Ion migration in perovskite layers can significantly reduce the long-term stability of the devices. While perovskite composition engineering has proven an interesting tool to mitigate ion migration, many optoelectronic devices require a specific bandgap and thus require a specific perovskite composition. Here, we look at the effect of grain size to mitigate ion migration. We find that in MAPbBr3 solar cells prepared with grain sizes varying from 2 to 11 μm the activation energy for bromide ion migration increases from 0.17 to 0.28 eV. Moreover, we observe the appearance of a second bromide ion migration pathway for the devices with largest grain size, which we attribute to ion migration mediated by the bulk of the perovskite, as opposed to ion migration mediated by the grain boundaries. Together, these results suggest the beneficial nature of grain engineering for reduction of ion migration in perovskite solar cells.
Ion migration in perovskite layers can significantly reduce the long-term stability of the devices. While perovskite composition engineering has proven an interesting tool to mitigate ion migration, many optoelectronic devices require a specific bandgap and thus require a specific perovskite composition. Here, we look at the effect of grain size to mitigate ion migration. We find that in MAPbBr3 solar cells prepared with grain sizes varying from 2 to 11 μm the activation energy for bromide ion migration increases from 0.17 to 0.28 eV. Moreover, we observe the appearance of a second bromide ion migration pathway for the devices with largest grain size, which we attribute to ion migration mediated by the bulk of the perovskite, as opposed to ion migration mediated by the grain boundaries. Together, these results suggest the beneficial nature of grain engineering for reduction of ion migration in perovskite solar cells.
Over the recent decade, the
advancement of metalhalideperovskite solar cells has shown remarkable
results, with power conversion efficiencies (PCEs) reaching as high
as 25.5% for single junctions and 29.2% for perovskite/silicon tandems.[1] In terms of efficiency, this class of material
has thus proven effective in solar cell devices. This high performance
in terms of efficiency is, however, somewhat mitigated by the stability
issue this technology currently exhibits, where a decrease of the
PCE of devices over time is commonly observed. This stability loss
can be linked to two types of degradation processes, caused by either
intrinsic factors or extrinsic factors. Extrinsic factors include
moisture, oxygen exposure, and heat and can rapidly degrade the PCE
of devices. Though very detrimental to cell performance, these degradation-inducing
factors can mostly be prevented, noticeably through passivation or
encapsulation schemes of the perovskite layer.[2−5] Of more problematic nature are
the intrinsic factors of degradation. Indeed, contrary to most solar
cell technologies, perovskite crystals are not formed by covalent
bonds only, but instead exhibit dual covalent and ionic nature,[6,7] bearing in mind that ionic bonds are weaker. A number of defects
can thus readily occur in the perovskite lattice, including ion vacancies
and ion interstitials.[8] Within the solar
cell stack, these charged ions can drift toward the electrode of reverse
polarity, in a process called ion migration. Under operation, this
migration can further change the charge and elemental distribution
throughout the perovskite layer and is known to affect the long-term
stability of devices.[9−11]To achieve long-term stability in metalhalideperovskite solar
cells, it is thus necessary to understand the intrinsic degradation
process that is ion migration, to find suitable ways of mitigating
and eventually suppressing this feature altogether.In devices,
the ions migrate from their initial defect position
in the lattice toward the perovskite interface with the transport
layer and accumulate at that interface.[12] However, there is still ongoing debate on how this migration proceeds
in the film, namely, whether the process is mediated by the grain
boundaries or rather by the bulk of the polycrystalline perovskite
films. Some studies report an increased ion migration at grain boundaries,
while others report the opposite effect: Studies reporting an enhancement
of ion migration at grain boundaries include a range of atomic force
microscopy techniques (c-AFM, KPFM, and BE-KPFM) showing the contact
potential difference or the hysteresis percentage mapped locally;[13−15] imaging techniques (SEM) visualizing the deterioration of the grain
boundaries;[14] elemental techniques (EDX)
measuring the dynamic of the lead-to-halide ratio;[14] and conductivity measurements comparing films of various
grain size to extract an activation energy for the migration process.[16] Studies reporting a reduction of ion migration
at grain boundaries include PL techniques (PL microscopy and PLQY)
tracking the ionic defect distribution rate[17] and intensity-modulated photocurrent spectroscopy measurements (IMPS)
comparing the ionic current responses in thin and thick cells.[18]With this study, we thus aim to answer
the following question:
is increasing the grain size an effective way to mitigate ion migration?
