Kuanysh Zhussupbekov1, Killian Walshe1, Brian Walls1, Andrei Ionov2, Sergei I Bozhko1,2, Andrei Ksenz2, Rais N Mozhchil2, Ainur Zhussupbekova1, Karsten Fleischer1,3, Samuel Berman1, Ivan Zhilyaev4, David D O'Regan1,5, Igor V Shvets1. 1. School of Physics and Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Trinity College Dublin, Dublin 2, Ireland. 2. Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Russia. 3. School of Physical Sciences, Dublin City University, Dublin 9, Ireland. 4. Institute of Microelectronics Technology and High Purity Materials, Russian Academy of Sciences, Chernogolovka, Russia. 5. AMBER, the SFI Research Centre for Advanced Materials and BioEngineering Research, Dublin 2, Ireland.
Abstract
Defects introduced to the surface of Bi(111) break the translational symmetry and modify the surface states locally. We present a theoretical and experimental study of the 2D defects on the surface of Bi(111) and the states that they induce. Bi crystals cleaved in ultrahigh vacuum (UHV) at low temperature (110 K) and the resulting ion-etched surface are investigated by low-energy electron diffraction (LEED), X-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy (UPS), and scanning tunneling microscopy (STM) as well as spectroscopy (STS) techniques in combination with density functional theory (DFT) calculations. STS measurements of cleaved Bi(111) reveal that a commonly observed bilayer step edge has a lower density of states (DOS) around the Fermi level as compared to the atomic-flat terrace. Following ion bombardment, the Bi(111) surface reveals anomalous behavior at both 110 and 300 K: Surface periodicity is observed by LEED, and a significant increase in the number of bilayer step edges and energetically unfavorable monolayer steps is observed by STM. It is suggested that the newly exposed monolayer steps and the type A bilayer step edges result in an increase to the surface Fermi density as evidenced by UPS measurements and the Kohn-Sham DOS. These states appear to be thermodynamically stable under UHV conditions.
Defects introduced to the surface of Bi(111) break the translational symmetry and modify the surface states locally. We present a theoretical and experimental study of the 2D defects on the surface of Bi(111) and the states that they induce. Bi crystals cleaved in ultrahigh vacuum (UHV) at low temperature (110 K) and the resulting ion-etched surface are investigated by low-energy electron diffraction (LEED), X-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy (UPS), and scanning tunneling microscopy (STM) as well as spectroscopy (STS) techniques in combination with density functional theory (DFT) calculations. STS measurements of cleaved Bi(111) reveal that a commonly observed bilayer step edge has a lower density of states (DOS) around the Fermi level as compared to the atomic-flat terrace. Following ion bombardment, the Bi(111) surface reveals anomalous behavior at both 110 and 300 K: Surface periodicity is observed by LEED, and a significant increase in the number of bilayer step edges and energetically unfavorable monolayer steps is observed by STM. It is suggested that the newly exposed monolayer steps and the type A bilayer step edges result in an increase to the surface Fermi density as evidenced by UPS measurements and the Kohn-Sham DOS. These states appear to be thermodynamically stable under UHV conditions.
In
recent years, there has been increased attention on layered
materials because of their wide range of applications in energy- and
electronics-related fields.[1−6] Bismuth is one such material, attracting interest because of its
topological properties.[7−11] Some Bi-based compounds are topological insulators and find thermal
and catalytic applications.[12−17] The electronic structure[18−24] and formation of a charge-density wave (CDW) in both bulk Bi and
ultrathin Bi films have previously been investigated by synchrotron
radiation angle-resolved photoemission spectroscopy (ARPES).[25−27]Bi has a rhombohedral crystal structure which can be described
in terms of a small deformation of a simple cubic lattice.[28−30] The shifting of the (111) atomic planes leads to alternating spacing
and chemical bonds; covalent bonds are present when layers are in
close proximity to each other and van der Waals bonds when they are
further apart, resulting in the formation of a layered structure.
These deformations are energetically favorable due to a Peierls transition.[31−33] As a result of this Peierls transition, there is a gap in the electron
dispersion in the vicinity of the Γ point of the Brillouin zone,
while the spin–orbit interaction (SOI) plays a significant
role in the formation of the electron spectrum. The energy of the
SOI is comparable with the energy scales of the Peierls instability.[33] Bi has a lattice parameter of 4.54 Å; the
interplanar distances in the [111] direction are d1 = 1.59 Å and d2 = 2.34
Å.[34,35] It has been shown in numerous experiments
that Bi single crystals cleave along the (111) plane, breaking the
van der Waals bonds between bilayers.[7,8,25,36]One of the first
studies of cleaved Bi(111) by scanning tunneling
microscopy (STM) was conducted by Edelman et al.[36] They observed a new type of defect on Bi(111): twin interlayers
in which a minimal width is observed. The width is governed by the
matching of atomic planes at each side of the twin interlayer. Recently,
bismuth and bismuth compounds have been widely studied for their topological
properties.[9,25,37,38] Unlike some of its compounds (e.g., Bi2Se3 and Bi2Te3), bismuth
itself is not a first-order topological insulator.[39] It therefore does not host 2D helical surface states. However,
recent studies have revealed 1D topological edge states in a variety
of different geometries at bismuth surfaces, including the (114) surface,[40] screw dislocations,[41] and type-A bilayer step edges at the (111) surface.[8] Bi(111) can have two types of bilayer step edges: armchair
or zigzag (see Figure b). The zigzag edges terminate with an atom from the top of the bilayer
(type A) while the armchair edges terminate with an atom from the
bottom of the bilayer (type B). It has been shown by using STM and
scanning tunneling spectroscopy (STS) that zigzag edges (type A) exhibit
one-dimensional topological edge states and thus a higher density
of states at the Fermi level.[7,8,10,21,42] These 1D topological states have been attributed to bismuth being
a “higher order” topological material.[7] These discoveries highlight the importance of studying
the electronic structure of 2D defects/1D structures such as step
edges at bismuth surfaces.
