Shingo Ide1,2, Ken Watanabe3, Koichi Suematsu3, Isamu Yashima2, Kengo Shimanoe3. 1. Department of Molecular and Material Sciences, Interdisciplinary Graduate School of Engineering Sciences, Kyushu University, Kasuga, Fukuoka 816-8580, Japan. 2. Mitsui-Mining & Smelting Co., Ltd., 1333-2 Haraichi, Ageo, Saitama 362-0021, Japan. 3. Department of Advanced Materials Science and Engineering, Faculty of Engineering Sciences, Kyushu University, Kasuga, Fukuoka 816-8580, Japan.
Abstract
Apatite-type lanthanum silicate (LSO) exhibits high oxide-ion conductivity and has recently garnered attention as a potential solid electrolyte for high-temperature solid oxide fuel cells and oxygen sensors that operate in the low- and intermediate-temperature ranges (300-500 °C). LSO exhibits anisotropic oxide-ion conduction along with high c-axis-oriented oxide-ion conductivity. To obtain solid electrolytes with high oxide-ion conductivity, a technique for growing crystals oriented along the c-axis is required. For mass production and upscaling, we have thus far focused on the vapor-phase synthesis of c-axis-oriented apatite-type LSO and successfully grew polycrystals of highly c-axis-oriented boron-substituted apatite-type lanthanum silicate (c-LSBO) using B2O3 vapor. Here, we investigated the mechanism of c-LSBO crystal growth to determine why the utilization of B2O3 vapor resulted in such a strong c-axis crystal orientation. The synthesis of c-LSBO by the B2O3 vapor-phase method results in crystal growth accompanied by the diffusion of B2O3 supplied from another new compound that formed on the surface of the La2SiO5 disk, LaBO3. In addition, c-LSBO crystals are formed not only by vapor-solid reactions but also by solid-solid and liquid-solid reactions. The increase in the c-axis orientation degree might be due to the increase in the amount of the liquid-phase interface.
Apatite-type lanthanum silicate (LSO) exhibits high oxide-ion conductivity and has recently garnered attention as a potential solid electrolyte for high-temperature solid oxide fuel cells and oxygen sensors that operate in the low- and intermediate-temperature ranges (300-500 °C). LSO exhibits anisotropic oxide-ion conduction along with high c-axis-oriented oxide-ion conductivity. To obtain solid electrolytes with high oxide-ion conductivity, a technique for growing crystals oriented along the c-axis is required. For mass production and upscaling, we have thus far focused on the vapor-phase synthesis of c-axis-oriented apatite-type LSO and successfully grew polycrystals of highly c-axis-oriented boron-substituted apatite-type lanthanum silicate (c-LSBO) using B2O3 vapor. Here, we investigated the mechanism of c-LSBOcrystal growth to determine why the utilization of B2O3 vapor resulted in such a strong c-axis crystal orientation. The synthesis of c-LSBO by the B2O3 vapor-phase method results in crystal growth accompanied by the diffusion of B2O3 supplied from another new compound that formed on the surface of the La2SiO5 disk, LaBO3. In addition, c-LSBO crystals are formed not only by vapor-solid reactions but also by solid-solid and liquid-solid reactions. The increase in the c-axis orientation degree might be due to the increase in the amount of the liquid-phase interface.
Oxide-ion conductors are widely employed
as solid electrolytes
in electrochemical devices, such as solid oxide fuel cells, oxygen
separation membranes, and oxygen sensors for automotive exhaust gases.
Yttria-stabilized zirconia (YSZ) is the most commonly employed oxide-ion
conductor. However, YSZ requires a temperature of 800 °C or higher
to exhibit the oxide-ion conductivity necessary for its application
as a solid electrolyte.[1] To reduce the
power consumption and the cost of components, electrochemical devices
that can operate at temperatures below 600 °C are in demand.
