Ion Beam Analysis of Proton-Induced X-ray Emission (PIXE) Techniques for Elemental Investigation of Young Stage Neem Leaf of Southern India, Tamil Nadu.

Young stage neem leaf (Azadirachta indica) was collected at Thiruvallur district in Tamil Nadu, South India. Multi-elemental analysis of neem leaf was carried out using non-destructive techniques (NDT) of proton-induced X-ray emission (PIXE, 2.5 MeV) which is one of the well-known surface chemical sophisticated analytical methods of ion beam analyses (IBA). From the emitted X-ray output of the target specimen specimen fingerprint multi-elements such as, aluminium (Al), silicon (Si), phosphorus (P), sulphur (S), chloride (Cl), potassium (K), calcium (Ca), titanium (Ti), manganese (Mn), iron (Fe), copper (Cu), zinc (Zn) and strontium (Sr) are found to be present in the leaf in different ppm levels. Among the elements, silicon (Si, 42034 + 1198.0 ppm) and potassium (K, 28985 + 747.8 ppm) showed the highest concentration. Minor elements (Mn, Sr, Fe, Zn, Cu and Ti) are observed in the neem plant. The variation in elemental concentration in the leaf may be due to soil, water, etc. However, there are no toxic elements observed like arsenic and lead in the leaf. Further, though the presence of different medicinal values in the target specimen chemical multi-elements observed in ppm level. However, there are more chemical analysis to be required for the functionalization of active biomedical applications for these kinds of medicinal species.