Figure 6
Simulated Fermi density
(LDOS at the Fermi level) of monolayer
and bilayer steps on Bi(111): (a) Fermi density of surface atoms from
bilayer (blue) and monolayer (red) step structures ((b) and (c), respectively),
calculated by using Löwdin population analysis.[61] The line for the monolayer section of the monolayer
step structure is solid, while the remaining bilayer component is
broken. (b) Atomic positions in the surface region for a bilayer step
exhibiting a type A and type B step edge. The color of each filled
circle indicates the magnitude of Fermi density. (c) Atomic positions
in surface region for a monolayer step structure. The color of each
filled circle indicates the magnitude of Fermi density. The nine simulated
atomically thin layers under the surfaces shown in (b) and (c) are
not depicted. In (a) note the large Fermi density of the A type step
and the monolayer, in comparison with the bilayer and B type step,
which more normally dominate the cleaved surface.
The primary motivation underpinning
this study relates to the formation
of defects on the surface, their evolution in time, and their effect
on the electronic surface states.[43,44] Using ion
bombardment, we can reduce the degree of order. This can result in
anomalous monolayer planes and A-type bilayer steps coexisting with
the B-type bilayer step, which dominate the pristine cleaved Bi(111)
surface. In this work, we investigate and contrast STM, STS, low-energy
electron diffraction (LEED), and photoemission measurements of a cleaved
Bi(111) surface before and after ion etching. The effect of ion bombardment
on the atomic and electronic surface structure is demonstrated, by
using STM, to produce a surface with a higher density of monolayer
steps and bilayer step edges. Ultraviolet photoelectron spectroscopy
(UPS) measurements display an increase in intensity near the Fermi
level by approximately a factor of 3. Density functional theory (DFT)
calculations are qualitatively consistent with the UPS measurements,
demonstrating an increase in the Kohn–Sham density of states
at the Fermi level (Fermi density) for both the monolayer step and
the type A bilayer step edge—which are shown to be induced
by sputtering—compared to the type B bilayer steps.
Experimental
and Computational Section
Experimental Details
Experimental
measurements were
performed across several ultrahigh-vacuum (UHV) systems. A vacuum
suitcase with a base pressure of 2 × 10–10 mbar
was utilized for transferring crystals between STM and X-ray photoelectron
spectroscopy (XPS) systems under UHV conditions. The STM used in this
study is a commercial low-temperature system from Createc with a base
pressure of 5 × 10–11 mbar. All of the STM
images were obtained at liquid nitrogen temperature (77 K) in constant-current
mode (CCM). The preparation chamber of the UHV system is fitted with
a cooling/heating stage, LEED, and an ion gun for sputtering. The
STM tips used were of [001]-oriented single-crystalline tungsten,
which electrochemically etched in NaOH.[45] The bias was applied to the sample with respect to the tip. XPS
measurements were performed by using two XPS systems: an Omicrometer
MultiProbe and a Kratos XPS. Both systems utilize monochromatic Al
Kα (E = 1486.7 eV) with an instrumental resolution
of 0.6 eV and a chamber base pressure of 5 × 10–11 mbar. The valence spectra were measured by UPS with an excitation
energy of He I (21.2 eV). The work function was determined by the
cutoff of the secondary electrons. LEED measurements were taken across
two systems: one for room temperature and the second for low-temperature
measurements.Experimental measurements were conducted on ultrahigh-purity
bismuth single crystals (residual resistance ratio (RRR): 800). The
surface was prepared by cleaving the crystal in the load lock of the
UHV system at a pressure of ∼5 × 10–8 mbar at ∼110 K. The sample was promptly (within 5–10
s) transferred to the preparation chamber, where the pressure quickly
returns to the base pressure of ∼2 × 10–10 mbar. All stages of the sample preparation were monitored in situ by LEED and/or XPS. The surfaces with well-ordered
LEED patterns demonstrating the (1 × 1) structure and/or without
any contamination, concluded by XPS, were used in this study (see Figure d,e).
