Literature DB >> 34248248

Projection-domain metal artifact correction using a dual layer detector.

Linxi Shi1, N Robert Bennett1, Josh Star-Lack2, Minghui Lu2, Adam S Wang1.   

Abstract

Metal artifact remains a challenge in cone-beam CT images. Many two-pass metal artifact reduction methods have been proposed, which work fairly well, but are limited when the metal is outside the scan field-of-view (FOV) or when the metal is moving during the scan. In the former, even reconstructing with a larger FOV does not guarantee a good estimate of metal location in the projections; and in the latter, the metal location in each projection is difficult to identify due to motion. Furthermore, two-pass methods increase the total reconstruction time. In this study, a projection-based metal detection and correction method with a dual layer detector is investigated. The dual layer detector provides dual energy images with perfect temporal and spatial registration in each projection, which aid in the identification of metal. A simple phantom with metal wires (copper) and a needle (steel) is used to evaluate the projection-based metal artifact reduction method from a dual layer scan and compared with that of a single layer scan. Preliminary results showed enhanced ability to identify metal regions, leading to substantially reduced metal artifact in reconstructed images. In summary, an effective single-pass, projection-domain method using a dual layer detector has been demonstrated, and it is expected to be robust against truncation and motion.

Entities:  

Keywords:  Metal artifact; cone-beam CT; dual energy; dual layer; material decomposition; projection domain

Year:  2020        PMID: 34248248      PMCID: PMC8268992          DOI: 10.1117/12.2547936

Source DB:  PubMed          Journal:  Proc SPIE Int Soc Opt Eng        ISSN: 0277-786X


  1 in total

1.  An experimental survey of metal artefact reduction in computed tomography.

Authors:  Andre Mouton; Najla Megherbi; Katrien Van Slambrouck; Johan Nuyts; Toby P Breckon
Journal:  J Xray Sci Technol       Date:  2013       Impact factor: 1.535

  1 in total
  1 in total

1.  Single-pass metal artifact reduction using a dual-layer flat panel detector.

Authors:  Linxi Shi; N Robert Bennett; Amy Shiroma; Mingshan Sun; Jin Zhang; Richard Colbeth; Josh Star-Lack; Minghui Lu; Adam S Wang
Journal:  Med Phys       Date:  2021-08-10       Impact factor: 4.506

  1 in total

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