| Literature DB >> 33553915 |
Piumi Samarawickrama1, Rabindra Dulal1, Zhuangen Fu1, Uppalaiah Erugu1, Wenyong Wang1, John Ackerman2,3, Brian Leonard4, Jinke Tang1, TeYu Chien1, Jifa Tian1.
Abstract
Recently, a newly discovered VIB group transition metal dichalcogenide (TMD) material, 2M-WS2, has attracted extensive attention due to its interesting physical properties such as topological superconductivity, nodeless superconductivity, and anisotropic Majorana bound states. However, the techniques to grow high-quality 2M-WS2 bulk crystals and the study of their physical properties at the nanometer scale are still limited. In this work, we report a new route to grow high-quality 2M-WS2 single crystals and the observation of superconductivity in its thin layers. The crystal structure of the as-grown 2M-WS2 crystals was determined by X-ray diffraction (XRD) and scanning tunneling microscopy (STM). The chemical composition of the 2M-WS2 crystals was determined by energy dispersive X-ray spectroscopy (EDS) analysis. At 77 K, we observed the spatial variation of the local tunneling conductance (dI/dV) of the 2M-WS2 thin flakes by scanning tunneling spectroscopy (STS). Our low temperature transport measurements demonstrate clear signatures of superconductivity of a 25 nm-thick 2M-WS2 flake with a critical temperature (T C) of ∼8.5 K and an upper critical field of ∼2.5 T at T = 1.5 K. Our work may pave new opportunities in studying the topological superconductivity at the atomic scale in simple 2D TMD materials.Entities:
Year: 2021 PMID: 33553915 PMCID: PMC7860099 DOI: 10.1021/acsomega.0c05327
Source DB: PubMed Journal: ACS Omega ISSN: 2470-1343
Figure 12M-WS2 crystal and structure. (a) Schematic of [WS6] structure. (b) Side view of the lattice structure of 2M-WS2, (c) top view of the lattice structure of 2M-WS2 with a W–W zigzag structure along the a direction. (d) Image of the as-grown 2M-WS2 crystals.
Figure 2The powder XRD pattern of 2M-WS2 crystals, where the red lines were simulated from its single crystal structure.
Figure 3STM/S measurements on a 2M-WS2 thin layer. (a) An optical image of the prepared 2M-WS2 thin layers on a designed Au (5 nm)/SiO2 (300 nm)/Si substrate with a series of concentric Au rings. (b) An atomically resolved STM topography image taken from the 2M-WS2 thin layer. Image size: 10 nm × 10 nm. (c) The corresponding dI/dV mapping taken from the same location as shown in (b). Scanning condition: Vbias = −1 V, Itunneling = 200 pA. (d) dI/dV point spectra measured on the sample at locations A and B in (c). (e) dI/dV point spectrum measured on the sample at locations 1 and 2 in (c). All the measurements were performed at 77 K.
Figure 4Device fabrication and layout. (a) Schematic illustration of the device fabrication procedure using the dry transfer technique. The 2M-WS2 flake exfoliated on a PDMS stamp was transferred on the pre-made Hall-bar pattern with gold electrodes. The device was eventually covered by a thin h-BN flake. (b) An optical image of the fabricated device. (c) The corresponding AFM image of the 2M-WS2 flake on top of the predefined Au Hall-bar electrodes. (d) Line profile along the white line (AB) shown in (c). The thickness of the 2M-WS2 flake is around 25 nm.
Figure 5Superconductivity of the 2M-WS2 thin flake. (a) Temperature dependence of the longitudinal resistance R measured on a 25 nm thick 2M-WS2 flake at zero magnetic field, indicating a transition temperature of ∼8.5 K. The inset shows the data near the transition temperature. (b) Temperature dependences of the longitudinal resistance R under different out-of-plane magnetic fields. (c) Reduced upper critical field as a function of the reduced temperature T/TC. The inset is the upper critical field μ0HC2 as a function of temperature T, where the black dashed line is a linear fit. (d) Out-of-plane magnetic field dependence of the longitudinal resistance measured at the base temperature T = 1.5 K.