| Literature DB >> 33617256 |
Fatemeh Barati1, Josh P Thompson2, Matthieu C Dartiailh1, Kasra Sardashti1, William Mayer1, Joseph Yuan1, Kaushini Wickramasinghe1, Kenji Watanabe3, Takashi Taniguchi4, Hugh Churchill2, Javad Shabani1.
Abstract
Epitaxial Al-InAs heterostructures appear as a promising materials platform for exploring mesoscopic and topological superconductivity. A unique property of Josephson junction field effect transistors (JJ-FETs) fabricated on these heterostructures is the ability to tune the supercurrent using a metallic gate. Here, we report the fabrication and measurement of gate-tunable Al-InAs JJ-FETs in which the gate dielectric in contact with the InAs is produced by mechanically exfoliated hexagonal boron nitride (h-BN) followed by dry transfer. We discuss a versatile fabrication process that enables compatibility between layered material transfer and Al-InAs heterostructures that allows us to achieve full gate-tunability of supercurrent by using only 5 nm thick h-BN flakes. Our study shows that pristine properties of epitaxial Josephson junctions, such as product of normal resistance and critical current, IcRn, are preserved. Furthermore, complementary measurements confirm that using h-BN dielectric changes the channel density less when compared to atomic layer deposition of Al2O3.Entities:
Keywords: Josephson junction; Josephson transistor; dielectric; hexagonal boron nitride; two-dimensional materials
Year: 2021 PMID: 33617256 DOI: 10.1021/acs.nanolett.0c03183
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189