Literature DB >> 33426870

Indium Gallium Oxide Alloys: Electronic Structure, Optical Gap, Surface Space Charge, and Chemical Trends within Common-Cation Semiconductors.

Jack E N Swallow1,2, Robert G Palgrave3, Philip A E Murgatroyd1, Anna Regoutz3, Michael Lorenz4, Anna Hassa4, Marius Grundmann4, Holger von Wenckstern4, Joel B Varley5, Tim D Veal1.   

Abstract

The electronic and optical properties of (InxGa1-x)2O3 alloys are highly tunable, giving rise to a myriad of applications including transparent conductors, transparent electronics, and solar-blind ultraviolet photodetectors. Here, we investigate these properties for a high quality pulsed laser deposited film which possesses a lateral cation composition gradient (0.01 ≤ x ≤ 0.82) and three crystallographic phases (monoclinic, hexagonal, and bixbyite). The optical gaps over this composition range are determined, and only a weak optical gap bowing is found (b = 0.36 eV). The valence band edge evolution along with the change in the fundamental band gap over the composition gradient enables the surface space-charge properties to be probed. This is an important property when considering metal contact formation and heterojunctions for devices. A transition from surface electron accumulation to depletion occurs at x ∼ 0.35 as the film goes from the bixbyite In2O3 phase to the monoclinic β-Ga2O3 phase. The electronic structure of the different phases is investigated by using density functional theory calculations and compared to the valence band X-ray photoemission spectra. Finally, the properties of these alloys, such as the n-type dopability of In2O3 and use of Ga2O3 as a solar-blind UV detector, are understood with respect to other common-cation compound semiconductors in terms of simple chemical trends of the band edge positions and the hydrostatic volume deformation potential.

Entities:  

Keywords:  XPS; chemical trends; gallium oxide; indium gallium oxide; indium oxide

Year:  2021        PMID: 33426870     DOI: 10.1021/acsami.0c16021

Source DB:  PubMed          Journal:  ACS Appl Mater Interfaces        ISSN: 1944-8244            Impact factor:   9.229


  1 in total

1.  Investigation on Atomic Bonding Structure of Solution-Processed Indium-Zinc-Oxide Semiconductors According to Doped Indium Content and Its Effects on the Transistor Performance.

Authors:  Dongwook Kim; Hyeonju Lee; Bokyung Kim; Sungkeun Baang; Kadir Ejderha; Jin-Hyuk Bae; Jaehoon Park
Journal:  Materials (Basel)       Date:  2022-09-29       Impact factor: 3.748

  1 in total

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