Literature DB >> 33258164

Ultrathin Two-Dimensional Nanostructures: Surface Defects for Morphology-Driven Enhanced Semiconductor SERS.

Ge Song1, Wenbin Gong2, Shan Cong2, Zhi-Gang Zhao3.   

Abstract

Two-dimensional (2D) semiconductors have recently become attractive candidate substrates for surface-enhanced Raman spectroscopy, exhibiting good semiconductor-based SERS sensing for a wider variety of application scenarios. However, the underlying mechanism remains unclear. Here, we propose that surface defects play a vital role in the magnification of the SERS performances of 2D semiconductors. As a prototype material, ultrathin WO 3 nanosheets is used to demonstrate that surface defect sites and resulting increased charge-carrier density can induce strong charge-transfer interactions at the substrate-molecule interface, thereby improving the sensitivity of the SERS substrate by 100 times with high reproducibility. Further work with other metal oxides suggests the reduced dimension of 2D materials can be advantageous in promoting SERS sensing for multiple probe molecules.
© 2020 Wiley-VCH GmbH.

Entities:  

Keywords:  2D materials; charge-transfer efficiency; semiconductor SERS; surface defect; ultrathin nanosheets

Year:  2020        PMID: 33258164     DOI: 10.1002/anie.202015306

Source DB:  PubMed          Journal:  Angew Chem Int Ed Engl        ISSN: 1433-7851            Impact factor:   15.336


  4 in total

1.  Understanding of chiral site-dependent enantioselective identification on a plasmon-free semiconductor based SERS substrate.

Authors:  Jing Xu; Yuanfei Xue; Xiaoxia Jian; Yue Zhao; Zhenqing Dai; Jingwen Xu; Zhida Gao; Ye Mei; Yan-Yan Song
Journal:  Chem Sci       Date:  2022-05-11       Impact factor: 9.969

2.  Single-atom sites on perovskite chips for record-high sensitivity and quantification in SERS.

Authors:  Ran Feng; Qing Miao; Xiang Zhang; Peixin Cui; Cong Wang; Yibo Feng; Liyong Gan; Jiaxing Fu; Shibo Wang; Ziyi Dai; Liming Hu; Yunjing Luo; Weihai Sun; Xiaoxian Zhang; Jiawen Xiao; Jinbo Wu; Bingpu Zhou; Mingqiang Zou; Dawei He; Xiaoyuan Zhou; Xiaodong Han
Journal:  Sci China Mater       Date:  2022-03-02       Impact factor: 8.640

Review 3.  Defect engineering in semiconductor-based SERS.

Authors:  Ge Song; Shan Cong; Zhigang Zhao
Journal:  Chem Sci       Date:  2021-12-01       Impact factor: 9.825

4.  Defect-Rich Monolayer MoS2 as a Universally Enhanced Substrate for Surface-Enhanced Raman Scattering.

Authors:  Shiyu Sun; Jingying Zheng; Ruihao Sun; Dan Wang; Guanliang Sun; Xingshuang Zhang; Hongyu Gong; Yong Li; Meng Gao; Dongwei Li; Guanchen Xu; Xiu Liang
Journal:  Nanomaterials (Basel)       Date:  2022-03-08       Impact factor: 5.076

  4 in total

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