Deformation-Induced Chemical Inhomogeneity and Short-Circuit Diffusion in Shear Bands of a Bulk Metallic Glass.

The compositional changes in shear bands of a Cu_{50}Zr_{50} metallic glass after plastic deformation at room temperature have been monitored by atom probe tomography. Across the width of the shear bands an asymmetry of the enriched and depleted zones of the constituent elements is observed, while no change of the composition within the surrounding matrix occurs. The diffusion coefficients determined from the concentration profiles are orders of magnitude larger than the values of bulk diffusion at room temperature. The asymmetric concentration profiles of the constituent elements (Cu and Zr) remain stable during annealing at a temperature of 543 K, even though fast and preferential diffusion of a Ni tracer has been found along the shear band at the same temperature. The results indicate that the atomic structure and stress distribution within the shear bands is altered from that of the surrounding amorphous matrix. The fact that the shear band structure is unaltered at elevated temperatures and that fast diffusion occurs preferentially within the shear bands leads to the conclusion that they are structurally stable.