| Literature DB >> 32650815 |
A Fogliata1, E Esposito2, L Paganini2, G Reggiori2, S Tomatis2, M Scorsetti2,3, L Cozzi2,3.
Abstract
BACKGROUND: Many dose calculation algorithms for radiotherapy planning need to be configured for each clinical beam using pre-defined measurements. An optimization process adjusts the physical parameters able to estimate the energy released in the medium in any geometrical condition. This work investigates the impact of measured input data quality on the configuration of the type "c" Acuros-XB dose calculation algorithm in the Eclipse (Varian Medical Systems) treatment planning system.Entities:
Mesh:
Year: 2020 PMID: 32650815 PMCID: PMC7350585 DOI: 10.1186/s13014-020-01610-7
Source DB: PubMed Journal: Radiat Oncol ISSN: 1748-717X Impact factor: 3.481
Fig. 1Spectrum after the target, mean radial energy and intensity profile for the 6X (left column) and 6FFF (right column) beams in the different algorithm configurations
Configuration parameters
| 6X | Mean energy [MeV] | Mean energy [MeV] | Size of second source [mm] | Relative intensity of second source [%] | Mean energy of second source [MeV] | e-cont σ0 at SAD [mm] | e-cont σ1 at SAD [mm] | Relative fraction σ0 |
|---|---|---|---|---|---|---|---|---|
| Ref | 1.288 | 1.814 | 33.6 | 4.4 | 0.951 | 7.930 | 110.8 | 0.363 |
| MLS | 1.495 | 1.664 | 36.9 | 4.4 | 0.810 | 1.001 | 116.8 | 0.332 |
| Diag_MLS | 1.341 | 1.770 | 35.4 | 4.8 | 0.941 | 8.856 | 105.1 | 0.315 |
| Prof_MLS | 1.288 | 1.804 | 35.1 | 4.6 | 0.893 | 8.037 | 103.1 | 0.325 |
| Pdd_MLS | 1.508 | 1.704 | 37.1 | 3.9 | 0.828 | 10.22 | 119.3 | 0.245 |
| DiagSSD70 | 1.331 | 1.794 | 30.6 | 4.2 | 1.028 | 8.712 | 106.1 | 0.321 |
| PDD + 3 mm | 1.207 | 1.844 | 33.9 | 4.1 | 0.979 | 350.0 | 500.0 | 0.005 |
| PDD_centreIC | 1.272 | 1.821 | 31.9 | 4.2 | 1.006 | 80.60 | 116.4 | 0.314 |
| PDD-3 mm | 1.313 | 1.817 | 34.3 | 4.6 | 0.972 | 1.018 | 128.6 | 0.697 |
| PinPoint | 1.229 | 1.820 | 30.9 | 3.1 | 0.760 | 1.001 | 97.4 | 0.354 |
| DiodeP | 0.996 | 1.858 | 40.0 | 5.3 | 1.066 | 14.68 | 103.5 | 0.240 |
| microDiamond | 1.235 | 1.815 | 35.9 | 4.6 | 1.002 | 13.30 | 107.3 | 0.179 |
| RBD | 1.223 | 1.815 | 30.2 | 4.6 | 1.167 | 1.001 | 95.8 | 0.334 |
| 6FFF | Mean energy [MeV] (after target) | Mean energy [MeV] (on cax, after FF*) | Size of second source [mm] | Relative intensity of second source [%] | Mean energy of second source [MeV] | e-cont σ0 at SAD [mm] | e-cont σ1 at SAD [mm] | Relative fraction σ0 |
| Ref | 1.266 | 1.302 | 0.00 | 9.559 | 93.85 | 0.344 | ||
| MLS | 1.502 | 1.200 | 0.00 | 1.004 | 108.4 | 0.540 | ||
