Literature DB >> 34073606

Analysis of Compositional Gradients in Cu(In,Ga)(S,Se)2 Solar Cell Absorbers Using Energy Dispersive X-ray Analysis with Different Acceleration Energies.

Ulrike Künecke1, Matthias Schuster1, Peter Wellmann1.   

Abstract

The efficiency of Cu(In,Ga)(S,Se)2 (CIGSSe) solar cell absorbers can be increased by the optimization of the Ga/In and S/Se gradients throughout the absorber. Analyzing such gradients is therefore an important method in tracking the effectiveness of process variations. To measure compositional gradients in CIGSSe, energy dispersive X-ray analysis (EDX) with different acceleration energies performed at both the front surface and the backside of delaminated absorbers was used. This procedure allows for the determination of compositional gradients at locations that are millimeters apart and distributed over the entire sample. The method is therefore representative for a large area and yields information about the lateral homogeneity in the millimeter range. The procedure is helpful if methods such as secondary ion-mass (SIMS), time-of-flight SIMS, or glow-discharge optical emission spectrometry (GDOES) are not available. Results of such EDX measurements are compared with GDOES, and they show good agreement. The procedure can also be used in a targeted manner to detect local changes of the gradients in inhomogeneities or points of interest in the µm range. As an example, a comparison between the compositional gradients in the regular absorber and above the laser cut separating the Mo back contact is shown.

Entities:  

Keywords:  Cu(In,Ga)Se2; characterization; energy dispersive X-ray analysis; gradients; solar cell; thin films

Year:  2021        PMID: 34073606     DOI: 10.3390/ma14112861

Source DB:  PubMed          Journal:  Materials (Basel)        ISSN: 1996-1944            Impact factor:   3.623


  2 in total

1.  Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films.

Authors:  D Abou-Ras; R Caballero; C-H Fischer; C A Kaufmann; I Lauermann; R Mainz; H Mönig; A Schöpke; C Stephan; C Streeck; S Schorr; A Eicke; M Döbeli; B Gade; J Hinrichs; T Nunney; H Dijkstra; V Hoffmann; D Klemm; V Efimova; A Bergmaier; G Dollinger; T Wirth; W Unger; A A Rockett; A Perez-Rodriguez; J Alvarez-Garcia; V Izquierdo-Roca; T Schmid; P-P Choi; M Müller; F Bertram; J Christen; H Khatri; R W Collins; S Marsillac; I Kötschau
Journal:  Microsc Microanal       Date:  2011-09-12       Impact factor: 4.127

Review 2.  Performing elemental microanalysis with high accuracy and high precision by scanning electron microscopy/silicon drift detector energy-dispersive X-ray spectrometry (SEM/SDD-EDS).

Authors:  Dale E Newbury; Nicholas W M Ritchie
Journal:  J Mater Sci       Date:  2014-11-12       Impact factor: 4.220

  2 in total

北京卡尤迪生物科技股份有限公司 © 2022-2023.