| Literature DB >> 33313512 |
Anna Abfalterer1, Javad Shamsi1, Dominik J Kubicki1,2, Christopher N Savory3, James Xiao1, Giorgio Divitini4, Weiwei Li4, Stuart Macpherson1, Krzysztof Gałkowski1,5, Judith L MacManus-Driscoll4, David O Scanlon3,6, Samuel D Stranks1,7.
Abstract
Optoelectronic devices based on lead halide perovskites are processed in facile ways, yet are remarkably efficient. There are extensive research efforts investigating lead-free perovskite and perovskite-related compounds, yet there are challenges to synthesize these materials in forms that can be directly integrated into thin film devices rather than as bulk powders. Here, we report on the colloidal synthesis and characterization of lead-free, antifluorite Cs2ZrX6 (X = Cl, Br) nanocrystals that are readily processed into thin films. We use transmission electron microscopy and powder X-ray diffraction measurements to determine their size and structural properties, and solid-state nuclear magnetic resonance measurements reveal the presence of oleate ligand, together with a disordered distribution of Cs surface sites. Density functional theory calculations reveal the band structure and fundamental band gaps of 5.06 and 3.91 eV for Cs2ZrCl6 and Cs2ZrBr6, respectively, consistent with experimental values. Finally, we demonstrate that the Cs2ZrCl6 and Cs2ZrBr6 nanocrystal thin films exhibit tunable, broad white photoluminescence with quantum yields of 45% for the latter, with respective peaks in the blue and green spectral regions and mixed systems exhibiting properties between them. Our work represents a critical step toward the application of lead-free Cs2ZrX6 nanocrystal thin films into next-generation light-emitting applications.Entities:
Year: 2020 PMID: 33313512 PMCID: PMC7724740 DOI: 10.1021/acsmaterialslett.0c00393
Source DB: PubMed Journal: ACS Mater Lett ISSN: 2639-4979
Figure 1XRD and TEM characterization of solid-state Cs2ZrX6 samples. (a) XRD patterns of Cs2ZrCl6 bulk powder (light blue) and a Cs2ZrCl6 NC thin film (blue), as well as the reference XRD pattern of Cs2ZrCl6 (JCPDS File No. 01-074-1001, shown in black).[20] The diffraction patterns are normalized to the respective maximum intensity of the scans and are vertically offset for clarity. The air-free sample holder introduces a broad background and a peak at ∼20° (marked with a hash symbol (#)); the asterisks (*) mark peaks that originate from the Si substrate. The inset shows an expanded comparison of the (220) XRD peaks of Cs2ZrCl6 bulk powder with the Cs2ZrCl6 NC thin film. The patterns are normalized to the maximum peak intensity and scaled between 0 and 1 along the ordinate, respectively. (b) XRD patterns of Cs2ZrBr6 bulk powder (light green; including CsBr phase impurity) and a Cs2ZrBr6 NC thin film (green) as well as the reference XRD pattern of Cs2ZrBr6 (shown in black; see the SI for details on calculation) and CsBr (JCPDS File No. 00-005-0588, shown in orange).[22] The diffraction patterns are normalized to the respective maximum intensity of the scans and vertically offset for clarity. The air-free sample holder introduces a broad background and peak at ∼20° (marked with a hash symbol (#)). The inset shows an expanded view comparing the (222) XRD peaks of Cs2ZrBr6 bulk powder with the Cs2ZrBr6 NC thin film. The patterns are normalized to the maximum peak intensity and scaled between 0 and 1 along the ordinate, respectively. For both Cs2ZrCl6 and Cs2ZrBr6 reference XRD patterns, we index the first six diffraction peaks to the respective (hkl) planes, according to the powder diffraction file (PDF) for Cs2ZrCl6 and the simulated reference XRD pattern for Cs2ZrBr6. (c) TEM image of Cs2ZrCl6 NCs. The inset shows a HR-TEM image (see Figure S2 in the SI for a larger area) of a Cs2ZrCl6 NC, showing (220) lattice fringes separated by ∼3.7 Å. (d) TEM image of Cs2ZrBr6 NCs. The inset shows an HR-TEM image (see Figure S3 in the Supporting Information for a larger area) of a Cs2ZrBr6 NC, showing (220) lattice fringes separated by ∼3.9 Å.
Figure 2Solid-state MAS NMR characterization of Cs2ZrCl6 samples. (a) 133Cs echo-detected spectrum of Cs2ZrCl6 bulk powders (at 10 kHz MAS) and a Bloch decay (single pulse) spectrum of Cs2ZrCl6 NCs (at 12 kHz MAS) at 16.4 T and RT. The spectra are vertically offset for clarity. The arrow indicates a broad signal corresponding to surface Cs+ sites of the Cs2ZrCl6 NCs. (b) 1H–13C CP spectrum of the carbon-containing species in a Cs2ZrCl6 NC sample recorded under DNP SENS conditions. The asterisks (*) indicate spinning sidebands. (c) 1H–15N CP spectrum recorded under DNP SENS conditions evidencing the presence of highly disordered −NH3+ environments in a Cs2ZrCl6 NC sample. (d) Schematic of an oleate-capped Cs2ZrCl6 NC.
Figure 3Optical characterization of Cs2ZrX6 NC thin films. (a) Blue curves represent UV-Vis absorption and PL spectrum (excitation: 250 nm) of encapsulated Cs2ZrCl6 NC thin film. Green curves represent UV-Vis absorption, PLE (dotted line; emission: 519 nm) and PL spectrum (excitation: 300 nm) of encapsulated Cs2ZrBr6 NC thin film. The black curve represents PL spectrum (excitation: 250 nm) of encapsulated, mixed Cs2ZrCl6 and Cs2ZrBr6 NC thin film. The UV-Vis absorption and PL spectra are normalized to the respective maximum intensity of the scan. The UV-Vis absorption spectrum of the Cs2ZrBr6 NC thin film shows a broad background that we attribute to scattering. (b, c) Photographs of emission from a Cs2ZrCl6 NC thin film (panel (b)) and a Cs2ZrBr6 NC thin film (panel (c)) on fused silica substrates, respectively, irradiated with 254 nm light from a UV lamp. The PL arises from the NC thin films.
Figure 4Electronic structure and optical property calculations within DFT-HSE on Cs2ZrCl6. (a) Calculated band structure for Cs2ZrCl6, showing the indirect 5.06 eV fundamental band gap (Γ–X) and the direct band gap at 5.08 eV (Γ–Γ). The valence and conduction bands are marked in blue and orange, respectively. The VBM is set to 0 eV. (b) Calculated absorption coefficient spectrum of Cs2ZrCl6. (c) Total and partial DOS of Cs2ZrCl6. For reasons of clarity, the legend omits labels for individual elements and corresponding orbitals that provide only minor contributions to the DOS in the regions around valence and conduction bands. (d) XPS valence band spectrum of a Cs2ZrCl6 NC sample (orange dots), shifted by ∼4.5 eV toward lower binding energies, in comparison to the photoionization cross-section weighted DOS broadened by a convolution of Gaussian and Lorentzian curves of suitable width (black curve).