Literature DB >> 33170694

Holistic Approach to the Mechanism Study of Thermal Degradation of Organic Light-Emitting Diode Materials.

Jin Woo Kim1, Joonghyuk Kim2, Jaewook Kim1, Jun Chwae2, Sungwoo Kang1, Soon Ok Jeon2, Won-Joon Son2, Hyeonho Choi2, Byoungki Choi2, Sunghan Kim2, Woo Youn Kim1.   

Abstract

The design of stable organic light-emitting diode materials is the key to long lifetime displays under various stressful conditions. Elucidating the degradation mechanism of the materials at the molecular level provides useful information for securing high stability. Previous works based on experiments or computations disclosed only a part of the whole degradation process. Here, we propose a holistic approach to the systematic analysis of the degradation mechanism by combining experimental mass analysis and computation in a semi-automated fashion. The mass analysis identifies molecular weights of feasible products from degradation reactions. Then, the computational analysis goes through initiation, propagation, and termination phases. The initiation phase determines radical fragments and reactive sites, triggering the propagation process. In the propagation phase, we subsequently perform intermediate sampling, reaction network construction, and kinetic analysis. As a proof of concept, this approach was applied to the thermal degradation problem during the sublimation purification process. Two major pathways were successfully elucidated with full atomistic details.

Year:  2020        PMID: 33170694     DOI: 10.1021/acs.jpca.0c07766

Source DB:  PubMed          Journal:  J Phys Chem A        ISSN: 1089-5639            Impact factor:   2.781


  1 in total

1.  Identification of OLED Degradation Scenarios by Kinetic Monte Carlo Simulations of Lifetime Experiments.

Authors:  Christoph Hauenstein; Stefano Gottardi; Engin Torun; Reinder Coehoorn; Harm van Eersel
Journal:  Front Chem       Date:  2022-01-27       Impact factor: 5.221

  1 in total

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