| Literature DB >> 33440123 |
Jianfei Huang1, Jaewon Lee2, Hidenori Nakayama3, Max Schrock1, David Xi Cao1, Kilwon Cho4, Guillermo C Bazan1, Thuc-Quyen Nguyen1.
Abstract
Continuously enhanced photoresponsivity and suppressed dark/noise current combinatorially lead to the recent development of high-detectivity organic photodetectors with broadband sensing competence. Despite the achievements, reliable photosensing enabled by organic photodetectors (OPDs) still faces challenges. Herein, we call for heed over a universal phenomenon of detrimental sensitivity of dark current to illumination history in high-performance inverted OPDs. The phenomenon, unfavorable to the attainment of high sensitivity and consistent figures-of-merit, is shown to arise from exposure of the commonly used electron transport layer in OPDs to high-energy photons and its consequent loss of charge selectivity via systematic studies. To solve this universal problem, "double" layer tin oxide as an alternative electron transport layer is demonstrated, which not only eliminates the inconsistency between the initial and after-illumination dark current characteristics but also preserves the low magnitude of dark current, good external quantum efficiency, and rapid transient response.Entities:
Keywords: dark current; high detectivity; metal oxide thin film; organic photodetector; reliability
Year: 2021 PMID: 33440123 DOI: 10.1021/acsnano.0c09426
Source DB: PubMed Journal: ACS Nano ISSN: 1936-0851 Impact factor: 15.881