Figure 1
STM, LEED, and XPS of
the cleaved Bi(111) surface. (a) Large-scale
STM images of Bi(111) surface cleaved in situ at
110 K in UHV (150 × 150 nm2, V =
0.4 V and I = 670 pA). Panels (b) and (c) illustrate
the atomic resolution of the terrace in image (a). Scale and scanning
parameters for (b) and (c) are 20 × 20 nm2, V = 2 V, I = 80 pA and 4.5 × 4.5 nm2, V = 2 V, I = 80 pA, respectively.
(d) LEED image of the cleaved Bi(111) in UHV showing a high order
of the surface. (e) XPS spectrum demonstrates that this surface is
atomically clean. (f) Line profile of interatomic spacing of approximate
periodicity 4.5 Å across the green line labeled in (c).
STM, LEED, and XPS of
the cleaved Bi(111) surface. (a) Large-scale
STM images of Bi(111) surface cleaved in situ at
110 K in UHV (150 × 150 nm2, V =
0.4 V and I = 670 pA). Panels (b) and (c) illustrate
the atomic resolution of the terrace in image (a). Scale and scanning
parameters for (b) and (c) are 20 × 20 nm2, V = 2 V, I = 80 pA and 4.5 × 4.5 nm2, V = 2 V, I = 80 pA, respectively.
(d) LEED image of the cleaved Bi(111) in UHV showing a high order
of the surface. (e) XPS spectrum demonstrates that this surface is
atomically clean. (f) Line profile of interatomic spacing of approximate
periodicity 4.5 Å across the green line labeled in (c).
Computational Details
First-principles
quantum-mechanical
simulations of Bi steps and 2D defects were performed by using the
PWscf DFT code of the Quantum Espresso suite.[46,47] Simulations were performed by using a slab geometry consisting of
10 layers (5 bilayers) with each layer containing 21 atoms, arranged
linearly in the Bi[1̅10] direction, with additional partial
layers added to one surface of the slab to form the desired step edge
structures. An out-of-plane vacuum spacing of 10 Å was used.
The initial geometric parameters used in simulations were taken from
experimental results found in the literature.[34] The atomic positions and cell dimensions were allowed to fully relax
by using a per atom force threshold of 10–2 eV/bohr
and a total energy threshold of 10–3 eV. A scalar
relativistic ultrasoft pseudopotential[48] and the Perdew–Burke–Ernzerhof (PBE) exchange-correlation
functional[49] were used in this study, with
a converged plane-wave energy cutoff of 680 eV. The equivalent converged k-space sampling density for the six-atom unit cell is 15
× 15 × 4 in the reciprocal-space Bi[1̅10], Bi[1̅1̅2],
and Bi[111] directions, respectively. These runtime parameters yielded
a total energy convergence of 1 meV/atom. The atomic positions in
the slab were fully relaxed for each of the simulations presented.
The number of k-points was scaled to the slab dimensions,
with 1 k-point used for both the out-of-plane reciprocal-space
sampling direction (Bi[111]) and for the in-plane direction Bi[1̅10]
with 21 atoms in the unit cell, while 15 were used in the other in-plane
direction Bi[1̅1̅2]. The in-plane slab dimension were
selected as a result of the step width optimization discussed in the Results section.
Results
Cleaved Surface
of Bi(111)
The cleaved surface of Bi(111)
consists of large atomically flat terraces with steps heights of ∼4.0
Å, corresponding to a single bilayer. The step edges are reasonably
ordered (see Figure a), and the step edge directions reflect the 6-fold symmetry of the
(111) plane. The well-ordered nature of the surface is demonstrated
by STM and LEED measurements. Atomic resolution can be observed in Figure b,c. The line profile
in Figure f illustrates
that the interatomic distance is around 4.5 Å, which is in agreement
with other works.[36,50] The LEED measurements presented
in Figure d demonstrates
that the cleaved crystal is highly ordered and has long-range order.
XPS measurements (Figure e) demonstrate that this surface is atomically clean without
measurable levels of carbon or oxygen contamination. Following XPS
measurements, UPS measurements were performed on the same cleaved
surface, which can be seen in Figure e (black line).
Figure 3
LEED and UPS spectra of the Bi(111) surface following Ar etching. (a) LEED pattern was obtained from the cleaved
surface of Bi(111) at room temperature at Ep = 57 eV. (b) LEED after the 10 min of sputtering at room temperature
and at Ep = 57 eV (E =
2 keV, PAr = 5 × 10–5 mbar, and I = 20 μA). (c) LEED of the cleaved
crystal at 110 K and at E = 95 eV. (d) LEED of the
sputtered surface at 110 K for 12 min (E = 2 keV, PAr = 5 × 10–5 mbar, and I = 20 μA). LEED in (c) and (d) obtained in conjunction
with UPS measurements. (e) UPS measurements were performed at 110
K before and after different durations of Ar+ etching (E = 2 keV, PAr = 5 × 10–5 mbar, and I = 20 μA). The
black UPS spectra correspond to the UHV cleaved Bi(111) prior to Ar+ etching. Ar+ sputtering was conducted at 110 K
for 2 min (red), 7 min (green), and 12 min (blue).
