Literature DB >> 33580343

Introduction to the standard reference data of electron energy loss spectra and their database: eel.geri.re.kr.

Jeong Eun Chae1, Ji-Soo Kim1, Sang-Yeol Nam1, Min Su Kim1, Jucheol Park2.   

Abstract

Electron energy loss spectroscopy (EELS) is an analytical technique that can provide the structural, physical and chemical information of materials. The EELS spectra can be obtained by combining with TEM at sub-nanometer spatial resolution. However, EELS spectral information can't be obtained easily because in order to interpret EELS spectra, we need to refer to and/or compare many reference data with each other. And in addition to that, we should consider the different experimental variables used to produce each data. Therefore, reliable and easily interpretable EELS standard reference data are needed.Our Electron Energy Loss Data Center (EELDC) has been designated as National Standard Electron Energy Loss Data Center No. 34 to develop EELS standard reference (SR) data and to play a role in dissemination and diffusion of the SR data to users. EELDC has developed and collected EEL SR data for the materials required by major industries and has a total of 82 EEL SR data. Also, we have created an online platform that provides a one-stop-place to help users interpret quickly EELS spectra and get various spectral information. In this paper, we introduce EEL SR data, the homepage of EELDC and how to use them.

Entities:  

Keywords:  Electron energy loss data center; Electron energy loss spectroscopy; Standard reference; Transmission electron microscopy

Year:  2019        PMID: 33580343      PMCID: PMC7818363          DOI: 10.1186/s42649-019-0015-3

Source DB:  PubMed          Journal:  Appl Microsc        ISSN: 2234-6198


  6 in total

1.  Model based quantification of EELS spectra.

Authors:  J Verbeeck; S Van Aert
Journal:  Ultramicroscopy       Date:  2004-11       Impact factor: 2.689

2.  Extraction of EELS white-line intensities of manganese compounds: methods, accuracy, and valence sensitivity.

Authors:  T Riedl; T Gemming; K Wetzig
Journal:  Ultramicroscopy       Date:  2005-11-10       Impact factor: 2.689

3.  Progress in ultrahigh energy resolution EELS.

Authors:  O L Krivanek; N Dellby; J A Hachtel; J-C Idrobo; M T Hotz; B Plotkin-Swing; N J Bacon; A L Bleloch; G J Corbin; M V Hoffman; C E Meyer; T C Lovejoy
Journal:  Ultramicroscopy       Date:  2018-12-11       Impact factor: 2.689

4.  A Complete Overhaul of the Electron Energy-Loss Spectroscopy and X-Ray Absorption Spectroscopy Database: eelsdb.eu.

Authors:  Philip Ewels; Thierry Sikora; Virginie Serin; Chris P Ewels; Luc Lajaunie
Journal:  Microsc Microanal       Date:  2016-02-22       Impact factor: 4.127

5.  Atomic-level 2-dimensional chemical mapping and imaging of individual dopants in a phosphor crystal.

Authors:  Guo-zhen Zhu; Sorin Lazar; Andrew P Knights; Gianluigi A Botton
Journal:  Phys Chem Chem Phys       Date:  2013-06-07       Impact factor: 3.676

6.  Quantitative use of electron energy-loss spectroscopy Mo-M2,3 edges for the study of molybdenum oxides.

Authors:  L Lajaunie; F Boucher; R Dessapt; P Moreau
Journal:  Ultramicroscopy       Date:  2014-11-11       Impact factor: 2.689

  6 in total

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