Literature DB >> 33569659

Analytical Model for the Channel Maximum Temperature in Ga2O3 MOSFETs.

Xiaole Jia1, Haodong Hu1, Genquan Han2, Yan Liu1, Yue Hao1.   

Abstract

In this work, we proposed an accurate analytical model for the estimation of the channel maximum temperature of Ga2O3 MOSFETs with native or high-thermal-conductivity substrates. The thermal conductivity of Ga2O3 is anisotropic and decreases significantly with increasing temperature, which both are important for the thermal behavior of Ga2O3 MOSFETs and thus considered in the model. Numerical simulations are performed via COMSOL Multiphysics to investigate the dependence of channel maximum temperature on power density by varying device geometric parameters and ambient temperature, which shows good agreements with analytical model, providing the validity of this model. The new model is instructive in effective thermal management of Ga2O3 MOSFETs.

Entities:  

Keywords:  Analytical model; Ga2O3; Maximum temperature; Thermal conductivity

Year:  2021        PMID: 33569659      PMCID: PMC7876208          DOI: 10.1186/s11671-021-03490-6

Source DB:  PubMed          Journal:  Nanoscale Res Lett        ISSN: 1556-276X            Impact factor:   4.703


  1 in total

1.  Characteristics of Vertical Ga2O3 Schottky Junctions with the Interfacial Hexagonal Boron Nitride Film.

Authors:  Venkata Krishna Rao Rama; Ajinkya K Ranade; Pradeep Desai; Bhagyashri Todankar; Golap Kalita; Hiroo Suzuki; Masaki Tanemura; Yasuhiko Hayashi
Journal:  ACS Omega       Date:  2022-07-22
  1 in total

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