The electronic structure of Bi
type B step edges has been investigated. A large-scale STM image of
Bi(111) terraces (150 × 150 nm2) obtained at a bias
of 1.2 V and a tunneling current of 70 pA is presented in Figure a. A smaller scale
STM image (30 × 30 nm2) corresponding to the area
indicated by the green square in Figure a is presented in Figure b. Two terraces separated by terrace edge,
which run vertically though the center of the image (V = 1.0 V and I = 80 pA). STS measurements were performed
at each of the 50 points along the 15 nm length blue line.[43,51] An I(V) curve was obtained for
each point[52] and differentiated with respect
to the voltage. Figure c displays representative dI/dV spectra measured on and away from the step edge. (The blue triangle
is taken from point 5, the red triangle is acquired from point 25,
and the green triangle is taken from point 45 in Figure d.) The resulting dI/dV curves are shown in Figure d as a 2D map. Each vertical
line is a dI/dV curve plotted between
−0.5 and +0.5 V, with the magnitude of dI/dV expressed by using a color scale, where warmer colors
indicate a larger value. Spectra were measured every 3 Å along
the blue line in Figure b. The dI/dV spectrum at point
number 25 was performed on the central step (Figure b). A suppression of the local density of
states (LDOS) near the Fermi level (in the range of −0.01 to
−0.25 V) is observed at the double bilayer step edges. We note
the similarity between points 5 and 45, obtained on the each terrace,
which highlights the quality of the STS measurement. The 2D map shows
the evolution of the edge state is space; the blue region, corresponding
to lower DOS, reduces as one moves away from the step. At points 5
and 45 (blue and green spectra in Figure c) the step is clearly not influencing the
electronic characteristics. Calculated and experimental LDOS of the
bilayer terraces are compared in Figure 1S of the Supporting Information. The bilayer calculation is in qualitative
agreement with the corresponding experimental STS data with the minima
slightly shifted to the right of the Fermi level.
Figure 2
STS investigation of
band profile across the double bilayer step
of Bi(111). (a) Large-scale STM image (150 × 150 nm2, V = 1.2 V, and I = 70 pA). (b)
STM image of the green square labeled in (a) (30 × 30 nm2, V = 1.0 V, and I = 80
pA). The blue line (15 nm) indicates where the line spectroscopy has
been performed (stabilization parameters V = 1.2
V and I = 70 pA). (c) Representative dI/dV spectra measured on and away from step edge.
(d) 2D plot of tunneling spectra across the blue line (dI/dV in bias range ±0.5 V) which demonstrates
a suppression of the LDOS on the edge of the two bilayer steps.
STS investigation of
band profile across the double bilayer step
of Bi(111). (a) Large-scale STM image (150 × 150 nm2, V = 1.2 V, and I = 70 pA). (b)
STM image of the green square labeled in (a) (30 × 30 nm2, V = 1.0 V, and I = 80
pA). The blue line (15 nm) indicates where the line spectroscopy has
been performed (stabilization parameters V = 1.2
V and I = 70 pA). (c) Representative dI/dV spectra measured on and away from step edge.
(d) 2D plot of tunneling spectra across the blue line (dI/dV in bias range ±0.5 V) which demonstrates
a suppression of the LDOS on the edge of the two bilayer steps.
Surface of Bi(111) after Argon Bombardment
2D defects
were introduced to the surface via argon sputtering, and the influence
on the surface periodicity was examined by LEED. The changes to the
electronic structure in the surface region were monitored by UPS measurements
during the sputtering process. An argon ion beam energy of 2 keV was
used at an incidence angle of 55° (emission current, I = 20 μA). Bismuth samples were bombarded at 300
and 110 K for 10 and 12 min, respectively. With regards to the sputtering
parameters, sample size, and design of our chamber the approximate
flux, fluence, and dosage are 3 × 1011 ions/cm2 s, 2 × 109 ions/s, and 1.8 × 1015 ions/cm2, respectively.LEED images taken
before and after (Figures a and 3b, respectively) Ar+ sputtering for 10 min at 300 K indicate that the
surface remains ordered after sputtering. Evidently, the surface of
the Bi crystal recrystallizes following the disordering induced by
Ar+ sputtering. In an effort to prevent the recrystallization
process, the experiment was repeated at 110 K. By cooling the crystal,
we aimed to retain the amorphous structure of the surface, as has
been demonstrated in the case of Sb(111).[53] In that work, Chekmazov et al. did not observe a LEED pattern after
Ar+ bombardment at low temperature (110 K); however, a
diffraction pattern appeared as the temperature was increased to 300
K. The presence of a LEED pattern following Ar+ sputtering
at for 12 min at 110 K indicates that the surface, once again, possesses
sufficient energy to regain crystallinity. Sputtering at temperatures
below 110 K, which have not been explored in this study, may be required
to retain the amorphous state. The terminating bismuth layer can be
amorphous or the lattice can be distorted, which can change the electronic
structure of Bi(111).[54] However, taking
into account the mean free path of electrons incident to Bi and the
energy range employed, the LEED pattern is predominantly formed from
a depth of ∼5 Å.[55] Spot profile
analyses of the LEED patterns (at 110 and 300 K) before and after
Ar+ treatments are shown in Figure 2S.LEED and UPS spectra of the Bi(111) surface following Ar etching. (a) LEED pattern was obtained from the cleaved
surface of Bi(111) at room temperature at Ep = 57 eV. (b) LEED after the 10 min of sputtering at room temperature
and at Ep = 57 eV (E =
2 keV, PAr = 5 × 10–5 mbar, and I = 20 μA). (c) LEED of the cleaved
