| Literature DB >> 33267164 |
Antonio Dávalos1, Meryem Jabloun1, Philippe Ravier1, Olivier Buttelli1.
Abstract
Permutation Entropy (PE) and Multiscale Permutation Entropy (MPE) have been extensively used in the analysis of time series searching for regularities. Although PE has been explored and characterized, there is still a lack of theoretical background regarding MPE. Therefore, we expand the available MPE theory by developing an explicit expression for the estimator's variance as a function of time scale and ordinal pattern distribution. We derived the MPE Cramér-Rao Lower Bound (CRLB) to test the efficiency of our theoretical result. We also tested our formulation against MPE variance measurements from simulated surrogate signals. We found the MPE variance symmetric around the point of equally probable patterns, showing clear maxima and minima. This implies that the MPE variance is directly linked to the MPE measurement itself, and there is a region where the variance is maximum. This effect arises directly from the pattern distribution, and it is unrelated to the time scale or the signal length. The MPE variance also increases linearly with time scale, except when the MPE measurement is close to its maximum, where the variance presents quadratic growth. The expression approaches the CRLB asymptotically, with fast convergence. The theoretical variance is close to the results from simulations, and appears consistently below the actual measurements. By knowing the MPE variance, it is possible to have a clear precision criterion for statistical comparison in real-life applications.Entities:
Keywords: Cramér–Rao Lower Bound; Multiscale Permutation Entropy; estimator variance; finite-length signals; ordinal patterns
Year: 2019 PMID: 33267164 PMCID: PMC7514939 DOI: 10.3390/e21050450
Source DB: PubMed Journal: Entropy (Basel) ISSN: 1099-4300 Impact factor: 2.524
Figure 1All possible patterns for embedded dimension , from a three-point sequence . The patterns represented, from left to right, are , , , , , and . The difference in amplitude between data points does not affect the pattern, as long as the order is preserved.
Figure 2Simulated paths for MPE testing, where p is the probability of for dimension . The graph shows sample paths for , ,
Figure 3for embedded dimension from theory (dotted lines) and simulations (solid lines). (a) vs. pattern probability p for different normalized scales . (b) vs. for different values of p. (c) vs. at , which corresponds to maximum entropy. (d) vs. at with small p, which approaches minimum entropy.