We choose MAPbBr3, a well-characterized perovskite in terms
of ion migration.[19−21] The major advantage of using this perovskite material
is the possibility to synthesize films of varying grain size, without
altering key physical or chemical properties of the film. To characterize
and quantify ion migration, we use transient ion drift (TID), a capacitance-based
technique which allows for determination of the nature of the mobile
ions and quantification of their migration activation energy, diffusion
coefficient, and number density.[22−24] The combination of this
measurement technique together with a perovskite recipe that allows
for grain size variation without any modification of the perovskite
composition allows us to determine the influence of grain boundaries
on ion migration in perovskite solar cells.To measure the influence
of grain size on ion migration, we prepare
solar cell devices with an active layer of polycrystalline MAPbBr3 perovskite, of which we modulate the grain size. The recipe
for MAPbBr3 perovskite is adapted from ref (25). Its advantage is the
possibility of varying the perovskite grain size without modifying
any key chemical parameters: only the spin-coating time is varied,
while all other parameters, including precursor content, solvent,
antisolvent, and annealing conditions, remain unchanged. Optical microscopy
(OM) images of the films are shown in Figure a,b, where we observe that the grain size
is correlated to the spinning time of the solution, with short spinning
times leading to larger grains. After a spinning duration of 5 s,
the grains in the final film measure an average size of 11.3 ±
1.7 μm (Figure a), while 60 s of spinning leads to an average size of 1.7 ±
0.2 μm (Figure b). Grain size attribution by microscopy techniques such as OM and
SEM might be misleading;[25,26] we thus confirm our
initial OM characterization with electron backscatter diffraction
(EBSD). The EBSD images show an overlay of the image quality (brightness,
IQ) with the inverse pole figure (color, IPF) along the z-axis (normal to the substrate, Figure c,d) and x-axis (parallel
to the substrate, Figure e,f). The IPF relative to the x-axis shows
a distribution of orientations along the [101] and the [111] directions,
indicative of polycrystallinity. The grains and grain boundaries detected
by EBSD correspond to those observed by OM, thereby confirming the
grain size characterization by OM. We conclude that this recipe, when
used at spinning times between 5 and 60 s, allows for about 1 order
of magnitude in grain size variation.
Figure 1
Top-view OM image of a MAPbBr3 perovskite film spin
coated for (a) 5 s and (b) 60 s. The z orthogonal-direction
top-view EBSD of the MAPbBr3 films spin coated for (c)
5 s and (d) 60 s. The x in-plane-direction top-view
EBSD of the MAPbBr3 films spin coated for (e) 5 s and (f)
60 s. The inverse pole figure legend in the EBSD images shows the
crystallization plane as a function of color. (g) Histogram of the
average grain size as a function of spin coating time, with inset
of the dark IV curves of the devices. (h) Cross-section SEM image
showing the device layers: FTO, NiO,
MAPbBr3, C60, BCP, and gold. The device has
a planar p–i–n architecture. The white scale bars presented
from (a) to (f) all represent a 10 μm length.
Top-view OM image of a MAPbBr3 perovskite film spin
coated for (a) 5 s and (b) 60 s. The z orthogonal-direction
top-view EBSD of the MAPbBr3 films spin coated for (c)
5 s and (d) 60 s. The x in-plane-direction top-view
EBSD of the MAPbBr3 films spin coated for (e) 5 s and (f)
60 s. The inverse pole figure legend in the EBSD images shows the
crystallization plane as a function of color. (g) Histogram of the
average grain size as a function of spin coating time, with inset
of the dark IV curves of the devices. (h) Cross-section SEM image
showing the device layers: FTO, NiO,
MAPbBr3, C60, BCP, and gold. The device has
a planar p–i–n architecture. The white scale bars presented
from (a) to (f) all represent a 10 μm length.The polydispersity in grain size is presented in the histogram
in Figure g. The small
grain regime is characterized by relatively sharp peaks of standard
deviation ∼0.2 μm, whereas the size distribution is more
pronounced in the big grain regime, with standard deviations of 0.6
and 1.7 μm respectively for the 5 and 11 μm samples.Each of these active perovskite layers of MAPbBr3 is
incorporated into a p–i–n solar cell architecture as
shown in Figure h.