crystal at 110 K and at E = 95 eV. (d) LEED of the
sputtered surface at 110 K for 12 min (E = 2 keV, PAr = 5 × 10–5 mbar, and I = 20 μA). LEED in (c) and (d) obtained in conjunction
with UPS measurements. (e) UPS measurements were performed at 110
K before and after different durations of Ar+ etching (E = 2 keV, PAr = 5 × 10–5 mbar, and I = 20 μA). The
black UPS spectra correspond to the UHV cleaved Bi(111) prior to Ar+ etching. Ar+ sputtering was conducted at 110 K
for 2 min (red), 7 min (green), and 12 min (blue).UPS measurements indicate that the DOS near the Fermi level
increases
as the surface is bombarded. UPS measurements were performed before
sputtering and after 2, 7, and 12 min of sputtering at 110 K. The
corresponding spectra are presented in Figure e. It is apparent that the intensity of the
UPS spectra near the Fermi level increases, approximately by a factor
of 3, following 2 min of Ar+ etching. Thus, following sputtering
the surface exhibits more pronounced metallic properties. Further
sputtering of the surface did not result in a remarkable increase
in the UPS spectrum near the Fermi level. This observation is in contrast
with the study of Sb(111),[53] which demonstrated
that the feature near the Fermi level edge becomes more pronounced
with increasing etching duration, corresponding to the more defective
surface. In the case of Bi(111), one can conclude that 2 min is sufficient
to saturate the surface with defects and that this saturation limit
is related to the recrystallization process. To see a gradual shift
of the Fermi edge for Bi, the sputtering conditions (time, ion energy,
or flux) would need to be decreased.STM measurements were performed
following Ar+ sputtering
at 300 K. Figure a
depicts a large-scale STM image (1000 × 1000 nm2, V = 1.5 V, and I = 73 pA), which demonstrates
the change in topography of the Bi(111) surface in comparison to the
cleaved surface presented in Figure a. While the surface structure initially appears disordered,
closer inspection reveals order on a smaller scale. This observation
is verified by LEED measurements (Figure b). Figure b depicts a subsection of Figure a (200 × 200 nm2, V = 1.5 V, and I = 70 pA) which displays
pseudohexagonal structures (nanoislands) with preferential edges (indicated
with dashed, blue lines) corresponding to the 6-fold symmetry of Bi(111).
Drozdov et al.[8] have shown that hexagonal
“pits” in Bi(111) exhibit alternating step edge types,
A and B. Bi(111) islands are geometrically identical and demonstrate
the same alternating step edge types. Sputtering results in a significant
increase to the number of type A and type B bilayer edges at the surface.
Figure 4
STM images
after Ar sputtering. Ar+ sputtering
at room temperature with ion beam energy of 2
keV and partial pressure PAr = 5 ×
10–5 mbar for 10 min. Scale and the scanning parameters
for (a) (1000 × 1000 nm2, V = 1.5
V, and I = 73 pA), for (b) (200 × 200 nm2, V = 1.5 V, and I = 70
pA), and for (c) (20 × 20 nm2, V =
1.5 V, and I = 70 pA). (d) and (e) are line profiles
in image (c) which demonstrate a step height of the Bi monolayer of
around ∼1.35 and ∼1.75 Å.
STM images
after Ar sputtering. Ar+ sputtering
at room temperature with ion beam energy of 2
keV and partial pressure PAr = 5 ×
10–5 mbar for 10 min. Scale and the scanning parameters
for (a) (1000 × 1000 nm2, V = 1.5
V, and I = 73 pA), for (b) (200 × 200 nm2, V = 1.5 V, and I = 70
pA), and for (c) (20 × 20 nm2, V =
1.5 V, and I = 70 pA). (d) and (e) are line profiles
in image (c) which demonstrate a step height of the Bi monolayer of
around ∼1.35 and ∼1.75 Å.The STM image (20 × 20 nm2, V =
1.5 V, and I = 70 pA) presented in Figure c displays a close-up of these
structures. Issues with tip stability, as a result of scanning this
rough sputtered surface, limited the quality of STS measurements,
and hence, STS measurements are not presented. The line profile across
a step edge of the nanoisland shown in Figures d and 4e demonstrates
a step heights of approximately 1.35 and 1.75 Å, closely corresponding
to the monolayer step height of 1.6 Å.[9,34,56,57]Further
analysis of the step heights was conducted, and the resulting
histogram is displayed in Figure a. The histogram shows the number of points (from Figure b) as a function
of the tip–surface distance, relative to the highest terrace
on the surface. To determine the step heights, each peak is deconvoluted
and the distance between peaks measured. From the histogram presented
in Figure a, the monolayer
terraces are estimated to comprise ∼25% of the surface. Two
distinct step heights are apparent, 4 and 2.7 Å. The 4 Å
step corresponds to a bilayer of Bi(111) while the value of 2.7 Å
is assigned to a monolayer of Bi(111). The theoretical atomic lattice
spacing between single Bi(111) layers is 1.6 and 2.4 Å[34] depending on the bond type, covalent or van
der Waals. The surface relaxation of the monolayer atoms and a distinct
LDOS, demonstrated in the next section, affect the STM tip–surface
distance, and thus the measured values differ slightly than that of
theory. The smaller step height difference of 1.6 Å is not seen
in this histogram; however, step heights of 1.35 and 1.75 Å are
observed in Figure c and may correspond to this step. The peaks corresponding to these
1.35 and 1.75 Å might be masked by the other larger peaks. The
small separation between this peak and the common bilayer peaks makes
deconvolution challenging. The height profiles indicate the presence
of an additional step feature, with step height values close to that
of the theoretical lattice spacing for a monolayer of Bi(111).[34,35]
Figure 5
Histogram
of step heights following Ar sputtering.
