| Literature DB >> 33361795 |
Jon-Olaf Krisponeit1,2, Simon Fischer3, Sven Esser4,5, Vasily Moshnyaga5, Thomas Schmidt3,6, Louis F J Piper7, Jan Ingo Flege8, Jens Falta3,6.
Abstract
Vanadium dioxide (VO2) features a pronounced, thermally-driven metal-to-insulator transition at 340 K. Employing epitaxial stress on rutile [Formula: see text] substrates, the transition can be tuned to occur close to room temperature. Striving for applications in oxide-electronic devices, the lateral homogeneity of such samples must be considered as an important prerequisite for efforts towards miniaturization. Moreover, the preparation of smooth surfaces is crucial for vertically stacked devices and, hence, the design of functional interfaces. Here, the surface morphology of [Formula: see text] films was analyzed by low-energy electron microscopy and diffraction as well as scanning probe microscopy. The formation of large terraces could be achieved under temperature-induced annealing, but also the occurrence of facets was observed and characterized. Further, we report on quasi-periodic arrangements of crack defects which evolve due to thermal stress under cooling. While these might impair some applicational endeavours, they may also present crystallographically well-oriented nano-templates of bulk-like properties for advanced approaches.Entities:
Year: 2020 PMID: 33361795 PMCID: PMC7758337 DOI: 10.1038/s41598-020-78584-9
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379