| Literature DB >> 33920131 |
Der-Yuh Lin1, Hung-Pin Hsu2, Chi-Feng Tsai1, Cheng-Wen Wang1, Yu-Tai Shih3.
Abstract
In this study, a series of SnS2-xSex (0 ≤ x ≤ 2) layered semiconductors were grown by the chemical-vapor transport method. The crystal structural and material phase of SnS2-xSex layered van der Waals crystals was characterized by X-ray diffraction measurements and Raman spectroscopy. The temperature dependence of the spectral features in the vicinity of the direct band edge excitonic transitions of the layered SnS2-xSex compounds was measured in the temperature range of 20-300 K using the piezoreflectance (PzR) technique. The near band-edge excitonic transition energies of SnS2-xSex were determined from a detailed line-shape fit of the PzR spectra. The PzR characterization has shown that the excitonic transitions were continuously tunable with the ratio of S and Se. The parameters that describe the temperature variation of the energies of the excitonic transitions are evaluated and discussed.Entities:
Keywords: 2D semiconductors; chemical–vapor transport; van der Waals
Year: 2021 PMID: 33920131 DOI: 10.3390/molecules26082184
Source DB: PubMed Journal: Molecules ISSN: 1420-3049 Impact factor: 4.411