| Literature DB >> 33260847 |
Yuqing Sun1,2,3,4, Gaolei Xu4,5, Xue Feng3, Lijun Peng1,3, Guojie Huang1,3, Haofeng Xie1,3, Xujun Mi1,3, Xinhua Liu2,6,7.
Abstract
Cu-Cr-based alloys exhibit excellent electrical conductivity and strength, but their poor thermal stability limits their application in industry. In this paper, Cu-0.2Cr (at. %) and Cu-0.2Cr-0.12Ag (at. %) alloys were prepared to study the effect of Ag on the properties, microstructure, and thermal stability of the Cu-Cr alloy. Microstructure and precipitation were observed by an optical microscope (OM) and a transmission-electron microscope (TEM). After cold-drawing by 99.9% and aging at 450 °C for 2 h, the peak hardness and electric conductivity of the Cu-Cr alloy were 120.3 HV and 99.5% IACS, respectively, and those of the Cu-Cr-Ag alloy were 135.8 HV and 98.3% IACS, respectively. The softening temperature of the Cu-Cr alloy was 500~525 °C, and that of the Cu-Cr-Ag alloy was about 550 °C. The creep strains of the Cu-Cr and Cu-Cr-Ag alloys at 40 MPa and 400 ℃ for 50 h were 0.18% and 0.05%, respectively. Ag elements improved the thermal stability of the Cu-Cr alloy. Recovery and recrystallization occurred before the coarsening of precipitates during the softening process. Ag atoms mainly improved the softening resistance of the alloy by delaying recrystallization, and mainly increased creep resistance by preventing the increase in mobile-dislocation density.Entities:
Keywords: Cu–Cr system alloy; aging process; microstructure; physical properties; thermal stability
Year: 2020 PMID: 33260847 PMCID: PMC7730119 DOI: 10.3390/ma13235386
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Chemical compositions of studied alloys.
| Nominal Composition (at. %) | Analyzed Composition (at. %) | ||
|---|---|---|---|
| Cr | Ag | Cu | |
| Cu–0.2Cr | 0.2 | / | Bal. |
| Cu–0.2Cr–0.12Ag | 0.2 | 0.12 | Bal. |
Figure 1(a) Hardness and (b) electrical conductivity of alloys at 450 °C.
Figure 2Hardness of test alloys at different annealing temperature levels for 1 h.
Figure 3Creep curves of alloys at (a) 400 and (b) 500 °C under 40 MPa stress.
Figure 4Morphologies and selected-area electron-diffraction (SAED) pattern of peak-aged alloys. (a,b) Bright-field image of Cu–Cr alloy with zone axis of (001)Cu; (c) SAED pattern of (b); (d) schematic diagram of (c); (e,f) bright-field image of Cu–Cr alloy with zone axis of (001)Cu.
Figure 5Microstructures of (a–d) Cu–Cr and (e–h) Cu–Cr–Ag alloys annealed at different temperature levels for 1 h.
Figure 6Microstructures of both alloys after holding for 1 h at different annealing temperature levels. Bright-field images of (a–d) Cu–Cr and (e–h) Cu–Cr–Ag alloys.
Figure 7Microstructures of alloys after creep test at 500 °C. Bright-field images of (a–d) Cu–Cr and (e–h) Cu–Cr–Ag alloys.