| Diag_MLS | 1.306 | 1.273 | 0.00 | 1.002 | 90.0 | 0.487 | ||
| Prof_MLS | 1.303 | 1.306 | 0.00 | 1.002 | 94.8 | 0.494 | ||
| PDD_MLS | 1.433 | 1.267 | 0.00 | 1.003 | 104.4 | 0.450 | ||
| PDD + 3 mm | 1.263 | 1.307 | 0.00 | 349.0 | 498.8 | 0.005 | ||
| PDD-3 mm | 1.268 | 1.291 | 0.00 | 1.004 | 96.02 | 0.714 | ||
| PDD_centreIC | 1.266 | 1.292 | 0.00 | 19.16 | 102.1 | 0.111 | ||
| PinPoint | 1.251 | 1.275 | 0.00 | 1.002 | 86.4 | 0.408 | ||
| RBD | 1.313 | 1.258 | 0.00 | 6.648 | 97.9 | 0.307 |
*FF = flattening filter, or foil, in case of FFF beam
Fig. 2Electron contamination curves and collimator back scatter factors of square fields for the 6X (left column) and 6FFF beams (right column) in the different algorithm configurations
Fig. 3Differences calculated – measured input data for the 6X beam
Fig. 4Differences calculated – measured input data for the 6FFF beam
Mean differences between calculated and input measured data, as percentage relative to the measured point for the PDD after the buildup region (d > 18 mm) and the profiles inside the field (5 mm per side inside the nominal field side rescaled according to the depth). Data represents the average (of the means over all the test points of each curve) on all the conditions of field size and depth, ± the standard deviation, and the range
| 6X | 6FFF | |||
|---|---|---|---|---|
| PDD vs. input | Profiles vs. input | PDD vs. input | Profiles vs. input | |
| Ref | 0.18 ± 0.41 [−0.26,0.90] | 0.07 ± 0.32 [− 0.57, 0.76] | 0.15 ± 0.37 [− 0.21,0.82] | 0.27 ± 0.19 [− 0.16,0.79] |
| MLS | 0.30 ± 0.53 [− 0.43,0.92] | − 0.08 ± 0.85 [−2.93, 1.31] | 1.46 ± 0.47 [0.80,2.21] | 0.13 ± 0.54 [−1.65,0.94] |
| DiagMLS | 0.11 ± 0.43 [− 0.32,0.86] | 0.36 ± 0.42 [− 0.43,1.39] | 0.19 ± 0.36 [− 0.18,0.83] | 0.56 ± 0.52 [− 0.12,1.94] |
| ProfMLS | 0.15 ± 0.40 [− 0.30,0.85] | − 0.29 ± 1.14 [−4.53, 0.91] | 0.28 ± 0.38 [− 0.07,0.96] | −0.12 ± 0.87 [−3.68,0.61] |
| PddMLS | 0.34 ± 0.53 [−0.36,0.96] | − 0.02 ± 0.35 [− 0.96, 0.62] | 1.07 ± 0.45 [0.41,1.76] | 0.26 ± 0.25 [− 0.22,0.79] |
| DiagSSD70 | 0.16 ± 0.44 [− 0.28,0.94] | −0.02 ± 0.39 [− 0.96, 0.69] | ||
| PDD + 3 mm | 0.21 ± 0.46 [− 0.22,0.99] | 0.11 ± 0.30 [−0.56, 0.71] | 0.18 ± 0.51 [− 0.25,1.13] | 0.29 ± 0.20 [− 0.18,0.78] |
| PDD-3 mm | 0.23 ± 0.55 [− 0.30 ± 1.17] | 0.03 ± 0.32 [− 0.62, 0.74] | 0.24 ± 0.59 [− 0.31,1.32] | 0.27 ± 0.20 [− 0.15,0.81] |
| PDD_centerIC | 0.17 ± 0.44 [− 0.24,0.92] | 0.08 ± 0.32 [− 0.56, 0.74] | 0.05 ± 0.43 [− 0.34,0.81] | 0.27 ± 0.19 [− 0.13,0.82] |
| PinPoint | 0.08 ± 0.53 [− 0.61,1.06] | − 0.03 ± 0.43 [− 1.66, 0.65] | 0.27 ± 0.32 [− 0.18,0.68] | 0.70 ± 0.96 [− 0.40,3.96] |
