| Literature DB >> 34985439 |
Sebastian Kalbfleisch1, Yuhe Zhang2, Maik Kahnt1, Khachiwan Buakor2, Max Langer3, Till Dreier4, Hanna Dierks2, Philip Stjärneblad2, Emanuel Larsson5, Korneliya Gordeyeva6, Lert Chayanun2, Daniel Söderberg6, Jesper Wallentin2, Martin Bech4, Pablo Villanueva-Perez2.
Abstract
Coherent X-ray imaging techniques, such as in-line holography, exploit the high brilliance provided by diffraction-limited storage rings to perform imaging sensitive to the electron density through contrast due to the phase shift, rather than conventional attenuation contrast. Thus, coherent X-ray imaging techniques enable high-sensitivity and low-dose imaging, especially for low-atomic-number (Z) chemical elements and materials with similar attenuation contrast. Here, the first implementation of in-line holography at the NanoMAX beamline is presented, which benefits from the exceptional focusing capabilities and the high brilliance provided by MAX IV, the first operational diffraction-limited storage ring up to approximately 300 eV. It is demonstrated that in-line holography at NanoMAX can provide 2D diffraction-limited images, where the achievable resolution is only limited by the 70 nm focal spot at 13 keV X-ray energy. Also, the 3D capabilities of this instrument are demonstrated by performing holotomography on a chalk sample at a mesoscale resolution of around 155 nm. It is foreseen that in-line holography will broaden the spectra of capabilities of MAX IV by providing fast 2D and 3D electron density images from mesoscale down to nanoscale resolution. open access.Entities:
Keywords: 2D and 3D X-ray imaging; coherent imaging; diffraction-limited storage ring; holography; holotomography
Mesh:
Year: 2022 PMID: 34985439 PMCID: PMC8733976 DOI: 10.1107/S1600577521012200
Source DB: PubMed Journal: J Synchrotron Radiat ISSN: 0909-0495 Impact factor: 2.616
Figure 1In-line holography. Conceptual sketch of in-line holography at the NanoMAX beamline.
Figure 2Expected detectable photons with in-line holography at NanoMAX as a function of the X-ray photon energy.
Figure 3Field of view (FOV) and effective pixel size as a function of the defocusing distance (z 1) for the NanoMAX in-line holography setup.
Figure 4Recorded holograms at different defocusing distances (z 1) of the 2D test pattern. The white scale bar corresponds to 4 µm for all the images.
Figure 52D test pattern reconstructions (a) and resolution evaluation using Fourier ring correlation (b). The vertical orange-dashed line in (b) represents the focal-spot resolution limit. The scale bar corresponds to 4 µm, and the resolution estimated by the 1-bit threshold criterion is 79 nm.
Figure 6Chalk sample tomographic reconstruction. (a) Phase retrieved projection using pure-phase algorithms. (b) 3D reconstructed slice marked by the red line in (a). (c) 3D rendering of the chalk sample. (d) Fourier shell correlation results and resolution estimation, where the vertical orange-dashed line represents the focal-spot resolution limit. The scale bars correspond to 2 µm, and the resolution estimated by the half-bit threshold criterion is 155 nm.