Literature DB >> 33885692

Enabling autonomous scanning probe microscopy imaging of single molecules with deep learning.

Javier Sotres1, Hannah Boyd1, Juan F Gonzalez-Martinez1.   

Abstract

Scanning probe microscopies allow investigating surfaces at the nanoscale, in real space and with unparalleled signal-to-noise ratio. However, these microscopies are not used as much as it would be expected considering their potential. The main limitations preventing a broader use are the need of experienced users, the difficulty in data analysis and the time-consuming nature of experiments that require continuous user supervision. In this work, we addressed the latter and developed an algorithm that controlled the operation of an Atomic Force Microscope (AFM) that, without the need of user intervention, allowed acquiring multiple high-resolution images of different molecules. We used DNA on mica as a model sample to test our control algorithm, which made use of two deep learning techniques that so far have not been used for real time SPM automation. One was an object detector, YOLOv3, which provided the location of molecules in the captured images. The second was a Siamese network that could identify the same molecule in different images. This allowed both performing a series of images on selected molecules while incrementing the resolution, as well as keeping track of molecules already imaged at high resolution, avoiding loops where the same molecule would be imaged an unlimited number of times. Overall, our implementation of deep learning techniques brings SPM a step closer to full autonomous operation.

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Year:  2021        PMID: 33885692     DOI: 10.1039/d1nr01109j

Source DB:  PubMed          Journal:  Nanoscale        ISSN: 2040-3364            Impact factor:   7.790


  3 in total

1.  Quantifying nanoscale forces using machine learning in dynamic atomic force microscopy.

Authors:  Abhilash Chandrashekar; Pierpaolo Belardinelli; Miguel A Bessa; Urs Staufer; Farbod Alijani
Journal:  Nanoscale Adv       Date:  2022-04-05

2.  Locating critical events in AFM force measurements by means of one-dimensional convolutional neural networks.

Authors:  Javier Sotres; Hannah Boyd; Juan F Gonzalez-Martinez
Journal:  Sci Rep       Date:  2022-07-29       Impact factor: 4.996

3.  AI-based atomic force microscopy image analysis allows to predict electrochemical impedance spectra of defects in tethered bilayer membranes.

Authors:  Tomas Raila; Tadas Penkauskas; Filipas Ambrulevičius; Marija Jankunec; Tadas Meškauskas; Gintaras Valinčius
Journal:  Sci Rep       Date:  2022-01-21       Impact factor: 4.379

  3 in total

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