To realize this, a novel solid electrolyte must be developed with
high oxide-ion conductivity even at low temperatures. Thus far, various
oxide-ion-conductive solid electrolyte materials such as cerium oxide,[2] bismuth oxide,[3] bismuth–vanadium
oxide,[4,5] and lanthanum gallate[6−8] have been proposed.Apatite-type lanthanum silicate (LSO) exhibits high oxide-ion conductivity
below 600 °C and can be potentially applied as a low-temperature
solid electrolyte. This material exhibits anisotropic oxide-ion conduction
(Figure ),[9,10] and the oxide-ion conductivity along the c-axis
is one to two orders of magnitude higher than those along the a- and b-axis.[11,12] Thus far, several synthetic methods to obtain c-axis-oriented apatite have been reported. Among the reports of single-crystal
synthesis, those from Nakayama et al. and Fukuda et al. are notable,
whereas Nakayama et al. obtained RE9.33(SiO4)6O2 (RE = Pr, Nd, and Sm) crystals by the
floating-zone method and[11] Fukuda et al.
successfully grew (La8.22Ba1.78)(Si5.94□0.06)O26 (where □ denotes a
Si site vacancy) crystals using the BaCl2 flux method.[13] Further, several studies have attempted the
synthesis of polycrystalline c-axis-oriented LSO.
Fukuda et al. used the sandwich-type diffusion couple method to promote
the reaction between La2Si2O7 and
La2SiO5 [or La2(Si0.833Ge0.167)O5] and obtained polycrystalline c-axis-oriented LSO (Lotgering factor, f001, = 0.79–0.90).[14−17] Nakayama et al. achieved a c-axis-oriented polycrystalline disk (f001 = 0.481) through slip-casting under a strong magnetic
field.[18] In addition, Ou et al. synthesized c-axis-oriented LSO (f001 =
0.84) by arc melting.[19] The as-obtained c-axis-oriented LSO exhibited higher oxide-ion conductivity
than nonoriented LSO. In other words, to achieve high oxide-ion conductivity,
LSO crystal orientation along the c-axis is essential,
and it is also necessary to develop a crystal orientation technology
that is amenable for mass production.
Figure 1
Crystal structure of apatite-type La9.33Si6O26 (PDF number 01-074-9552) drawn
using VESTA-3.
Crystal structure of apatite-type La9.33Si6O26 (PDF number 01-074-9552) drawn
using VESTA-3.Fukuda et al. proposed the vapor–solid
reaction for the
synthesis of c-axis-oriented apatite-type LSO polycrystalline
ceramics, where [GeO + 1/2O2] or [SiO + 1/2O2] is supplied in the vapor state to a lanthanum silicate (La2SiO5) disk at a temperature of 1400 °C or
higher.[20−22]where □ denotes a Si site
vacancy.Compared with other methods, such as the diffusion
couple method
and slip-casting under a strong magnetic field, vapor–solid
reactions are more advantageous for upscaling and mass-producing c-axis-oriented LSO. However, the oxide-ion conductivities
of the materials prepared by the vapor–solid reaction are 1.04
× 10–2 S cm–1 at 700 °C
and 1.17 × 10–2 S cm–1 at
800 °C, which are lower than those of single crystals and c-axis-oriented polycrystalline apatite-type LSO formed
by the sandwich-type diffusion couple method (1.26 × 10–1 S cm–1 at 800 °C). We considered that the
low c-axis orientation of these materials (f00 = 0.59–0.70) leads
to the low oxide-ion conductivity. Therefore, a new vapor–solid
reaction that can produce highly c-axis-oriented
apatite-type LSO should be developed.Recently, we successfully
synthesized a highly c-axis-oriented (f00 = 0.99) boron-substituted apatite-type
lanthanum silicate (c-LSBO) through a vapor–solid
reaction using B2O3 as the vapor precursor.[23] Through this method, we achieved the highest
degree of c-axis orientation ever reported for LSO
synthesized by vapor-phase
methods. The obtained c-LSBO exhibited higher oxide-ion
conductivity (1.6 × 10–2 mS cm–1 at 400 °C) than both c-axis-oriented LSO synthesized
by the diffusion pair method[14] and YSZ,
and an oxygen separation device using c-LSBO as the
solid electrolyte showed improved oxygen pumping properties at 600
°C (3.5 mL cm–2 min–1 under
an applied DC voltage of 1.5 V).[24] In addition,
we applied this process to the synthesis of c-axis-oriented
Y-doped LSBO and demonstrated the possibility of using it as an electrolyte
in a solid electrolyte-type CO2 sensor.[25] Therefore, highly c-axis-oriented LSO
with excellent oxide-ion conductivity is a promising material for
developing electrochemical devices that can be operated at low temperatures.
