Justyna Sułowska1, Dominika Madej1, Bartłomiej Pokrzywka2, Magdalena Szumera1, Andrzej Kruk3. 1. Department of Ceramics and Refractories, Faculty of Materials Science and Ceramics, AGH University of Science and Technology, A. Mickiewicza 30, 30-059 Krakow, Poland. 2. Institute of Physics, Pedagogical University, Podchora̧żych 2, 30-084 Krakow, Poland. 3. Institute of Technology, Pedagogical University, Podchorążych 2, 30-084 Krakow, Poland.
Abstract
A series of silicate-phosphate glass materials from the SiO2-P2O5-K2O-MgO system (pure and doped with sulfur ions) were synthesized by melting raw material mixtures that contained activated carbon as a reducer. The bulk composition of glass was confirmed with X-ray fluorescence spectroscopy. The homogeneity of the glass was confirmed through elemental mapping at the microstructural level with scanning electron microscopy combined with an analysis of the microregions with energy-dispersive X-ray spectroscopy. The structural and optical properties of the glass were studied by using spectroscopic techniques. The infrared spectroscopy studies that were conducted showed that the addition of sulfur caused changes in the silicate-phosphate networks, as they became more polymerized, which was likely related to the accumulation of potassium near the sulfur ions. By using irradiation with an optical parametric oscillator (OPO) nanosecond laser system operating at the second harmonic wavelength, the glass samples emitted a wide spectrum of luminescence, peaking at about 700 nm when excited by UV light (210-280 nm). The influence of the glass composition and the laser-processing parameters on the emission characteristics is presented and discussed. This work also referred to the density, molar volume, and theoretical optical basicity of pure and sulfur-doped glass.
A series of silicate-n>an class="Chemical">phosphate glass materials from the SiO2-P2O5-K2O-MgO system (pure and doped with sulfur ions) were synthesized by melting raw material mixtures that contained activated carbon as a reducer. The bulk composition of glass was confirmed with X-ray fluorescence spectroscopy. The homogeneity of the glass was confirmed through elemental mapping at the microstructural level with scanning electron microscopy combined with an analysis of the microregions with energy-dispersive X-ray spectroscopy. The structural and optical properties of the glass were studied by using spectroscopic techniques. The infrared spectroscopy studies that were conducted showed that the addition of sulfur caused changes in the silicate-phosphate networks, as they became more polymerized, which was likely related to the accumulation of potassium near the sulfur ions. By using irradiation with an optical parametric oscillator (OPO) nanosecond laser system operating at the second harmonic wavelength, the glass samples emitted a wide spectrum of luminescence, peaking at about 700 nm when excited by UV light (210-280 nm). The influence of the glass composition and the laser-processing parameters on the emission characteristics is presented and discussed. This work also referred to the density, molar volume, and theoretical optical basicity of pure and sulfur-doped glass.
Entities:
Keywords:
IR spectroscopy; luminescence; silicate–phosphate glass; sulfur
Authors: Silvia H Santagneli; José Schneider; Igor Skripachev; Sidney J L Ribeiro; Younès Messaddeq Journal: J Phys Chem B Date: 2008-04-03 Impact factor: 2.991