(a) Deconvolved step heights of the sputtered surface
shown in (b); step heights corresponding to monolayer steps (≈2.7
Å) are indicted by red arrows. (b) STM image after Ar+ sputtering at room temperature with partial pressure PAr = 5 × 10–5 mbar for 10 min.
Scale and scanning parameters of the image are 50 × 50 nm2, V = 1.5 V, and I = 80
pA.
Histogram
of step heights following Ar sputtering.
(a) Deconvolved step heights of the sputtered surface
shown in (b); step heights corresponding to monolayer steps (≈2.7
Å) are indicted by red arrows. (b) STM image after Ar+ sputtering at room temperature with partial pressure PAr = 5 × 10–5 mbar for 10 min.
Scale and scanning parameters of the image are 50 × 50 nm2, V = 1.5 V, and I = 80
pA.Considering that the energy of
Ar+ ions is on the order
of 103 eV and that the binding energy (either covalent
or van der Waals) is of the order of 1 eV, the probability of an ion
breaking covalent or van der Waals bonds is approximately equal. This
may then explain the presence of the monolayers structures on the
surface. Sun et al.[58] demonstrated that
covalent bonds on Bi(100) break following bombardment with Ar+ bombardment with an energy of 300 eV. The presence of ordered
structures following argon sputtering leads to the conclusion that
two opposing processes are involved in their formation: amorphization
and recrystallization of the surface. The sputtering process destroys
the surface order, and the concurrent recrystallization is likely
due to the diffusion of atoms on the surface. If so, it is a thermally
activated process with a very low activation energy. At 110 K, the
diffusion process results in the partial recrystallization of the
surface and the presence of normally energetically unfavorable but
stable in UHV monolayer steps. The increased density of bilayer steps
will not increase the Fermi level character; STS measurements in Figure show the bilayer
step has a lower DOS around the Fermi level.The present findings
indicate that argon sputtering produces these
2D defects (monolayer steps and nanoislands), increasing the DOS near
the Fermi level as indicated by UPS measurements in Figure e. Similarly to the case of
Sb(111),[53] the formation of monolayer steps
is a result of a local violation to the conditions for the Peierls
transition. The Peierls transition is an out-of-plane distortion to
the periodic lattice of Bi(111), which results in the formation of
a layered structure with alternating covalent and van der Waals bonds.
These bonds are energetically favorable in comparison to the simple
cubic structure. Local breaking of these bonds results in an energetically
unfavorable monolayer structure at the surface. This process leads
to a change in the spectrum of electronic states: the proportion of
monolayers (with higher DOS) will increase, which may lead to the
evolution in the UPS spectra near the Fermi level in Figure e.Recently, the breakage
of covalent bonds of a layered material
was observed in the GeTe(111) crystal.[59] Like Bi, GeTe along the [111] direction has short strong bonds (covalent)
and long weaker bonds (van der Waals).[60] In the study of the GeTe(111) crystal, it has been shown that the
Ge termination, which corresponds to covalent bonds, results from
cleaving. Surface vacancies, which may originate from Ar+ sputtering, may also play a role in increasing the Fermi density
at the surface. Calculations by Sahoo et al. indicate an increase
in the Fermi density of the atoms that surround the vacancy due to
dangling bonds.[22] Any contribution that
may arise from surface vacancies is not believed to significantly
contribute to the Fermi density. Good LEED images after Ar+ sputtering indicative of Bi(111) imply vacancies are at low concentration
if present, whereas the histogram shows a significant number of monolayer
features on the surface.It should be noted that the crystal
was not moved during cycles
of Ar+ sputtering and UPS measurements. Furthermore, the
work function of the material does not change following ion etching.
Additionally, XPS survey spectra following Ar+ sputtering
do not indicate the presence of Ar or any other elements on the surface
of Bi. XPS spectra of the carbon 1s, oxygen 1s, and argon 2p regions
obtained after Ar+ sputtering are presented in Figure 3S.
