Literature DB >> 32684883

Equatorial aberration of powder diffraction data collected with an Si strip X-ray detector by a continuous-scan integration method.

Takashi Ida1.   

Abstract

Exact and approximate mathematical formulas of equatorial aberration for powder diffraction data collected with an Si strip X-ray detector in continuous-scan integration mode are presented. An approximate formula is applied to treat the experimental data measured with a commercial powder diffractometer. © International Union of Crystallography 2020.

Keywords:  Bragg–Brentano geometry; Si strip detectors; equatorial aberration; instrumental function; powder diffraction

Year:  2020        PMID： 32684883      PMCID： PMC7312143          DOI： 10.1107/S1600576720005130

Source DB:  PubMed          Journal:  J Appl Crystallogr        ISSN： 0021-8898            Impact factor:   3.304


  3 in total

1.  Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers.

Authors:  R W Cheary; A A Coelho; J P Cline
Journal:  J Res Natl Inst Stand Technol       Date:  2004-02-01

2.  X-Ray Spectrometry of Copper: New Results on an Old Subject.

Authors:  M Deutsch; E Förster; G Hölzer; J Härtwig; K Hämäläinen; C-C Kao; S Huotari; R Diamant
Journal:  J Res Natl Inst Stand Technol       Date:  2004-02-01

3.  An Implementation of the Fundamental Parameters Approach for Analysis of X-ray Powder Diffraction Line Profiles.

Authors:  Marcus H Mendenhall; Katharine Mullen; James P Cline
Journal:  J Res Natl Inst Stand Technol       Date:  2015-10-21
  3 in total

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