| DiodeP | 0.10 ± 0.40 [− 0.38,0.69] | − 0.05 ± 0.42 [− 1.23, 0.80] | ||
| microDiamond | 0.11 ± 0.33 [− 0.29,0.64] | − 0.12 ± 0.23 [− 0.53,0.39] | ||
| RBD | −0.06 ± 0.44 [− 0.45,0.83] | 0.07 ± 0.36 [− 0.54,0.69] | − 0.10 ± 0.44 [− 0.45,0.80] | 0.40 ± 0.19 [− 0.01,0.83] |
Fig. 5Differences calculated – measured reference data for the 6X beam
Fig. 6Differences calculated – measured reference data for the 6FFF beam
Mean differences between caculated and reference measured data, as percentage relative to the measured point for the PDD after the buildup region (d > 18 mm) and the profiles inside the field (5 mm per side inside the nominal field side rescaled according to the depth). Data represents the average on all the conditions of field size and depth. Data represents the average (of the means over all the test points of each curve) on all the conditions of field size and depth, ± the standard deviation, and the range
| 6X | 6FFF | |||
|---|---|---|---|---|
| PDD vs. reference | Profiles vs. reference | PDD vs. reference | Profiles vs. reference | |
| Ref | 0.18 ± 0.41 [−0.26,0.90] | 0.07 ± 0.32 [− 0.57,0.76] | 0.15 ± 0.37 [− 0.21,0.82] | 0.27 ± 0.19 [− 0.16,0.79] |
| MLS | − 0.10 ± 0.54 [− 0.54,0.86] | 0.53 ± 0.56 [− 0.18,1.85] | 1.11 ± 0.56 [0.57,2.11] | 0.58 ± 0.65 [− 0.64,2.12] |
| DiagMLS | 0.11 ± 0.43 [− 0.32,0.86] | 0.36 ± 0.42 [− 0.43,1.39] | 0.19 ± 0.36 [− 0.18,0.83] | 0.56 ± 0.52 [− 0.12,1.94] |
| ProfMLS | 0.15 ± 0.40 [− 0.30,0.85] | 0.31 ± 0.32 [− 0.29,1.20] | 0.28 ± 0.38 [− 0.07,0.96] | 0.32 ± 0.21 [− 0.07,0.91] |
| PddMLS | −0.06 ± 0.59 [− 0.55,0.98] | −0.02 ± 0.35 [− 0.96,0.62] | 0.72 ± 0.53 [0.24,1.66] | 0.26 ± 0.25 [− 0.22,0.79] |
| DiagSSD70 | 0.16 ± 0.44 [− 0.28,0.94] | −0.02 ± 0.39 [− 0.96,0.69] | ||
| PDD + 3 mm | 0.24 ± 0.37 [−0.22,0.86] | 0.11 ± 0.30 [−0.56,0.71] | 0.16 ± 0.37 [− 0.20,0.83] | 0.29 ± 0.20 [− 0.18,0.78] |
| PDD-3 mm | 0.26 ± 0.45 [− 0.17,1.05] | 0.03 ± 0.32 [− 0.62,0.74] | 0.22 ± 0.45 [− 0.13,1.02] | 0.27 ± 0.20 [− 0.15,0.81] |
| PDD_centerIC | 0.20 ± 0.40 [− 0.26,0.88] | 0.08 ± 0.32 [− 0.56,0.74] | 0.10 ± 0.37 [− 0.26,0.76] | 0.27 ± 0.19 [− 0.13,0.82] |
| PinPoint | 0.13 ± 0.39 [− 0.33,0.81] | 0.06 ± 0.33 [− 0.87,0.69] | −0.09 ± 0.40 [− 0.44,0.62] | −0.01 ± 0.41 [− 1.52,0.49] |
| DiodeP | − 0.05 ± 0.27 [− 0.55,0.26] | 0.10 ± 0.35 [− 0.90,0.52] | ||
| microDiamond | 0.27 ± 0.39 [− 0.17,0.94] | − 0.04 ± 0.35 [− 0.98,0.50] | ||
| RBD | 0.17 ± 0.36 [− 0.25,0.79] | − 0.04 ± 0.44 [− 1.14,0.63] | 0.22 ± 0.41 [− 0.12,0.97] | 0.06 ± 0.33 [− 1.23,0.60] |
Fig. 7Differences calculated – measured reference data at dmax, 1 and 2 mm depth