Density Functional Theory
Calculations of Step Structures
DFT calculations were performed
to further investigate the structural
and electronic properties of Bi(111) step types (monolayer and bilayer)
and step edges (type A and type B). The calculations help elucidate
the experimental measurements, which suggest that the monolayer terraces
exhibit a higher DOS near the Fermi level, leading to more pronounced
metallic properties.The electronic and structural properties
of a slab that includes a bilayer step were first investigated. The
slab was composed of 5 complete bilayers with an additional partial
bilayer at the surface, resulting in a terrace edge. Each layer of
the 5 complete bilayers is composed of 21 atoms which run in the Bi[1̅10]
direction. The number of atoms in the partial bilayer was varied to
determine the sufficiently large terrace width. Slabs are allowed
to fully relax, and the differences in the bond lengths between the
central atoms of the partial bilayers are compared. The average difference
in bond length between steps that have 7 and 17 atoms in the Bi[1̅10]
direction was ∼0.5%. Here, 7 and 17 atoms comprise the top
half of the bilayer, while the bottom half is composed of 8 and 18
atoms in the Bi[1̅10] direction. The bilayer step with 7 atoms
in the Bi[1̅10] direction was the minimum step width used in
simulations. A slab with a bilayer terrace terminated by type A and
type B step edges was fully relaxed (see Figure b).Simulated Fermi density
(LDOS at the Fermi level) of monolayer
and bilayer steps on Bi(111): (a) Fermi density of surface atoms from
bilayer (blue) and monolayer (red) step structures ((b) and (c), respectively),
calculated by using Löwdin population analysis.[61] The line for the monolayer section of the monolayer
step structure is solid, while the remaining bilayer component is
broken. (b) Atomic positions in the surface region for a bilayer step
exhibiting a type A and type B step edge. The color of each filled
circle indicates the magnitude of Fermi density. (c) Atomic positions
in surface region for a monolayer step structure. The color of each
filled circle indicates the magnitude of Fermi density. The nine simulated
atomically thin layers under the surfaces shown in (b) and (c) are
not depicted. In (a) note the large Fermi density of the A type step
and the monolayer, in comparison with the bilayer and B type step,
which more normally dominate the cleaved surface.The Fermi density (LDOS at the Fermi level) was calculated by using
Löwdin population analysis[61] based
on pseudoatomic orbitals. The locations of the circles in Figure b indicate the atomic
positions of the surface region of the system in the Bi[1̅10]
and Bi[111] direction, while the color of the circles indicates the
magnitude of the (Kohn–Sham system) Fermi density. The blue
line in Figure a indicates
the Fermi density of the surface atoms as a function of atomic position
in the Bi[1̅10] direction. The Fermi density is approximately
the same for each atom on the surface, reducing near the type B step
edge and increasing significantly at the type A step edge. The STS
data presented in Figure c also exhibit a lower DOS near the Fermi level for the bilayer
step edge compared to the terrace. A terrace terminated by two type
B step edges was found to be more energetically favorable (∼0.21
meV/atom) than that type A and type B terrace depicted in Figure b.Figure c displays
the atomic positions of the surface region of a monolayer step structure
following relaxation. This structure is achieved by adding a bilayer
that is incomplete and asymmetric: the top (terminating) atomic layer
of the bilayer contains 7 atoms while the underlying atomic layer
contains 17 atoms in the Bi[1̅10] direction. For comparison,
the 9 complete layers beneath the surface contain 21 atoms each. The
color of the filled circles once again represents the magnitude of
the Fermi density. The solid red line in Figure a indicates the Fermi density of the monolayer
step portion of this structure, while the broken red line indicates
the remaining portion, consisting of a bilayer step and terrace. The
increase in the Fermi density in the region of the monolayer step
by a factor of 2–3 may be noted, with the largest increase
occurring at the monolayer step edges. The atoms in this section of
the layer and the atoms from the layer beneath have relaxed toward
one another, and as such, the spacing closely resembles that of covalent
bonds rather than the van der Waals bonds. The change in spacing extends
to neighboring atoms and results in a small deviation in the Fermi
density as compared to the conventional bilayer atoms. Integrated
LDOS plots from the Fermi level to −1 eV and from the Fermi
level to +1 eV are presented in the Figure 4S.Figure a
displays
the atom-averaged DOS within a ±2 eV window centered on the Fermi
level for the three central surface atoms (shown in Figure b,c) of the bilayer and monolayer
steps. Two distinct DOS curves are evident, with the monolayer step
(orange) having a larger DOS in the vicinity of the Fermi level, importantly
between 0 and −0.6 eV, in agreement with the differences observed
by UPS. Figure b displays
the LDOS in a ±2 eV window centered on the Fermi level for the
step edge atoms (indicated in Figure b,c) of each step type. The monolayer edge atom (orange)
has a larger DOS near the Fermi level. The LDOS of the pristine surface
(green) is included for comparison. The DFT simulations suggest the
type A bilayer step and monolayer terraces can increase the Fermi
density in comparison to the bilayer terrace and type B bilayer step.
This indicates that these 2D defects can increase the Fermi density
of the sputtered surface, as is observed in experiment.
