| Literature DB >> 33304225 |
Basab Chattopadhyay1, Aldritt S Madathiparambil1, Fredrik K Mürer1, Pierre Cerasi2, Yuriy Chushkin3, Federico Zontone3, Alain Gibaud4, Dag W Breiby1,5.
Abstract
Despite the abundance of shales in the Earth's crust and their industrial and environmental importance, their microscale physical properties are poorly understood, owing to the presence of many structurally related mineral phases and a porous network structure spanning several length scales. Here, the use of coherent X-ray diffraction imaging (CXDI) to study the internal structure of microscopic shale fragments is demonstrated. Simultaneous wide-angle X-ray diffraction (WAXD) measurement facilitated the study of the mineralogy of the shale microparticles. It was possible to identify pyrite nanocrystals as inclusions in the quartz-clay matrix and the volume of closed unconnected pores was estimated. The combined CXDI-WAXD analysis enabled the establishment of a correlation between sample morphology and crystallite shape and size. The results highlight the potential of the combined CXDI-WAXD approach as an upcoming imaging modality for 3D nanoscale studies of shales and other geological formations via serial measurements of microscopic fragments. © Basab Chattopadhyay et al. 2020.Entities:
Keywords: 3D morphology; coherent X-ray diffraction imaging; mineralogy; shales; wide-angle X-ray diffraction
Year: 2020 PMID: 33304225 PMCID: PMC7710485 DOI: 10.1107/S1600576720013850
Source DB: PubMed Journal: J Appl Crystallogr ISSN: 0021-8898 Impact factor: 3.304
Figure 1The experimental setup for simultaneous CXDI–WAXD measurements.
Figure 2Electron-density cross sections through samples 1–3, highlighting the high-density regions and closed pores. Numerous larger pores connected to the particle exterior are easily seen.
Figure 33D iso-surface renderings of samples 1–3 with the high-density inclusions (only visible in sample 1) and 3D closed pores shown.
Figure 4(a)–(c) Polar maps of diffraction data with the diffracted intensity plotted as a function of the 2θ angle (radius) and the sample rotation angle ω for samples 1, 2 and 3, respectively. (d)–(f) Corresponding 1D diffraction data obtained by integrating over ω. (g)–(i) 3D iso-surface renderings of the CXDI reconstruction for samples 1, 2 and 3, respectively.