However, the mechanism of the high c-axis orientation
of c-LSBO has not been clarified. Here, we report
a new crystal growth mechanism for the highly c-axis-oriented
apatite-type LSO crystals formed from the reaction of La2SiO5 with vaporized B2O3.
Results
and Discussion
Preparation of c-Axis-Oriented c-LSBO Polycrystals
In this study, we first prepared
a powder
with the chemical composition La2SiO5 by a solid–state
reaction between La2O3 and SiO2.
Subsequently, La2SiO5 was molded into disks
and subjected to orientational annealing using an electric vertical
double furnace (Figure ) by reacting with B2O3 vapor. In this set-up,
B2O3 powder was evaporated in the lower stage
and fed to the upper stage where it reacted with solid La2SiO5 disks (see details in the Experimental section).
The crystal growth along the c-axis was performed
for 40 h with the lower stage at 1300 °C and the upper stage
at 1570 °C.
Figure 2
Schematic of the vertical double furnace. The electric
furnace
supplied B2O3 vapor to the upper furnace under
air circulation that then reacted with La2SiO5 disks.
Schematic of the vertical double furnace. The electric
furnace
supplied B2O3 vapor to the upper furnace under
air circulation that then reacted with La2SiO5 disks.
Highly c-Axis-Oriented c-LSBO
Polycrystals
Figure shows polarized light micrographs of the (a) as-obtained
La2SiO5 disk sample before orientational annealing
and (c) the disk annealed at a lower-stage temperature of 1300 °C
and upper-stage temperature of 1570 °C for 60 h. Upon annealing
in the presence of B2O3 vapor, the crystal grains
with random shapes turned columnar. Scanning electron microscopy (SEM)
images indicate columnar grains in the depth direction (Figure d). Rather than just along
the thickness, crystal growth is also observed in the lateral direction;
the crystal grows as a column from the surface in contact with the
B2O3 vapor until the point it makes contact
with the crystal grown from the other surface, generating a contact
boundary. This result is similar to that obtained with the vapor–solid
reaction method using [GeO + 1/2O2].[20,21] The X-ray diffraction (XRD) pattern of the pulverized LSBO powder
in Figure f corresponds
to the hexagonal apatite structure (PDF number 01-074-9552). The strong
002 and 004 reflection peaks from the surface of c-LSBO indicate that the annealed disk has a c-axis-oriented
apatite structure (Figure e). The Lotgering factor calculated from the XRD peak intensities
is 0.92. The inductively coupled plasma atomic emission spectroscopy
(ICP–AES) analysis results indicate a cationic composition
of La/Si/B = 9.7:5.3:0.7 (assuming Si + B = 6.0). The microarea XRD
patterns were collected from the cross section of the obtained sample
(Figure ), wherein
the peaks corresponding to the 00l crystal plane
of the apatite structure were not detected, indicating that the c-axis-oriented apatite crystals formed uniformly along
the depth direction.
Figure 3
Cross-sectional photographs and XRD patterns of the La2SiO5 disk before annealing and oriented c-LSBO formed after annealing. (a) Cross-sectional polarization
micrograph
of the La2SiO5 disk. (b) XRD pattern of the
La2SiO5 disk. (c) Cross-sectional polarization
micrograph of c-LSBO. (d) Cross-sectional SEM image
of c-LSBO after etching with 3.7% hydrochloric acid.
(e) XRD pattern of c-LSBO polished to 350 μm
thickness and (f) XRD pattern of the ground powder of c-LSBO.
Figure 4
Microarea XRD patterns of a cross-section of c-LSBO recorded at different locations along the depth direction
of
the sample. The depth of location (a) is ∼50, (b) ∼100,
(c) ∼150, and (d) ∼200 μm from the disk surface.
