| Literature DB >> 34901627 |
Cédric Bourgès1, Ralph Rajamathi2, C Nethravathi2,3, Michael Rajamathi2, Takao Mori1,4.
Abstract
Pristine and Co-doped MoS2 nanosheets, containing a dominant 1T phase, have been densified by spark plasma sintering (SPS) to produce a nanostructured arrangement. The structural analysis by X-ray powder diffraction revealed that the reactive sintering process transforms the 1T-MoS2 nanosheets into their stable 2H form despite a significantly reduced sintering temperature and time testifying to the fast kinetics of phase change. Together with the phase conversion, the SPS process promoted a strong texturing of the nanosheets, which drives additional scattering processes and alters the electronic and thermal transport properties. In the pristine sample, it produced one of the lowest thermal conductivities ever reported on MoS2 with a minimal value of 0.66 W/m·K at room temperature. The effect of Co substitution in the final sintered samples is not significant, compared to the pristine MoS2 sample, except for a non-negligible improvement of the electrical conductivity by a factor of 100 in the high-Co content (6% by mass) sample.Entities:
Year: 2021 PMID: 34901627 PMCID: PMC8655900 DOI: 10.1021/acsomega.1c04646
Source DB: PubMed Journal: ACS Omega ISSN: 2470-1343
Figure 1(a) Representation of the 1T and 2H crystal structure of MoS2 and (b) X-ray powder diffraction patterns of MoS2 samples after SPS.
Figure 3SEM micrograph of a fractured cross-sectional surface normal to the SPS pressure axis of (a) MoS2, (b) Co(3%)-doped MoS2, and (c) Co(6%)-doped MoS2 samples after SPS.
Figure 2(a) Elemental analysis composition and (b) polished surface SEM image with the corresponding EDS spectrum of the MoS2 samples after SPS.
Figure 4Temperature dependence of (a) Seebeck coefficient S and (b) electrical conductivity σ of the MoS2, Co(3%)-doped MoS2, and Co(6%)-doped MoS2 samples after SPS.
Figure 5(a) Temperature dependence of the thermal conductivity of MoS2, Co(3%)-doped MoS2, and Co(6%)-doped MoS2 after SPS and (b) schematic representation of the out-of-plane enhanced phonon scattering induced by the texturing.
Representative Literature Comparison of the MoS2 Thermal Conductivities
| formatting | MoS2 sample type | direction of measurement | κ (W/m·K) | temperature (K) | reference |
|---|---|---|---|---|---|
| single crystal | single crystal | basal | 85–100 | 300 | ( |
| 2–2.5 | 300 | ( | |||
| nanolayer | monolayer | basal | 34.5 | 300 | ( |
| multi-layer | basal | 44–52 | 300 | ( | |
| thin film | polycrystalline nanomembrane | in plane | 0.75 | 300 | ( |
| nanoflake film | in plane | 1.5 | 300 | ( | |
| film with controlled grain orientation | out of plane | 0.27–2 | 300 | ( | |
| bulk (* correspond to the pristine MoS2) | MoS2 with VMoS4 nanoinclusion | in plane | 16–40* | 300 | ( |
| out of plane | 4.2 - 6.7* | 300 | ( | ||
| MoS2 with MoO2 nanoinclusion | in plane | 20–40* | 327 | ( | |
| out of plane | 3.1–5.5* | 327 | ( | ||
| exfoliated and restacked MoS2 | out of plane | 1.05* | 300 | ( | |
| this work | out of plane | 0.71*–1.24 | 300 |