Figure 7
Simulated LDOS
of atoms from monolayer and bilayer terraces of
Bi(111) (a) Average LDOS of the central 3 atoms from the bilayer step
of Figure b and the
3 central atoms of the monolayer step in Figure c. LDOS of the pristine surface of a 60-layer
Bi(111) slab is also presented. (b) LDOS of the bilayer type B and
monolayer step edge atoms indicated in Figures b and 6c.
Simulated LDOS
of atoms from monolayer and bilayer terraces of
Bi(111) (a) Average LDOS of the central 3 atoms from the bilayer step
of Figure b and the
3 central atoms of the monolayer step in Figure c. LDOS of the pristine surface of a 60-layer
Bi(111) slab is also presented. (b) LDOS of the bilayer type B and
monolayer step edge atoms indicated in Figures b and 6c.We cannot distinguish between type A and type B bilayer steps
from
the histogram in Figure . However, by considering both the predicted contributions to the
Fermi DOS from the monolayer, the type B step edge and the experimental
observation of the increased Fermi DOS, one can gain insight into
the coverage of the monolayer in comparison to the type B step edge.
One assumes each Bi surface atom occupies the same unit volume, and
each of these volumes exhibits the LDOS of that atom throughout. As
previously mentioned, the monolayer terraces are estimated to comprise
∼25% of the surface from the histogram presented in Figure . From DFT calculations
presented in Figure a,b, each central monolayer terrace atom contributes approximately
+0.5 eV–1 to the Fermi density relative to the bilayer
terraces. The monolayer edge atoms contribute nearly +1 eV–1. The type B bilayer edge atoms reduce the Fermi density by ∼0.2
eV–1. Let us consider the case where the total contribution
to the Fermi DOS from the type B bilayer edge atoms is opposite and
equal to the total contribution from the monolayer terrace; there
must be 2.5 times more type B bilayer edge atoms than monolayer terrace
atoms. As we estimate around a quarter of the atoms are monolayer
terrace atoms, we require around 2/3 of all the atoms to be bilayer
type B edge atoms, for cancellation. This is not possible as edge
atoms are greatly outweighed by terrace atoms. Furthermore, if one
also considers the monolayer edge atoms, which contribute twice as
much as the monolayer terrace atoms, the proportion of the atoms that
need to be bilayer type B edge to achieve cancellation further increases.
Finally, type A bilayer edge atoms will increase the Fermi density,
and the histogram cannot distinguish between the type of bilayer terrace
edge. Therefore, the monolayer contribution to the Fermi density outweighs
that of the type B step edges, resulting in an increase to the Fermi
density. The precise contributions to the Fermi DOS from states induced
by sputtering are not clear; however, it is clear that these states,
in some combination, increase the Fermi DOS.
Conclusions
We have thoroughly investigated the nature of the physical and
electronic structure of monolayer and bilayers Bi(111) steps and their
corresponding step edges. Clean, atomically flat Bi(111) undergoes
partial surface recrystallization following Ar+ bombardment.
This process occurs at temperatures as low as 110 K. One would assume
that Ar+ sputtering destroys the surface order, resulting
in an amorphous state; however, simultaneous diffusion remarkably
results in recrystallization and, consequently, nanostructures exhibiting
monolayer steps. These structures have been observed by using STM
measurements. LEED diffraction patterns, which are measured before
and after ion bombardment, also indicates that the surface retains
an ordered nature.UPS measurements, taken at intervals during
Ar+ bombardment,
indicate an increase in the number of electronic states near the Fermi
level following bombardment. This increase in the DOS is understood
to originate from two sources. First, the local breaking of the Peierls
transition, which results in the presence of energetically unfavorable
monolayer steps, contributes. DFT calculations predict the monolayer
terraces exhibit a significantly larger DOS near the Fermi level than
bilayer terraces. Second, the presence of hexagonal nanoislands on
the surface increases the number of bilayer type A and type B step
edges. DFT calculations predict the type A edges to exhibit a Fermi
density even larger than that of the monolayer terraces. Conversely,
type B edges exhibit a Fermi density smaller than that of the bilayer
terraces. This indicates that the increase in the DOS observed by
UPS is due to the increased presence of the monolayers and type A
step edges. The Kohn–Sham density of states is qualitatively
consistent with the zero-frequency limit of UPS, indicating that the
Fermi density is boosted by a factor of 3 near the defected regions
as a result of the breaking of the Peierls transition. The increased
Fermi density at the surface observed in the monolayers is reminiscent
of that of topological insulators, which see use in thermoelectrics
and future applications in spintronics with topological quantum computations.[62,63]
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Authors: K S Novoselov; A K Geim; S V Morozov; D Jiang; Y Zhang; S V Dubonos; I V Grigorieva; A A Firsov Journal: Science Date: 2004-10-22 Impact factor: 47.728
Authors: John B Mc Manus; Dominik V Horvath; Michelle P Browne; Conor P Cullen; Graeme Cunningham; Toby Hallam; Kuanysh Zhussupbekov; Daragh Mullarkey; Cormac Ó Coileáin; Igor V Shvets; Martin Pumera; Georg S Duesberg; Niall McEvoy Journal: Nanotechnology Date: 2020-06-04 Impact factor: 3.874
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