Cross-sectional photographs and XRD patterns of the La2SiO5 disk before annealing and oriented c-LSBO formed after annealing. (a) Cross-sectional polarization
micrograph
of the La2SiO5 disk. (b) XRD pattern of the
La2SiO5 disk. (c) Cross-sectional polarization
micrograph of c-LSBO. (d) Cross-sectional SEM image
of c-LSBO after etching with 3.7% hydrochloric acid.
(e) XRD pattern of c-LSBO polished to 350 μm
thickness and (f) XRD pattern of the ground powder of c-LSBO.Microarea XRD patterns of a cross-section of c-LSBO recorded at different locations along the depth direction
of
the sample. The depth of location (a) is ∼50, (b) ∼100,
(c) ∼150, and (d) ∼200 μm from the disk surface.
c-Axis-Oriented Crystal
Growth
Figure shows the c-axis orientation degree of samples
annealed for 1 h at
different temperatures between 1350 and 1570 °C in the presence
of B2O3 vapor. The c-axis orientation
degree is calculated from the total intensity of all reflection peaks
and the intensity sum of the 002 and 004 reflection peaks of the XRD
intensity. The c-axis orientation degree tends to
increase with increasing annealing temperature in the presence of
B2O3 vapor. It increases sharply between 1400
and 1500 °C. In addition, comparison of the electron backscatter
diffraction (EBSD) images of the c-axis-oriented
crystal grains formed at 1400 and 1500 °C indicates that although
the c-axis-oriented apatite layer formed at 1400
°C shows preferential orientation in the c-axis
direction, some crystal grains are not oriented along the c-axis. The crystal growth direction is also random, and
some grains are observed to have grown obliquely. That is, columnar
crystals do not grow uniformly in the depth direction at 1400 °C.
However, the layer formed at 1500 °C shows more columnar grains
than that of the sample annealed at 1400 °C. Next, we investigated
the reaction between the B2O3 vapor and La2SiO5 disk. First, Figure shows cross-sectional polarization micrographs
and electron probe microanalysis (EPMA) boron mapping images of a
sample annealed at 1400 °C for 1 h, 1500 °C for 1 h, and
1570 °C for 1 h. As the temperature is increased, the thicknesses
of the B2O3 diffusion layer and oriented layer
increased. The thickness of the B2O3 diffusion
layer is almost equivalent to that of the c-axis-oriented
layer. In other words, c-LSBO is formed by the diffusion
of B2O3 into the La2SiO5 disk. B2O3 supplied from the interface diffuses
into the unreacted part of the La2SiO5 disk
through the already formed c-axis oriented layer.
Figure 5
Dependence
of the c-axis orientation on the annealing
temperature of B2O3 vapor and top-surface EBSD
images (normal direction) of samples annealed at 1400 and 1500 °C.
Figure 6
Polarization micrographs and EPMA B mapping images of
the cross
sections of samples annealed at (a) 1400, (b) 1500, and (c) 1570 °C
for 1 h.
Dependence
of the c-axis orientation on the annealing
temperature of B2O3 vapor and top-surface EBSD
images (normal direction) of samples annealed at 1400 and 1500 °C.Polarization micrographs and EPMA B mapping images of
the cross
sections of samples annealed at (a) 1400, (b) 1500, and (c) 1570 °C
for 1 h.Next, the surfaces of the samples
annealed at 1400, 1500, and 1570
°C in the B2O3 vapor for 1 h were analyzed
using XRD and EPMA (Figure ). Aragonite-type LaBO3[27] (PDF number 01-076-1389, space group: Pnma) consisting
of La and B layers is formed on the outermost surface of the sample
annealed at 1400 °C. In this case, we observed that the vapor-phase
method using B2O3 vapor produces a new compound
on the outermost surface of the La2SiO5 disk.
We consider that LaBO3 is formed from La extracted from
La2SiO5, and La2SiO5 that
supplied La partially changes to an apatite composition.
Figure 7
XRD patterns of the surface and EPMA mapping
images of the cross
sections of samples annealed at (a) 1400, (b) 1500, and (c) 1570 °C
for 1 h.