Representative cross-section SEM pictures show uniform stacking of
these successive layers. The thick perovskite film exhibits vertical
grain boundaries—the same as those observed in top-view OM
images. The bottom electrode is a FTO layer, covered by a hole transport layer of NiO on top of which the MAPbBr3 perovskite
is spin coated, finally the electron transport layer consists of C60 and BCP, and a gold electrode on top completes the device.
The extraction layers are chosen specifically because they exhibit
no direct ion migration, even though they may reduce the overall PCE
of the devices. Dark IV curves of the devices (see the inset of Figure g) confirm good diode
characteristics, a prerequisite for the TID measurements to study
ion migration. Details about the solar cell characteristics are presented
in section 1 of the Supporting Information.TID is an electric spectroscopy technique for ion migration
measurements
used in perovskite solar cells.[23,24] The measurement is
based on two steps: first, the application of a filling voltage which
will redistribute the ions within a device and, second, the interruption
of this voltage pulse, which will lead to the ions drifting back to
their initial position. We record the capacitance signal during this
second step by applying a small alternating voltage VAC, which thus provides a direct measurement of the ion
migration process.For TID characterization, the first step
is the selection of a
relevant frequency at which to apply the alternating voltage—for
this purpose we measure the impedance spectra of all devices. The
two extreme situations are presented in Figure , where the impedance spectra of the devices
with smallest and largest grain size are shown respectively in panels
a and b. Both impedance spectra look very much alike and resemble
earlier measurements of MAPbBr3.[24] They can be decomposed into a low-frequency regime which is temperature-dependent
and dominated by ion accumulation[27] and
a high-frequency regime which is characterized by a decrease of the
capacitance signal due to the series resistance. In-between these
two regimes lies an intermediate plateau regime, where the capacitance
is determined by the depletion capacitance—this is suitable
for TID measurements. We thus select the frequency of 104 Hz for the small alternating voltage VAC in the intermediate impedance regime.
Figure 2
Impedance spectra of
the devices with (a) 1.7 μm and (b)
11.3 μm grain size MAPbBr3 perovskite films, measured
by using an AC voltage of 10 mV. TID traces after applying a voltage
pulse of 1 V for 2 s to the devices with (c) 1.7 μm and (d)
11.3 μm grain size perovskite films, between 210 and 330 K in
steps of 3 K. The insets in (c) and (d) show the fit to the data for
five intermediate temperatures: 210, 240, 270, 300, and 330 K.
Impedance spectra of
the devices with (a) 1.7 μm and (b)
11.3 μm grain size MAPbBr3 perovskite films, measured
by using an AC voltage of 10 mV. TID traces after applying a voltage
pulse of 1 V for 2 s to the devices with (c) 1.7 μm and (d)
11.3 μm grain size perovskite films, between 210 and 330 K in
steps of 3 K. The insets in (c) and (d) show the fit to the data for
five intermediate temperatures: 210, 240, 270, 300, and 330 K.Figures c and 2d show the TID capacitance traces
after applying
a filling voltage of 1 V for 2 s to the devices with smallest and
largest grain size, respectively. Interestingly, both TID traces show
a negative slope in the whole temperature range considered, independent
of the grain size. This is further confirmed in the TID traces taken
after applying filling voltages of 0.75 or 1.1 V (see Supporting Information section S1). In TID of
p-type semiconductors, a negative transient is attributed to anion
migration. In the MAPbBr3 crystal structure, the only anion
species is the bromide ion. The main ion migration process at play
in the whole device range is thus bromide migration. This was previously
observed for MAPbBr3 in our work comparing MAPbI3 and MAPbBr3[24] and is further
confirmed here.In this study, we use TID to quantify the ion
migration activation
energy Ea, the density of mobile ions Nion, and the diffusion coefficient D for each grain size. The fitting procedure is described in section
2 of the Supporting Information, where
the insets in Figure c,d show the good correspondence of the fits with the data.In the small grain regime (1–3 μm), the data can be
accurately fitted with one exponential contribution, suggesting a
single ion migration process. As the average grain size grows (>5
μm), the fit needs an additional exponential contribution to
accurately represent the data (see Figure a). TID cannot directly point to the microscopic
migration pathway; however, the presence of two separate peaks (with
distinct Ea, Nion, and D) is a strong indication for the combination
of two bromide migration processes in the perovskite film, where,
for example, in addition to the grain boundary mediated pathway most
often described, a bulk pathway would appear for films with larger
grains. We expand on this idea below and for now refer to these migration
pathways as peak A and peak B (respectively in purple and in orange
in Figure ).
