| Literature DB >> 33569671 |
Junxiang Xiang1, Wenhui Wang2, Lantian Feng3, Chao Feng1,4, Meng Huang1, Ping Liu1, XiFeng Ren5, Bin Xiang6.
Abstract
In this paper, we report a new type of MoS2-based grating sensor for in-plane biaxial strain gauges with a precision limit of ~ 1‰. The MoS2 grating is numerically simulated with different biaxial strains up to 5%. Our first-principles calculations reveal that the strain sensitivity of the MoS2 reflectance spectrum can be considered an additional strain sensor integrated with the grating structure, enabling the mapping of in-plane biaxial strains. Our experimental studies on a prototype MoS2-grating sensor further confirm that a strain component perpendicular to the grating period can cause intensity peak shifts in the grating's first-order diffraction patterns. This work opens a new path towards the sensing of in-plane biaxial strain within a single-grating device. Our new approach is applicable for other materials that have predictable reflectance response under biaxial strains and the capacity to form a two-dimensional single-crystal layer.Entities:
Keywords: Biaxial strain; First principles; Grating; MoS2; Reflectance
Year: 2021 PMID: 33569671 PMCID: PMC7876191 DOI: 10.1186/s11671-021-03493-3
Source DB: PubMed Journal: Nanoscale Res Lett ISSN: 1556-276X Impact factor: 4.703