge factor,
on the thickness of printed networks of graphene nanosheets. We find
that both conductivity and gauge factor are thickness-independent
(i.e., intrinsic) properties for networks thicker than ∼120
nm. However, both conductivity and gauge factor depend sensitively
on nanosheet thickness for thinner networks. We show that the thickness-dependence
of gauge factor is closely related to that of conductivity and that
both can be quantitatively described by percolation theory. In addition,
we find these sensors to have low-hysteresis and good frequency independence
and to demonstrate excellent cyclability over thousands of cycles.
Experimental Methods
Ink Preparation
Graphene ink was prepared using liquid-phase
exfoliation (LPE) of graphite flakes (Branwell, graphite grade RFL
99.5, 20 g) in 1-methyl-2-pyrrolidone (Sigma-Aldrich, 200 mL) by tip
sonication (200 W, 70% amplitude, 72 h, Hielscher UP200S, 200 W, 24
kHz). This dispersion underwent centrifugation (Hettich Mikro 220R)
at 1500 rpm (RCF = 230g) for 90 min to remove large
nanosheets and unexfoliated bulk graphite. The supernatant was vacuum
filtered through a 0.45 μm nylon membrane (Sterlitech NY4547100),
forming a pellet of graphene. This was washed through by adding methanol
(Sigma-Aldrich, 30 mL). The residual membrane was dried in a vacuum
oven (Fi-Streem Vacuum Oven) at 50 °C overnight. The carbon membrane
was weighed (Sartorius Balance), ground into a powder using a mortar
and pestle, and resuspended in chloroform (Sigma-Aldrich) by tip sonication
for 1 h at 40% amplitude to make a graphene/chloroform dispersion
with a concentration of 2 mg/mL. The dispersion concentration and
nanosheet thickness were estimated using UV–vis characterization
(Cary 50) as outlined by Backes et al.[53] This dispersion was diluted to the required concentrations for spray
printing.
Substrate Preparation
PDMS Sylgard 184 Dow Corning
substrates were fabricated by mixing components A (2.00 mL, silicone
oil base) and B (200 μL, curing agent) in a 10:1 volume ratio
in a PTFE mold. These were cured in an oven (2 h, 120 °C), after
which the cured PDMS was removed from the mold and cut into strips
of the required size.
Spraying
Thin films of graphene
were deposited by spray
coating from a modified airbrush (Harder & Steenbeck Infinity
Airbrush), which was mounted in a mobile gantry (Janome JR2300N).
The gantry was programmed to raster across a 5 cm × 5 cm area
where the substrates were held in place using Kapton tape. The working
distance from the nozzle to substrates was 10 cm, and the nitrogen
back pressure was set to 3.5 bar. Films with thickness above 100 nm
were reasonably uniform with well-defined thicknesses that could be
measured by a profilometer. Thinner films tend to display more inhomogeneous
morphologies. However, the average thicknesses (see below) measured
for such thin films were reasonably repeatable. For example, a batch
of six sprayed films typically displayed a thickness variation of
<15 nm.
Thickness Characterization
Graphene
film thickness
was characterized using a flatbed scanner (Epson Perfection V700 PHOTO)
to determine the optical transmission and so extinction. The scanner
was calibrated using neutral density filters of known transmission.
The film extinction was converted to film thickness using the extinction
coefficient, which was measured using sprayed films of the same graphene
dispersion on glass, whose thickness was measured using profilometry.
The extinction coefficient was measured for thicker films using between
100 and 250 nm for which the profilometry was more reliable. Very
thin films can be somewhat inhomogeneous, making the thickness poorly
defined. Measuring the thickness from the optical transmission, as
we do here, then is equivalent to measuring an average thickness.
Electromechanical Testing
Sensors were tested using
a Zwick Z0.5 ProLine Tensile Tester (100 N Load Cell). The films were
contacted using silver wires attached using silver paint directly
on the graphene film. Sample dimensions were approximately 5 mm ×
25 mm with PDMS thickness in the range of 0.7–1.0 mm. Sensors
were conditioned by sawtooth profile strain cycling before testing.
Conditioning is particularly important as otherwise the initial stretch/release
cycle can give an unrepresentative, anomalous electrical response.
It is likely that the as-produced network is in a nonequilibrium state
and conditioning leads to a slight reorganization of the network into
a more stable state. This final state likely has improved connectivity
as the total resistance tends to decrease over the conditioning cycle.
The resistance was measured using a Keithley KE2601 Source meter controlled
by a 2-probe LabView program. Electromechanical measurements were
made using a maximum strain amplitude of 1%. Straining beyond 1% tended
to lead to irreversible cracking or delamination of electrodes. Cyclic
measurements were initially performed at 0.6% strain amplitude. However,
we found that 0.6% strain eventually led to damage to the 45 nm film
after repeated cycling. Subsequently, all long cycling experiments
on the 45 nm sample were performed with a 0.4% strain amplitude, which
could be applied for many cycles without damage appearing.
Authors: Sonia Biccai; Conor S Boland; Daniel P O'Driscoll; Andrew Harvey; Cian Gabbett; Domhnall R O'Suilleabhain; Aideen J Griffin; Zheling Li; Robert J Young; Jonathan N Coleman Journal: ACS Nano Date: 2019-06-14 Impact factor: 15.881
Authors: Dorsa Parviz; Fahmida Irin; Smit A Shah; Sriya Das; Charles B Sweeney; Micah J Green Journal: Adv Mater Date: 2016-08-22 Impact factor: 30.849
Authors: Yenny Hernandez; Valeria Nicolosi; Mustafa Lotya; Fiona M Blighe; Zhenyu Sun; Sukanta De; I T McGovern; Brendan Holland; Michele Byrne; Yurii K Gun'Ko; John J Boland; Peter Niraj; Georg Duesberg; Satheesh Krishnamurthy; Robbie Goodhue; John Hutchison; Vittorio Scardaci; Andrea C Ferrari; Jonathan N Coleman Journal: Nat Nanotechnol Date: 2008-08-10 Impact factor: 39.213