Figure 3
Effect of grain
size on ion migration parameters: (a) Typical ΔC peak(s) found after fitting the TID traces for samples
with 1.7 μm grain size (circle) and with 11 μm grain size
(diamond). Peaks A and B are shown in purple and orange, respectively.
(b) Concentration of mobile ions, (c) activation energy, and (d) diffusion
coefficient, extracted by using equations in section S2 of the Supporting Information.
Effect of grain
size on ion migration parameters: (a) Typical ΔC peak(s) found after fitting the TID traces for samples
with 1.7 μm grain size (circle) and with 11 μm grain size
(diamond). Peaks A and B are shown in purple and orange, respectively.
(b) Concentration of mobile ions, (c) activation energy, and (d) diffusion
coefficient, extracted by using equations in section S2 of the Supporting Information.The density of mobile ions is on the order of 5 × 1015–1 × 1016 cm–3, as shown
in Figure b. We note
that this low density of mobile ions is in agreement with the assumption
of ions incompletely screening the built-in voltage in perovskites.[28] The total density of mobiles species from peaks
A and B is rather constant with grain size: 5.2 × 1015, 9.5 × 1015, 8.5 × 1015, and 8.7
× 1015 cm–3 for the samples with
1.7, 1.9, 4.8, and 11.3 μm grain size, respectively. This is
consistent with a model where the ion defect formation energy is independent
of the grain size. This trend suggests that ion vacancies form in
the bulk of the perovskite or at the interface with the transport
layers.We now look at the evolution of Ea as
a function of grain size, as shown in Figure c. The activation energy describes the energy
it takes for an ion to move to the neighboring unit cell. Ea of peak A first strongly increases with grain
size, before reaching a saturation regime for grains larger than 5
μm. For peak B, which is only present for the larger grains,
we notice a higher activation energy than peak A and a slight increase
with grain size from 0.35 ± 0.01 to 0.39 ± 0.02 eV for films
of average grain size 4.8 to 11.3 μm. The general trend is thus
an increase in the activation energy with grain size, indicative of
a stronger barrier to the migration process for larger grains. This
increase is first rapid and then reaches a saturation regime for grains
between 5 and 11 μm. We note that the defect formation energy
(DFE) model developed by Meggiolaro et al.[29] shows a similar evolution of the activation energy with grain size
but that a difference of DFE would lead to a change in the density
of mobile ions in grain interiors compared to grain boundaries, an
explanation which is in contradiction with our observation.The diffusion coefficient as a function of grain size is presented
in Figure d. The values
are on the order of 10–9 cm2 s–1, similar to previous observations for halide migration.[24] These remain relatively constant with grain
size, the lowest value being observed for peak B of the sample with
largest grains, with (7.3 ± 4.6) × 10–10 cm2 s–1 and the highest value being
observed for peak A of the sample with 4.8 μm grains, with (2.6
± 0.8) × 10–9 cm2 s–1. Within the error this shows a relatively constant diffusion coefficient
as compared to the clear increase in activation energy with grain
size. Additional considerations regarding the diffusion coefficient
and activation energy trends are added to section 2 of the Supporting Information.We now combine
all the previous observations into a possible model.
