| Literature DB >> 32715191 |
Rumana Hossain1, Veena Sahajwalla1.
Abstract
This study aims to establish a novel pathway for transforming complex electronic waste into advanced hybrid materiEntities:
Year: 2020 PMID: 32715191 PMCID: PMC7376687 DOI: 10.1021/acsomega.0c00485
Source DB: PubMed Journal: ACS Omega ISSN: 2470-1343
ICP–OES Analysis of the Elemental Composition of the Metallic Components of PCBs
| element | Cu | Sn | Zn | Fe | Ni | Pb | Ti | Al | total metal |
|---|---|---|---|---|---|---|---|---|---|
| wt % | 24.6 ± 0.2 | 4.4 ± 0.2 | 1.3 ± 0.1 | 3.3 ± 0.1 | 0.4 | 0.4 | 0.2 | 2.0 | 36.6 ± 0.7 |
XRF Analysis of the Chemical Composition of PCBs and Glass Fraction of Computer Monitors
| oxides wt % | PCB plastic | oxides wt % | monitor glass |
|---|---|---|---|
| SiO2 | 36.8 ± 0.1 | SiO2 | 68.3 ± 0.5 |
| CuO | 16.2 ± 0.1 | Na2O | 11.9 ± 0.1 |
| CaO | 12.7 ± 0.1 | CaO | 7.8 ± 0.1 |
| Al2O3 | 11.4 ± 0.1 | MgO | 3.5 |
| SnO2 | 4.3 ± 0.1 | SO3 | 3.9 |
| MgO | 0.7 | Al2O3 | 2.8 |
| P2O5 | 0.2 | Fe2O3 | 0.1 |
Figure 1(a) FTIR spectra and (b) high-resolution XPS spectra of the carbon region of the plastic shell of the computer monitor.
Figure 3XPS spectra for the SiC–Cu hybrid layer and (a) survey scan of (b) Si 2p, (c) Cu 2p3, (d) C 1s, (e) O 1s, (f) A 2p, and (g) N 1s.
Elemental Compositions on the Hybrid Layer Estimated by XPS
| element | binding energy (eV) | photoelectron line | possible compounds/elements | references |
|---|---|---|---|---|
| Al | 74.93 | 2p | Al2O3 | ( |
| C | 283.4 | 1s | SiC | ( |
| C | 285.78 | 1s | C–C, SiC | ( |
| C | 282.90 | 1s | SiC | ( |
| C | 286.79 | 1s | C–O | ( |
| N | 398.9 | 1s | pyridinic N | ( |
| N | 397.86 | 1s | Si3N4 | ( |
| O | 531.7 | 1s | Al2O3 | ( |
| O | 533.7 | 1s | Si–O–C | ( |
| Si | 100.98 | 2p | SiC, Si3N4 | ( |
| Si | 102.97 | 2p | Si–O–C, Si–N | ( |
| Cu | 932.66 | 2p3 | copper | ( |
| Cu | 934.31 | 2p3 | CuO | ( |
| Cu | 939.96 | 2p3 | copper | ( |
| Cu | 943.72 | 2p3 | CuO | ( |
Figure 4(a) FE SEM image, (b) TEM image, and (c) HR TEM image of the SiC nanowires derived after first-step heat treatment. (d) TEM image of the hybrid surface layer with the SAED pattern derived after second-step heat treatment. (e) Bright-field TEM image of the layer showing SiC nanowires in the Cu matrix, and (f) corresponding dark-field image of Figure e.
Figure 2XRD of (a) SiC nanowires derived from the glass and plastic e-waste and (b) Cu–SiC hybrid layer derived from e-waste. (β-SiC reference code: 03-065-0360, Cu reference code: 04-016-6874).
Figure 5TEM EDS elemental mapping of the hybrid layer and substrate.
Figure 6(a) Top view of ion-induced secondary electron images of an array of indents, (b) indent in the hybrid layer at a maximum load of 500 mN, (c) cross-sectional view of the ion-induced SE image of 500 mN indent, and (d) series of the TEM image indicating cross-sections of 500 mN. The green arrow indicates the SiC–Cu-based hybrid layer, and the yellow arrow shows the base steel.
Figure 7(a) Nanoindentation load–displacement curve and (b) corresponding nanohardness and elastic modulus of the hybrid layer, steel substrate, and pure Cu.
Figure 8Schematic of the formation of the SiC nanowire by thermal transformation and the formation of Cu-reinforced SiC hybrid layer on the steel substrate.