| Literature DB >> 33287431 |
Tarek M Abdel-Fattah1, J Derek Loftis1,2.
Abstract
Research advances in electropolishing, with respect to the field of metalworking, have afforded significant improvements in the surface roughness and conductivity properties of aluminum polished surfaces in ways that machine polishing and simple chemical polishing cannot. The effects of a deep eutectic medium as an acid-free electrolyte were tested to determine the potential energy thresholds during electropolishing treatments based upon temperature, experiment duration, current, and voltage. Using voltammetry and chronoamperometry tests during electropolishing to supplement representative recordings via atomic force microscopy (AFM), surface morphology comparisons were performed regarding the electropolishing efficiency of phosphoric acid and acid-free ionic liquid treatments for aluminum. This eco-friendly solution produced polished surfaces superior to those surfaces treated with industry standard acid electrochemistry treatments of 1 M phosphoric acid. The roughness average of the as-received sample became 6.11 times smoother, improving from 159 nm to 26 nm when electropolished with the deep eutectic solvent. This result was accompanied by a mass loss of 0.039 g and a 7.2 µm change in step height along the edge of the electropolishing interface, whereas the acid treatment resulted in a slight improvement in surface roughness, becoming 1.63 times smoother with an average post-electropolishing roughness of 97.7 nm, yielding a mass loss of 0.0458 g and a step height of 8.1 µm.Entities:
Keywords: Keywords: ionic liquid, electrochemical polishing, choline chloride, phosphoric acid, surface characterization, atomic force microscopy
Mesh:
Substances:
Year: 2020 PMID: 33287431 PMCID: PMC7730155 DOI: 10.3390/molecules25235712
Source DB: PubMed Journal: Molecules ISSN: 1420-3049 Impact factor: 4.411
Figure 1Schematic conceptualization of anodic leveling of aluminum surfaces via atomic force microscopy (AFM) at different phases of the study: (A) before electropolishing, and (B) after electropolishing treatments with the ionic liquid, with representative 2D surface profiles depicted (C) before, (D) during, and (E) after experiments.
Figure 2Linear sweep voltammograms (A) for both polishing agents with aluminum samples stepped from 0 to 4 V at a constant scan rate of 20 mVs−1. The dashed line indicates the ideal voltage utilized for chronoamperometry. (B) Chronoamperometry for phosphoric acid (3.51 A/cm2) and the ionic liquid eutectic (1.08 A/cm2) with high-purity aluminum samples.
Average electropolishing rate (µg/s) calculations for each electrolyte for each metal sample over a 900 s treatment.
| Medium | Mass Before (g) | Mass After (g) | Mass Differential (g) | Surface Degradation Rate (µg/s) |
|---|---|---|---|---|
| Deep Eutectic | 5.83 | 5.79 | 0.039 | 43.77 |
| Phosphoric Acid | 5.85 | 5.80 | 0.045 | 50.88 |
Roughness average (Ra) in nm for each metal post and prior to treatment with the respective solutions noted at 70 °C for 900 s. Calculated differences determined % smoothing efficiency (SE) for each sample.
| Medium | Ra Before (nm) | Ra After (nm) | Ra Difference (nm) | % Ra SE * |
|---|---|---|---|---|
| Deep Eutectic Solvent | 159.3 | 26.6 | 132.6 | 83.2 |
| Phosphoric Acid | 159.1 | 97.7 | 61.3 | 38.5 |
* All Smoothing Efficiency measurements reported as a %.
Figure 3Atomic force microscopy of aluminum post-electropolishing with the ionic liquid in both (A) two and (B) three dimensions—recording an average roughness of 26 ± 2 nm by utilizing the root mean square method for calculation. A 10 × 10 µm recording region was utilized.
Average recorded step heights in µm for each metal after treatment with the respective electrolytes at 70 °C for 900 s.
| Medium | Step Height (µm) |
|---|---|
| Deep Eutectic Solvent | 7.2 |
| Phosphoric Acid | 8.1 |
Figure 4Atomic force microscopy of aluminum post-electropolishing with phosphoric acid in (A) 2D and (B) 3D—recording an average roughness of 97 ± 6 nm by utilizing the root mean square method for calculation. A 10 × 10 µm recording region was utilized.
Figure 5AFM console window view of aluminum samples electropolished with (A) an ionic liquid and (B) 1 M phosphoric acid, both on a 20 µm scale.