XRD patterns of the surface and EPMA mapping
images of the cross
sections of samples annealed at (a) 1400, (b) 1500, and (c) 1570 °C
for 1 h.The vapor-phase method using B2O3 vapor differs
from the previously reported vapor-phase methods using SiO and GeO;[20−22] a new compound, LaBO3, is formed, and c-axis-oriented crystals are grown (Figure ).
Figure 8
LaO1.5–SiO2–BO1.5 ternary phase diagram.
LaO1.5–SiO2–BO1.5 ternary phase diagram.Here, B2O3 required for the c-axis-oriented crystal growth is supplied from LaBO3 between
1400 and 1500 °C. As there is a continuous supply of B2O3 vapor, the LaBO3 phase does not disappear.
Furthermore, the space group of LaBO3 changes from Pnma to P121/m1 (PDF number 01-073-114) at 1500 °C. At 1570 °C, no layer
consisting of La and B exists, and no distinct formation of LaBO3 is observed. The LaBO3 peak corresponding to the
space group of P121/m1 appears with a low intensity in the XRD pattern of the sample annealed
at 1570 °C. Alternatively, it might have formed during cooling.
Thus, these results suggest that the state of the sample side to which
B is supplied differs depending on the annealing temperature. Figure shows SEM images
of the sample surfaces annealed at each temperature for 1 h. Annealing
in the presence of B2O3 vapor clearly changes
the surface state. The sample surface annealed at 1500 °C becomes
smooth, suggesting an increase in liquid-phase LaBO3. In
contrast, the surface annealed at 1570 °C is not smooth, suggesting
that no liquid phase was formed. These results are consistent with
La2O3–B2O3 phase
diagram proposed by Levin et al.[28] The
results of the change in the space group and the disappearance of
LaBO3 indicate that LaBO3 is formed in the B-rich
region of the disk surface. Hence, B2O3 is likely
supplied to the disk from the solid–solid phase and liquid–solid
phase mixed interface at 1400 °C, the solid–liquid interface
at 1400–1500 °C, and the vapor–solid interface
at 1500 °C or higher (Figure ). We consider that the columnar grains grow randomly
rather than in the vertical direction when a liquid–solid interface
exists locally on an interface containing many solid–solid
interfaces. Hence, an increase in the degree of orientation at 1450
°C or higher occurs mostly because of the formation of, and increase
in, the liquid–solid interfaces, suggesting that the formation
of oriented crystal grains (crystal nucleation) and columnar growth
are similar to those achieved with the flux method.[13]
Figure 9
SEM images of the sample surface (a) before annealing and (b) after
annealing at 1400, (c) 1500, and (d) 1570 °C.
Figure 10
Schematic of interface-forming compounds and the c-axis oriented crystal growth mechanism during the B2O3 vapor-phase synthetic method.
SEM images of the sample surface (a) before annealing and (b) after
annealing at 1400, (c) 1500, and (d) 1570 °C.Schematic of interface-forming compounds and the c-axis oriented crystal growth mechanism during the B2O3 vapor-phase synthetic method.
Conclusions
For the first time, the c-axiscrystal growth
mechanism of c-axis-oriented apatite-type LSO crystals
grown using B2O3 vapor was clarified. B2O3 supplied in the vapor phase may form a new compound,
LaBO3, on the surface of the La2SiO5 disk below 1400 °C, thus yielding a mixed interface of the
solid–solid phase and liquid–solid phase. At 1500 °C,
a liquid–solid interface was mainly formed, and above 1500
°C, the formed LaBO3 disappeared, suggesting the formation
of a B2O3 vapor–solid phase interface.
The c-axis-oriented apatite (c-LSBO)
was formed by the diffusion of B2O3. c-LSBO with a high degree of c-axis orientation
is obtained by the vapor-phase method using B2O3 vapor because of the large contribution of liquid-phase LaBO3 formed between 1400 and 1500 °C. We considered that
the formation of a liquid phase at the interface resulted in grains
with columnar crystal orientations, similar to those obtained from
the flux method. In future studies, we will consider optimizing the
synthesis conditions or selecting other elements that can form liquid
phases at lower temperatures to improve the properties and productivity
of c-axis-oriented apatite-type LSO as a solid electrolyte.
