| Literature DB >> 34947633 |
Mateusz Dudziak1, Ievgeniia Topolniak1, Dorothee Silbernagl1, Korinna Altmann1, Heinz Sturm1,2.
Abstract
The multiphoton lithography (MPL) technique represents the future of 3D microprinting, enabling the production of complex microscale objects with high precision. Although the MPL fabrication parameters are widely evaluated and discussed, not much attention has been given to the microscopic properties of 3D objects with respect to their surface properties and time-dependent stability. These properties are of crucial importance when it comes to the safe and durable use of these structures in biomedical applications. In this work, we investigate the surface properties of the MPL-produced SZ2080 polymeric microstructures with regard to the physical aging processes during the post-production stage. The influence of aging on the polymeric microstructures was investigated by means of Atomic Force Microscopy (AFM) and X-ray Photoelectron Spectroscopy (XPS). As a result, a time-dependent change in Young's Modulus, plastic deformation, and adhesion and their correlation to the development in chemical composition of the surface of MPL-microstructures are evaluated. The results presented here are valuable for the application of MPL-fabricated 3D objects in general, but especially in medical technology as they give detailed information of the physical and chemical time-dependent dynamic behavior of MPL-printed surfaces and thus their suitability and performance in biological systems.Entities:
Keywords: SZ2080; X-ray photoelectron spectroscopy; Young’s Modulus; aging; atomic force microscopy; force distance curves; microfabrication; multiphoton lithography; surface properties
Year: 2021 PMID: 34947633 PMCID: PMC8708078 DOI: 10.3390/nano11123285
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1Averaged Force Distance Curve from MPL-fabricated SZ2080 microstructure at 25th day of post-fabrication. The red line corresponds to the approach part of the curve and the blue line to the retract part. The plastic properties are quantified by the plastic deformation Dplastic and work of adhesion Wadh.
Figure 2SEM micrographs of SZ2080 MPL-printed cubic structures used for time-dependent AFM investigation: (A) Array of identical cubes fabricated at the same MLP parameters. Each cube was used for only one AFM FDC measurement on a given day to avoid effect of the resulted structure artifacts on the further measurements. (B) Magnified surface of one of the cubes after AFM FDC measurement. Observed vertical line-like patterns are the result of printing procedure and correspond to laser scanning direction. Pointwise plastic deformations observed in a repetitive manner are caused by AFM FDC measurements.
Figure 3Mechanical properties of SZ2080 microstructures: material deformation depending on the applied force. Aging in the dark at the ambient temperature. The grey dotted line is an exemplary Hertz fit (Equation (3)) with E = 1.3 GPa and R = 21 nm, which only describes the elastic deformation. The experimental data show plastic deformation for forces F > Fyield, where the Hertz fit cannot describe the deformation.
Young’s Moduli of the SZ2080 microstructures with respect to the post-fabrication time.
| Post-Fabrication Period [Days] | Young’s Modulus |
|---|---|
| 1 | 0.775 ± 0.002 |
| 7 | 0.94 ± 0.04 |
| 8 | 1.05 ± 0.02 |
| 14 | 1.21 ± 0.006 |
| 15 | 1.24 ± 0.01 |
| 25 | 1.3 ± 0.1 |
Figure 4Mechanical properties of SZ2080 microstructures as a function of post-fabrication time: (A) mechanical load (Fyield); (B) plastic deformations (Dplastic) resulting from maximum applied force of Fmax = 52 µN; (C) tip adhesion (Wadh) to the surface of measured structure. The black solid line is a sigmoidal fit for each data set.
Conversion degree of plastic mechanical properties of the SZ2080 microstructures with respect to the post-fabrication time in days. Following the integrated form of the empirical rule, the mean value µ equals 50% conversion degree and adding multiples of the standard deviation σ equals 84.1, 97.7, and 99.8% conversion degree.
| µ | µ + σ | µ + 2σ | µ + 3σ | |
|---|---|---|---|---|
|
| 8.4 | 12.2 | 14 | 19.8 |
|
| 6.9 | 12.9 | 18.9 | 24.9 |
|
| 7.9 | 13 | 18.1 | 23.2 |
Figure 5(A) Spatial representation of the C1s peak XPS spectra of different measurement angles (yellow 58.4°, red 53.7°, light blue 43.7°, and blue 0°). Peak areas (detected at Intensities > 635 CPS) are projected on a scheme of sample depth (bottom of 3D plot). (B) Abstracted scheme of the surface composition as a function of the information depth of the fresh sample SZ2080. The selected colored ellipses represent the chemical groups detected by XPS.
Percentage content of C1s-related chemical groups obtained from XPS spectra for SZ2080 microstructure at different post-fabrication times.
| Functionality | C-C | C-O | C=O | O-C=O |
|---|---|---|---|---|
| Binding energy [eV] | 285.0 | 286.5 | 288.0 | 289.0 |
| Day 1 [%] | 83.6 | 1.6 | 6.7 | 8.1 |
| Day 25 [%] | 77.4 | 12.9 | 1.8 | 7.9 |