| Literature DB >> 33970636 |
Sol Lee1,2, Joong-Eon Jung1, Han-Gyu Kim1, Yangjin Lee1,2, Je Myoung Park3, Jeongsu Jang1, Sangho Yoon4,5, Arnab Ghosh1, Minseol Kim1, Joonho Kim1, Woongki Na3, Jonghwan Kim4,5, Hyoung Joon Choi1, Hyeonsik Cheong3, Kwanpyo Kim1,2.
Abstract
The family of group IV-VI monochalcogenides has an atomically puckered layered structure, and their atomic bond configuration suggests the possibility for the realization of various polymorphs. Here, we report the synthesis of the first hexagonal polymorph from the family of group IV-VI monochalcogenides, which is conventionally orthorhombic. Recently predicted four-atomic-thick hexagonal GeSe, so-called γ-GeSe, is synthesized and clearly identified by complementary structural characterizations, including elemental analysis, electron diffraction, high-resolution transmission electron microscopy imaging, and polarized Raman spectroscopy. The electrical and optical measurements indicate that synthesized γ-GeSe exhibits high electrical conductivity of 3 × 105 S/m, which is comparable to those of other two-dimensional layered semimetallic crystals. Moreover, γ-GeSe can be directly grown on h-BN substrates, demonstrating a bottom-up approach for constructing vertical van der Waals heterostructures incorporating γ-GeSe. The newly identified crystal symmetry of γ-GeSe warrants further studies on various physical properties of γ-GeSe.Keywords: Hexagonal GeSe; group IV−VI monochalcogenides; new polymorph; polarized Raman spectroscopy; transmission electron microscopy
Year: 2021 PMID: 33970636 DOI: 10.1021/acs.nanolett.1c00714
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189