| Literature DB >> 32939960 |
Jian Tang1,2, Zheng Wei1,2, Qinqin Wang1,2, Yu Wang1,2, Bo Han3, Xiaomei Li1,2,3, Biying Huang1,2, Mengzhou Liao1, Jieying Liu1,2, Na Li1,2,4, Yanchong Zhao1,2, Cheng Shen1,2, Yutuo Guo1,2, Xuedong Bai1,2, Peng Gao3, Wei Yang1,2,4,5, Lan Chen1,2,4, Kehui Wu1,2,4, Rong Yang1,4,5, Dongxia Shi1,2,5, Guangyu Zhang1,2,4,5.
Abstract
In 2D semiconductors, doping offers an effective approach to modulate their optical and electronic properties. Here, an in situ doping of oxygen atoms in monolayer molybdenum disulfide (MoS2 ) is reported during the chemical vapor deposition process. Oxygen concentrations up to 20-25% can be reliable achieved in these doped monolayers, MoS2- x Ox . These oxygen dopants are in a form of substitution of sulfur atoms in the MoS2 lattice and can reduce the bandgap of intrinsic MoS2 without introducing in-gap states as confirmed by photoluminescence spectroscopy and scanning tunneling spectroscopy. Field effect transistors made of monolayer MoS2- x Ox show enhanced electrical performances, such as high field-effect mobility (≈100 cm2 V-1 s-1 ) and inverter gain, ultrahigh devices' on/off ratio (>109 ) and small subthreshold swing value (≈80 mV dec-1 ). This in situ oxygen doping technique holds great promise on developing advanced electronics based on 2D semiconductors.Entities:
Keywords: 2D electronics; MoS2; bandgap engineering; substitutional doping
Year: 2020 PMID: 32939960 DOI: 10.1002/smll.202004276
Source DB: PubMed Journal: Small ISSN: 1613-6810 Impact factor: 13.281