| Literature DB >> 33878744 |
Azar Beiranvand1, Maciej Oskar Liedke2, Christopher Haalisto1, Ville Lähteenlahti3, Alejandro Schulman1, S Granroth4, Heikki Palonen5, Maik Butterling6, Andreas Wagner7, Hannu Huhtinen8, Petriina Paturi9.
Abstract
The effect of in situ oxygen and vacuum annealing on the low bandwidth manganite Gd1-xCaxMnO3 (GCMO) thin film with x = 0.4 was investigated. Based on the magnetic measurements, the AFM-FM coupling is suppressed by the vacuum annealing treatment via destroying the double exchange interaction and increasing the unit cell volume by converting the Mn 4+ to the Mn 3+ . Consequently, resistance increases significantly compared to pristine film. The results are explained by a model obtained from the positron annihilation studies, where the vacuum annealing increased the annihilation lifetime in A and B sites due to the formation of vacancy complexes V A,B - V O , which was not the case in the pristine sample. The positron annihilation analysis indicated that most of the open volume defects have been detected in the interface region rather than on the subsurface layer and this result is confirmed by detailed x-ray reflection analysis. On the other hand, the effect of oxygen annealing on the unit cell volume and magnetization was insignificant. This is in agreement with positron annihilation results which demonstrated that the introduction of oxygen does not change the number of cation vacancies significantly. This work demonstrates that the modification of oxygen vacancies and vacancy complexes can tune magnetic and electronic structure of the epitaxial thin films to provide new functionalities in future applications.Entities:
Keywords: AFM-FM coupling; Double exchange interaction; Positron annihilation; Vacancy complexes
Year: 2021 PMID: 33878744 DOI: 10.1088/1361-648X/abf9ba
Source DB: PubMed Journal: J Phys Condens Matter ISSN: 0953-8984 Impact factor: 2.333