We find the same total number of mobile ions (from peaks A and B combined)
independent of the grain size, which means that these mobile ions
do not arise from the grain boundary. On top of that the activation
energy of peak A increases with grain size. Here it cannot be explained
by a reduced number of mobile ions in grain interiors compared to
grain boundaries: this observation instead suggests that the mobile
bromide ions experience a migration pathway with higher activation
energy in the bulk of the grain relative to grain boundaries. We speculate
that ions migrate first from their original location in the grain
interior to the grain boundary and then through a grain boundary channel
toward the interface. The larger the grain size, the less grain boundaries
are present, and the further away from a grain boundary an average
ion will be positioned. The increase in activation energy of peak
A with grain size is thus a representation of the longer average traveling
distance to the grain boundary. The migration through the grain boundary
channel is thus faster than the migration within the grain, in agreement
with various experimental studies showing faster ion migration at
the grain boundaries.[13−16] For larger grains we find a new ion migration pathway labeled peak
B. With larger grains, it is possible that some of the ions migrating
within the grain become so far away from any grain boundary that an
additional migration pattern arises, where the ions migrate directly
from the grain interior to the interface. The implication there is
that the migration from grain interior to interface is slower than
the migration from grain interior to grain boundary but still takes
place when the interface becomes closer than a grain boundary region.
This model is also consistent with a relatively constant activation
energy and diffusion coefficient for peak B. The illustrative scheme
of this model is presented in Figure a,b. We thus assign peak A as grain-boundary-mediated
bromide migration and peak B as grain-interior-mediated bromide migration.
Figure 4
Model
of ion migration in grains with different lateral size. Schematic
of the proposed ion migration, where (a) in small grain sizes most
ions first migrate to the grain boundary before they migrate to the
interface via the boundary and (b) for larger grain sizes a second
pathway appears where the ions migrate to the interface directly.
(c) Fit to the experimental data of a geometrical model for the activation
energy of ion diffusion (section S4 in the Supporting Information).
Model
of ion migration in grains with different lateral size. Schematic
of the proposed ion migration, where (a) in small grain sizes most
ions first migrate to the grain boundary before they migrate to the
interface via the boundary and (b) for larger grain sizes a second
pathway appears where the ions migrate to the interface directly.
(c) Fit to the experimental data of a geometrical model for the activation
energy of ion diffusion (section S4 in the Supporting Information).The observed trend can
be approximately captured by a geometrical
model for the motion of ions, in which, for simplicity, we consider
the motion of ions along the fastest path to the electrode (section
3 of the Supporting Information). Figure c shows the effective
activation energy as a function of grain size, obtained by computing
the fraction of the path occurring inside the grain and optimizing
the value of the activation energies for bulk and grain boundaries
diffusion. We obtain activation energies of 0.18 and 0.50 eV for ion
diffusion along the grain boundaries and in the bulk. Despite the
approximate nature of the model, leading to a large shift in the onset
of the activation energy change as a function of grain size, it captures
the experimentally observed increase in activation energy for larger
grains.We note that PL microscopy, PLQY, and IMPS studies[17,18] suggest that ions migrate from the inside of a grain to a grain
boundary and then become trapped at the grain boundary. These works
all have in common that they study ion migration along the in-plane
direction by diffusion. Here, the ions may be initially trapped at
the grain boundary, but they are then allowed to drift through the
grain boundary channel in the normal direction, leading them to the
interface of reverse polarity.The grain size of a perovskite
film can also affect the electronic
trap states. By applying a short voltage pulse of 20 ms instead of
2 s to measure only the contribution of trap states to the capacitance
signal, we see changes in the trap state population and energy. We
find one dominant electronic trap, which is shallower for the largest
grain size sample (ET = 192 meV) compared
to the smallest grain size (ET = 300 meV).
The density of trap states scales with the number of grain boundaries
present, suggesting that the grain boundaries play a major role in
trap state formation. These initial findings shown in section S4 of
the Supporting Information warrant further
investigation.We studied bromide ion migration in MAPbBr3 perovskite
solar cells where we find that the grain size mainly affects the activation
energy, while the density of mobile ions and their diffusion coefficient
remain relatively constant with grain size. This is a first indication
that crystallinity is indeed an effective tool to mitigate ion migration.
The quantification of the density of mobile ions and diffusion coefficient
are further useful in understanding how the migration pathway is affected
by grain size. Ion migration is reduced in cells with larger grains
not due to a lower density of mobile ions, but rather due to a higher
energy of the transition state for the hopping process in the grain
interior compared to that transition state at the grain boundary.
Together, our results suggest that for smaller grains there is only
one migration process mediated by the grain boundaries and that for
larger grains a process mediated by the grain bulk becomes significant.
Crystallinity is thus an effective tool to reduce ion migration, proving
itself as an interesting strategy for long-term stability of devices.
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