Low-Dose MDCT of Patients With Spinal Instrumentation Using Sparse Sampling: Impact on Metal Artifacts.

OBJECTIVE. The purpose of our study was to evaluate simulated sparse-sampled MDCT combined with statistical iterative reconstruction (SIR) for low-dose imaging of patients with spinal instrumentation. MATERIALS AND METHODS. Thirty-eight patients with implanted hardware after spinal instrumentation (24 patients with short- or long-term instrumentation-related complications [i.e., adjacent segment disease, screw loosening or implant failure, or postoperative hematoma or seroma] and 14 control subjects with no complications) underwent MDCT. Scans were simulated as if they were performed with 50% (P50), 25% (P25), 10% (P10), and 5% (P5) of the projections of the original acquisition using an in-house-developed SIR algorithm for advanced image reconstructions. Two readers performed qualitative image evaluations of overall image quality and artifacts, image contrast, inspection of the spinal canal, and diagnostic confidence (1 = high, 2 = medium, and 3 = low confidence). RESULTS. Although overall image quality decreased and artifacts increased with reductions in the number of projections, all complications were detected by both readers when 100% of the projections of the original acquisition (P100), P50, and P25 imaging data were used. For P25 data, diagnostic confidence was still high (mean score ± SD: reader 1, 1.2 ± 0.4; reader 2, 1.3 ± 0.5), and interreader agreement was substantial to almost perfect (weighted Cohen κ = 0.787-0.855). The mean volumetric CT dose index was 3.2 mGy for P25 data in comparison with 12.6 mGy for the original acquisition (P100 data). CONCLUSION. The use of sparse sampling and SIR for low-dose MDCT in patients with spinal instrumentation facilitated considerable reductions in radiation exposure. The use of P25 data with SIR resulted in no missed complications related to spinal instrumentation and allowed high diagnostic confidence, so using only 25% of the projections is probably enough for accurate and confident diagnostic detection of major instrumentation-related complications.