Literature DB >> 34198445

Applying deep learning to defect detection in printed circuit boards via a newest model of you-only-look-once.

Venkat Anil Adibhatla1, Huan-Chuang Chih2, Chi-Chang Hsu2, Joseph Cheng2, Maysam F Abbod3, Jiann-Shing Shieh1.   

Abstract

In this paper, a new model known as YOLO-v5 is initiated to detect defects in PCB. In the past many models and different approaches have been implemented in the quality inspection for detection of defect in PCBs. This algorithm is specifically selected due to its efficiency, accuracy and speed. It is well known that the traditional YOLO models (YOLO, YOLO-v2, YOLO-v3, YOLO-v4 and Tiny-YOLO-v2) are the state-of-the-art in artificial intelligence industry. In electronics industry, the PCB is the core and the most basic component of any electronic product. PCB is almost used in each and every electronic product that we use in our daily life not only for commercial purposes, but also used in sensitive applications such defense and space exploration. These PCB should be inspected and quality checked to detect any kind of defects during the manufacturing process. Most of the electronic industries are focused on the quality of their product, a small error during manufacture or quality inspection of the electronic products such as PCB leads to a catastrophic end. Therefore, there is a huge revolution going on in the manufacturing industry where the object detection method like YOLO-v5 is a game changer for many industries such as electronic industries.

Entities:  

Keywords:  YOLO-v5 ; convolution neural network ; deep learning ; printed circuit board (PCB)

Year:  2021        PMID: 34198445     DOI: 10.3934/mbe.2021223

Source DB:  PubMed          Journal:  Math Biosci Eng        ISSN: 1547-1063            Impact factor:   2.080


  4 in total

1.  Improvement of Lightweight Convolutional Neural Network Model Based on YOLO Algorithm and Its Research in Pavement Defect Detection.

Authors:  Fu-Jun Du; Shuang-Jian Jiao
Journal:  Sensors (Basel)       Date:  2022-05-06       Impact factor: 3.847

Review 2.  A review on modern defect detection models using DCNNs - Deep convolutional neural networks.

Authors:  Andrei-Alexandru Tulbure; Adrian-Alexandru Tulbure; Eva-Henrietta Dulf
Journal:  J Adv Res       Date:  2021-04-23       Impact factor: 10.479

3.  End-to-end deep learning framework for printed circuit board manufacturing defect classification.

Authors:  Abhiroop Bhattacharya; Sylvain G Cloutier
Journal:  Sci Rep       Date:  2022-07-22       Impact factor: 4.996

4.  Multi-Scale Safety Helmet Detection Based on RSSE-YOLOv3.

Authors:  Hongru Song
Journal:  Sensors (Basel)       Date:  2022-08-13       Impact factor: 3.847

  4 in total

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