Literature DB >> 32684877

X-ray pulse stretching after diffraction.

Jaromír Hrdý1.   

Abstract

The development of ultrashort X-ray pulse sources requires optics that keep the pulse length as short as possible. One source of pulse stretching is the penetration of the pulse into a crystal during diffraction. Another source is the inclination of the intensity front when the diffraction is asymmetric. The theory of short X-ray pulse diffraction has been well developed by many authors. As it is rather complicated, it is sometimes difficult to foresee the pulse behavior (mainly stretching) during diffraction in various crystal arrangements. In this article, a simple model is suggested that gives a qualitatively similar shape to the diffracted pulse which follows from exact theory. It allows proposal of what experimental arrangement is optimal to minimize the pulse stretching during diffraction. First, the effect of pulse stretching due to penetration into a crystal surface is studied. On the basis of this, the pulse profile change during diffraction by two crystals, either symmetric or asymmetric, is predicted. © International Union of Crystallography 2020.

Entities:  

Keywords:  X-ray pulse diffraction; X-ray pulse stretching; short X-ray pulses

Year:  2020        PMID: 32684877      PMCID: PMC7312147          DOI: 10.1107/S1600576720003714

Source DB:  PubMed          Journal:  J Appl Crystallogr        ISSN: 0021-8898            Impact factor:   3.304


  4 in total

1.  Short X-ray pulses in a Laue-case crystal.

Authors:  Walter Graeff
Journal:  J Synchrotron Radiat       Date:  2002-02-28       Impact factor: 2.616

2.  Diffraction of short X-ray pulses in the general asymmetric Laue case - an analytic treatment.

Authors:  C Malgrange; W Graeff
Journal:  J Synchrotron Radiat       Date:  2003-04-25       Impact factor: 2.616

3.  Short X-ray pulses from third-generation light sources.

Authors:  A G Stepanov; C P Hauri
Journal:  J Synchrotron Radiat       Date:  2016-01-01       Impact factor: 2.616

4.  Ultra-high-resolution inelastic X-ray scattering at high-repetition-rate self-seeded X-ray free-electron lasers.

Authors:  Oleg Chubar; Gianluca Geloni; Vitali Kocharyan; Anders Madsen; Evgeni Saldin; Svitozar Serkez; Yuri Shvyd'ko; John Sutter
Journal:  J Synchrotron Radiat       Date:  2016-02-12       Impact factor: 2.616

  4 in total

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