| Literature DB >> 33644564 |
Taeho Lee1, Chang Eun Song2, Sang Kyu Lee2, Won Suk Shin2, Eunhee Lim3.
Abstract
Two nonfullerene smEntities:
Year: 2021 PMID: 33644564 PMCID: PMC7905825 DOI: 10.1021/acsomega.0c04495
Source DB: PubMed Journal: ACS Omega ISSN: 2470-1343
Scheme 1Synthetic Route of TBTT-BORH and TBTT-ORH
Figure 1(a) TGA and (b) DSC curves of TBTT-BORH and TBTT-ORH acceptors.
Thermal and Optical Properties of TBTT-BORH and TBTT-ORH
| abs. peaks | λonset | ||||||
|---|---|---|---|---|---|---|---|
| soln | film | ||||||
| 374 | 159,183 | 111 | 432, | 676 | 1.83 | ||
| 373 | 220 | 174 | 432, | 585, | 693 | 1.79 | |
Temperature resulting in 5% weight loss based on the initial weight.
Temperature at the melting endothermic peak.
Temperature at the recrystallization exothermic peak.
Absorption peaks measured for samples in chloroform solution and in the film state; λmax is underlined.
Absorption onset of the films.
Eg,opt = 1240/λonset.
Figure 2(a) UV–vis absorption spectra, (b) cyclic voltammograms, and (c) energy-level diagrams of the acceptors TBTT-BORH and TBTT-ORH. The voltammogram and energy diagram of the PTB7-Th donor are included for comparison.
Electrochemical Properties of TBTT-BORH and TBTT-ORH
| 1.06 | –1.12 | –5.76 | –3.58 | 2.17 | |
| 1.04 | –1.10 | –5.74 | –3.60 | 2.14 |
Eonset,ox and Eonset,red are the onset potentials of oxidation and reduction, respectively, vs Ag/AgCl electrode.
Calculated using the empirical equations EHOMO,CV = −(Eonset,ox – E1/2,ferrocene + 4.8) eV and ELUMO,CV = −(Eonset,red – E1/2,ferrocene + 4.8) eV.
Eg,CV = ELUMO,CV – EHOMO,CV.
Figure 3(a) J–V curves and (b) EQE spectra of PTB7-Th:acceptor devices.
Photovoltaic Properties of TBTT-BORH and TBTT-ORHa
| acceptor | annealing | FF [%] | PCE [%] | μh | μe | μh/μe | ||
|---|---|---|---|---|---|---|---|---|
| W/O | 1.02 | 13.30 (12.77) | 44 | 5.97 | 2.08 × 10–5 | 5.34 × 10–6 | 3.9 | |
| SVA | 1.02 | 15.27 (14.66) | 54 | 8.33 | 7.41 × 10–5 | 3.22 × 10–5 | 2.3 | |
| W/O | 0.92 | 14.99 (14.39) | 45 | 6.21 | 5.00 × 10–5 | 1.73 × 10–5 | 2.9 | |
| SVA | 0.95 | 15.82 (15.19) | 51 | 7.60 | 1.40 × 10–4 | 5.12 × 10–5 | 2.7 |
Inverted device architecture is ITO/ZnO NPs/PEIE/PTBT-Th:acceptor (1.0:2.0, CF, d ≈ 100 nm)/MoO/Ag.
Hole-only device is ITO/PEDOT:PSS/PTBT-Th:acceptor (1.0:2.0, CF, d ≈ 100 nm)/Au.
Electron-only device is ITO/ZnO NPs/PEIE/PTBT-Th:acceptor (1.0:2.0, CF, d ≈ 100 nm)/LiF/Al.
JSC values calculated from the EQE spectra.
Figure 4(a) JSC and (b) VOC dependency on Plight for the devices based on TBTT-BORH (BO) and TBTT-ORH (O) in the as-cast (W/O) and SVA conditions.
Figure 5Dark J–V characteristics of (a) hole-only and (b) electron-only devices.
Figure 6(left to right) Height- and phase-mode AFM (2 μm × 2 μm) and TEM images of the (a) as-cast and (b) SVA-treated PTB7-Th:TBTT-BORH (BO) films and the (c) as-cast and (d) SVA-treated PTB7-Th:TBTT-ORH (O) films.