| Literature DB >> 33286843 |
Ningning Liang1, Xiang Wang1, Yang Cao1, Yusheng Li1, Yuntian Zhu1,2, Yonghao Zhao1.
Abstract
The surface nano-crystallization of Ni2FeCoMo0.5V0.2 medium-entropy alloy was realized by rotationally accelerated shot peening (RASP). The average grain size at the surface layer is ~37 nm, and the nano-grained layer is as thin as ~20 μm. Transmission electron microscopy analysis revealed that deformation twinning and dislocation activities are responsible for the effective grain refinement of the high-entropy alloy. In order to reveal the effectiveness of surface nano-crystallization on the Ni2FeCoMo0.5V0.2 medium-entropy alloy, a common model material, Ni, is used as a reference. Under the same shot peening condition, the surface layer of Ni could only be refined to an average grain size of ~234 nm. An ultrafine grained surface layer is less effective in absorbing strain energy than a nano-grain layer. Thus, grain refinement could be realized at a depth up to 70 μm in the Ni sample.Entities:
Keywords: deformation twinning; dislocation slip; medium entropy alloy; shot peening; surface nano-crystallization
Year: 2020 PMID: 33286843 PMCID: PMC7597164 DOI: 10.3390/e22101074
Source DB: PubMed Journal: Entropy (Basel) ISSN: 1099-4300 Impact factor: 2.524
Figure 1Electron backscattering diffraction (EBSD) maps of annealed sample materials: (a) inverse pole figure (IPF) map of Ni2FeCoMo0.5V0.2 MEA, (b) twin boundaries in Ni2FeCoMo0.5V0.2 MEA, (c) IPF map of CP-Ni, and (d) twin boundaries in CP-Ni.
Figure 2EBSD maps showing gradient microstructures at the depth range between ~20 μm and ~300 μm from the surfaces: (a-1–a-4) IPF map of RASP-MEA, (b-1–b-4) channeling contrast map of RASP-MEA, (c-1–c-4) IPF map of RASP-Ni, and (d-1–d-4) channeling contrast map of RASP-Ni.
Figure 3TEM images showing the microstructures at the surfaces of (a) the RASP-MEA sample and (b) the RASP-Ni sample (SAED patterns are provided as inserts). Charts showing grain size distributions at the surface regions of (c) the RASP-MEA sample and (d) the RASP-Ni sample.
Figure 4TEM images showing typical microstructures at the depth of ~300 μm from the surfaces of (a,b) RASP-MEA and (c,d) RASP-Ni (SAED patterns are provided as inserts).
Figure 5A TEM image showing deformation twins at the depth of 20–40 μm below the surface of RASP-MEA.