| Literature DB >> 33477610 |
Long Ma1, Guo Xia2,3,4, Shiqun Jin2,3,4, Lihao Bai1, Jiangtao Wang1, Qiaoqin Chen1, Xiaobo Cai1.
Abstract
Refractive index resolution is an important indicator for a wavelength interrogation surface plasmon resonance sensor, which can be affected by signal-to-noise ratio. This paper investigates the impact of spectral signal-to-noise ratio on a surface plasmon resonance sensor. The effects of different spectral powers and noises are compared and verified through simulation and experiments. The results indicate that the optimal resonance wavelength is changed and the refractive index resolution can even be nearly twice as good when the spectral signal-to-noise ratio is increased. The optimal resonance wavelength can be found by changing the spectral power distribution or noise.Entities:
Keywords: refractive index resolution; sensor; spectral signal-to-noise ratio; surface plasmon resonance
Year: 2021 PMID: 33477610 PMCID: PMC7831335 DOI: 10.3390/s21020641
Source DB: PubMed Journal: Sensors (Basel) ISSN: 1424-8220 Impact factor: 3.576