| Literature DB >> 33833648 |
Berthold Reisz1, Valentina Belova1, Giuliano Duva1, Clemens Zeiser1, Martin Hodas1, Jakub Hagara2, Peter Šiffalovič2, Linus Pithan3, Takuya Hosokai4, Alexander Hinderhofer1, Alexander Gerlach1, Frank Schreiber1.
Abstract
Many polymorphic crystal structures of copper phthalocyanine (CuPc) have been reported over the past few decades, but despite its manifold applicability, the structure of the frequently mentioned α polymorph remained unclear. The base-centered unit cell (space group C2/c) suggested in 1966 was ruled out in 2003 and was replaced by a primitive triclinic unit cell (space group P 1). This study proves unequivocally that both α structures coexist in vacuum-deposited CuPc thin films on native silicon oxide by reciprocal space mapping using synchrotron radiation in grazing incidence. The unit-cell parameters and the space group were determined by kinematic scattering theory and provide possible molecular arrangements within the unit cell of the C2/c structure by excluded-volume considerations. In situ X-ray diffraction experiments and ex situ atomic force microscopy complement the experimental data further and provide insight into the formation of a smooth thin film by a temperature-driven downward diffusion of CuPc molecules during growth. © Berthold Reisz et al. 2021.Entities:
Keywords: GenX; X-ray reflectivity; atomic force microscopy; grazing-incidence X-ray diffraction; morphology; organic semiconductors; polymorphism; reciprocal space mapping; thin films
Year: 2021 PMID: 33833648 PMCID: PMC7941321 DOI: 10.1107/S1600576720015472
Source DB: PubMed Journal: J Appl Crystallogr ISSN: 0021-8898 Impact factor: 3.304