Methods
Synthesis
of c-LSBO
A powder with
the chemical composition La2SiO5 was synthesized
by a solid–state reaction. Stoichiometric amounts of La2O3 (99.99%, Nippon Yttrium Co., Ltd., Fukuoka,
Japan) and SiO2 (99.9%, FUJIFILM Wako Pure Chemical Corporation,
Osaka, Japan) were mixed in ethanol at 200 rpm for 1 h using a planetary
ball mill (Pulverisette 5, Fritsch Co., Ltd., Idar-Oberstein, Germany).
The well-mixed powder was heated at 800 °C for 1 h and then sintered
at 1650 °C for 3 h in air. The composite powder obtained was
further ground for 10 h using a ball mill at a rotating speed of 200
rpm, shaped into a cylindrical pellet with a diameter of 20 mm, and
pressed for 1 min at 600 MPa by cold isostatic pressing (Piston-type,
Kobe Steel, Ltd., Kobe, Japan). The pressed pellets were then sintered
at 1600 °C for 3 h in air. Next, the disk was polished to a thickness
of 700 μm using a polishing machine (Discoplan-TS, Struers,
Ballerup, Denmark) and finished using 800-grit SiC polishing paper.
The relative density of the disks exceeded 98% (PDF number 00-040-0234,
theoretical density: 5.49 g/cm3).Subsequently, orientational
annealing was performed using an electric vertical double furnace
(Figure ). B2O3 powder (99.9%, 100 mg, Kanto Chemical Co., Inc., Tokyo,
Japan) was evaporated in the lower stage, and the generated B2O3 vapor and solid La2SiO5 disks were allowed to react in the upper stages. The lower and upper
stages were connected and designed such that the B2O3 vapor was fed to the upper stages. A Pt crucible containing
100 mg of B2O3 powder was placed in the lower
stage, whereas a sintered La2SiO5 disk was placed
in an Al2O3 holder covered with Pt in the upper
stage. The lower and upper stages were then heated to 1300 and 1570
°C, respectively, at the rate of 100 °C h–1 and maintained for 40 h. The upper and lower stages were then cooled
at the rate of 100 °C h–1. The mechanism of
crystal growth along the c-axis was investigated
using samples annealed with the lower stage at 1300 °C and upper
stage at 1400, 1500, or 1570 °C for 1 h.
Material Characterization
Polarized light microscopy
(Olympus BX51, Olympus Corporation, Tokyo, Japan) and field-emission
SEM (JSM-7900F, JEOL Ltd. Tokyo, Japan) were conducted to observe
the crystal grains in the c-LSBO disks. For polarized
light microscopy, we pasted a sample cross section on a glass plate
and polished it to a thickness of 100 μm. To observe the crystal-grain
orientation, EBSD (Symmetry, Oxford instruments, Oxfordshire, United
Kingdom) measurements were performed at an acceleration voltage of
20 kV and sample tilt angle of 70°. The elemental distribution
was determined by field-emission EPMA (JXA-8530FPlus, JEOL Ltd. Tokyo,
Japan). The grain boundaries were etched by treatment with 3.7% hydrochloric
acid for 30 min. The crystal structures of the composite powder and
the disk were analyzed by XRD (RINT-TTR III, Rigaku Corporation, Tokyo,
Japan; Cu Kα radiation, λ = 1.5406 Å; 2θ range:
20–60°, scan speed 20° min–1, 50
kV, 300 mA) and microarea XRD (SmartLab, Rigaku Corporation, Tokyo,
Japan; Cu Kα radiation, λ = 1.5406 Å; 2θ range:
20–60°, scan speed 5° min–1, 40
kV, 30 mA, measurement area: Φ = 50 μm). The crystal orientation
was calculated using the following equations[14,26]where ρ0 represents the value
of the randomly oriented sample and can be calculated from the intensity
of the XRD peaks in Figure e using eq where ΣI0(hkl) is the total intensity of all reflection peaks
observed in the 2θ range of 20–60° and ΣI0(00l) is the sum of the intensity
of the 002 and 004 peaks.ρ00 can be calculated from the intensity of the XRD peaks in Figure f using eqThe relative
density was calculated using the weights and volumes
of the samples. The compositions of the synthesized samples were determined
by ICP–AES.