| Literature DB >> 34894697 |
Xinghan Guo1, Nazar Delegan1,2, Jonathan C Karsch1, Zixi Li1, Tianle Liu3, Robert Shreiner3, Amy Butcher1, David D Awschalom1,2,3, F Joseph Heremans1,2, Alexander A High1,2.
Abstract
Color centers in diamond are widely explored as qubits in quantum technologies. However, challenges remain in the effective and efficient integration of these diamond-hosted qubits in device heterostructures. Here, nanoscale-thick uniform diamond membranes are synthesized via "smart-cut" and isotopically (12C) purified overgrowth. These membranes have tunable thicknesses (demonstrated 50 to 250 nm), are deterministically transferable, have bilaterally atomically flat surfaces (Rq ≤ 0.3 nm), and bulk-diamond-like crystallinity. Color centers are synthesized via both implantation and in situ overgrowth incorporation. Within 110-nm-thick membranes, individual germanium-vacancy (GeV-) centers exhibit stable photoluminescence at 5.4 K and average optical transition line widths as low as 125 MHz. The room temperature spin coherence of individual nitrogen-vacancy (NV-) centers shows Ramsey spin dephasing times (T2*) and Hahn echo times (T2) as long as 150 and 400 μs, respectively. This platform enables the straightforward integration of diamond membranes that host coherent color centers into quantum technologies.Entities:
Keywords: color center; diamond; heterostructures; quantum information science; quantum sensing
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Year: 2021 PMID: 34894697 PMCID: PMC8704172 DOI: 10.1021/acs.nanolett.1c03703
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189
Figure 1Schematics of the diamond membrane fabrication process. (a) He+ implantation with subsequent annealing to form the membrane (light gray on the top) and the graphitized layer (dark gray underneath). (b) Color center incorporation via either ion implantation post-isotopically (12C) purified overgrowth (left) or in situ doping (right). Red dots: N+. Blue dots: Ge+. Other implanted species (Si+, Sn+) are not shown. (c) Diamond membrane undercut via EC etching in DI water, with palladium anode (dark red) and tungsten cathode (dark gray) aiming at the target membrane. A transfer tether is colored red for better visualization. (d) Membrane dry transfer. The membrane is picked up by the PDMS/PC stamp (green/purple), flipped onto another PDMS stamp (green), and bonded to the carrier wafer by HSQ resist (blue). (e) Membrane back etch. The pedestal-like structure underneath the membrane is formed by ICP etching on the HSQ layer and the carrier wafer. (f) Microscope images of patterned overgrown membranes (left) and a transferred and back-etched membrane on a fused silica wafer (right). The green squares on the left are patterned membranes with underneath graphitized layer, and the rectangle on the right indicates the trench etched prior to the transfer.
Figure 2Surface morphology and crystal quality of overgrown membranes. (a,b) AFM images of overgrowth patterns (as-grown side of membranes) at different heating plate temperatures. (c) AFM image on the etched side of the membrane after multistep etching. (d) Room-temperature Raman spectroscopy of diamond membranes and the reference diamond substrate. Green: ∼185 nm (20 h) overgrowth membrane back-etched down to 100 nm. Red: ∼370 nm (40 h) overgrowth, isotopically purified membrane back-etched down to 110 nm. Yellow: Surface strain-released, EL-grade single crystal diamond used as the reference. The surface strain is polish-induced, and is removed by ICP etching and subsequent annealing prior to the Raman spectroscopy (section 2.2 in SI).
Figure 3Optical characterization of GeV– centers at 5.4 K. (a) Microscope image of a diamond membrane (dashed green) containing implanted GeV– centers. HSQ in the trench (dashed blue) is completely removed by vapor HF. The rainbow color on the membrane indicates excess HF undercut (section 2.4 in SI). The PL measurement is performed in the dashed black region. (b) PL map of the implanted GeV– centers. The signal-to-background ratios for most centers are between 5 to 30. (c) Single PLE scan and time-averaged broadening of a GeV center. The data sampling time per point is 100 ms, and the counts are normalized to kilo-counts-per-second (kcps). (d) Statistics of GeV– optical line widths measured via single-scan (blue) and average broadening (orange). The inset box plot on the left (right) indicates the median single (average) line width of 95 MHz (231 MHz).
Figure 4Optical characterization of embedded NV– centers at room temperature. (a,b) Representative spin echo and free induction decay curves on a single long-lived NV– spin, accompanied by the T2* and T2 coherence times. A detailed description of data analysis is provided in the SI. The oscillations in the first 100 μs of (b) arise from aliasing of electron spin echo envelope modulation. (c) Scatter plot of T2* and T2 times for the 20 measured NV– centers. Inset box plots denote median values of 26 and 52.5 μs (dashed lines) and lower-quartile values of 9.5 and 28 μs. Error bars are fit errors. (d) NV– PL map of a δ-doped membrane with 15NV– centers (teal circles) and 14NV– centers (white squares) labeled. At right, pulsed-ODMR spectra of the indicated NV– centers.