| Literature DB >> 33615855 |
Jing-Yuan Peng1, Michael George Botelho2, Jukka Pekka Matinlinna3, Hao-Bo Pan4, Edwin Kukk5, Kam-Jung Low6.
Abstract
class="abstract_title">OBJECTIVE: The effects of saliva on demineralized dentin andEntities:
Keywords: Silver diamine fluoride; artificial saliva; basal medium mucin; demineralization; dentin; silver
Mesh:
Substances:
Year: 2021 PMID: 33615855 PMCID: PMC7903840 DOI: 10.1177/0300060520985336
Source DB: PubMed Journal: J Int Med Res ISSN: 0300-0605 Impact factor: 1.671
Figure 1.Flow chart of the experimental design.
UWS, unstimulated whole saliva; BS, buffer solution; BMM, basal medium mucin; DIW, deionized water; SEM-EDX, scanning electron microscopy–energy-dispersive X-ray analysis; XPS, X-ray photoelectron spectroscopy; XRD, X-ray diffraction.
Figure 2.Scanning electron microscopy views of the dentin surface. After treatment: (a) DIW group. (b) BS group. (c) BMM group. (d) UWS group. Before treatment: (e) and (f).
DIW, deionized water; BS, buffer solution; BMM, basal medium mucin; UWS, unstimulated whole saliva.
EDX and XPS analysis.
| Qualitative area –scan in EDX | Atomic concentration (%) in XPS | |||||||
|---|---|---|---|---|---|---|---|---|
| Sample | DIW | BS | BMM | UWS | DIW | BS | BMM | UWS |
| Ca | – | – | – | – | 4.7 | 2.1 | 3.9 | 5.8 |
| P | – | – | – | – | 3.6 | 2.4 | 3.8 | 4.8 |
| O | – | – | – | – | 28.6 | 22.7 | 29.6 | 29.9 |
| N | – | – | – | – | 11.5 | 8.6 | 7.5 | 13.0 |
| C | – | – | – | – | 49.2 | 39.1 | 47.3 | 41.1 |
| Na | – | – | – | – | – | – | 2.4 | – |
| Ag | √ | √ | √ | √ | 1.2 | 12.2 | 3.6 | 3.2 |
| Cl | √ | √ | √ | √ | 0.5 | 12.9 | 0.5 | – |
| S | None | None | None | √ | – | – | 0.8 | 1.5 |
| F | Trace | Trace | Trace | Trace | 0.7 | – | 0.6 | 0.7 |
Note: For the qualitative EDX analysis, the background elemental peaks (i.e., Ca, P, O, N, C, and Na) were excluded from the EDX analysis report.
EDX, energy-dispersive X-ray analysis; XPS, X-ray photoelectron spectroscopy; DIW, deionized water; BS, buffer solution; BMM, basal medium mucin; UWS, unstimulated whole saliva.
Figure 3.Cross-sectional scanning electron microscopy view of dentin samples in unstimulated whole saliva group. (d1) Low magnification (×500). (d2) High magnification (×5000) (d3) and (d4) Spot-scan energy-dispersive X-ray analysis of a crystal particle found in the high-magnification spectra.
Figure 4.Element mapping analysis of the cross-sectional surface of a dentin sample in the unstimulated whole saliva group.
Photoelectron and Auger line positions of dentin samples in XPS.
| Group | Ag (3d5/2) BE (eV) | Ag (M4N4.5N4.5) KE (eV) | Auger parameter | Other photoelectron lines BE (eV) |
|---|---|---|---|---|
| DIW | 368.0 | 357.9 | 725.9 | – |
| BS | 368.4 | 355.0 | 723.4 | Cl (2p) = 198.5 |
| BMM | 367.7 | 358.1 | 725.8 | – |
| UWS | 368.0 | 355.8 | 723.8 | S (2p) = 162.3 |
XPS, X-ray photoelectron spectroscopy; DIW, deionized water; BS, buffer solution; BMM, basal medium mucin; UWS, unstimulated whole saliva.
Figure 5.X-ray diffraction patterns of samples in the (a) DIW group, (b) BS group, (c) BMM group, and (d) UWS group.
DIW, deionized water; BS, buffer solution; BMM, basal medium mucin; UWS, unstimulated whole saliva.