| Literature DB >> 32541818 |
G D H Wong1,2, W C Law1,2, F N Tan1,2, W L Gan1, C C I Ang1, Z Xu1, C S Seet2, W S Lew3.
Abstract
High temperature studies of spin Hall effect have often been neglected despite its profound significance in real-world devices. In this work, high temperature spin torque ferromagnetic resonance measurement was performed to evaluate the effects of temperature on the Gilbert damping and spin Hall efficiency of PtxCu1-x. When the temperature was varied from 300 K to 407 K, the Gilbert damping was relatively stable with a change of 4% at composition x = 66%. Alloying Pt and Cu improved the spin Hall efficiency of Pt75Cu25/Co/Ta by 29% to a value of 0.31 ± 0.03 at 407 K. However, the critical switching current density is dependent on the ratio between the Gilbert damping and spin Hall efficiency and the smallest value was observed when x = 47%. It was found that at this concentration, the spin transparency was at its highest at 0.85 ± 0.09 hence indicating the importance of interfacial transparency for energy efficient devices at elevated temperature.Entities:
Year: 2020 PMID: 32541818 PMCID: PMC7295739 DOI: 10.1038/s41598-020-66762-8
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1(a) Schematic illustration of high temperature ST-FMR setup. Optical image of the device is as shown in the inset. (b) X-ray diffraction pattern of 80 nm thick PtCu1− samples showing the shift between the Pt(111) to the Cu(111) peak.
Figure 2(a) Measured ST-FMR spectra of Pt60Cu40(5 nm)/Co(5 nm)/Ta(5 nm) trilayer device for frequency from 6 to 15 GHz with nominal input power of 18 dBm. (b) Fitting of Kittel equation. (c,d) ST-FMR Lorentzian fitting of ST-FMR spectra of PtCu1− (5 nm)/Co(5 nm)/Ta(5 nm) trilayer for x = 8% and 61% and a microwave frequency of 9 GHz.
Figure 3(a) Contour plot of for PtCu1− (5 nm)/Co(5 nm)/Ta(5 nm) trilayer device with temperature for varying Pt concentrations. (b) of PtCu1− (5 nm)/Co(5 nm)/Ta(5 nm) for x = 8%, 66% and 100%.
Figure 4(a) Contour plot of for PtCu1− (5 nm)/Co(5 nm)/Ta(5 nm) trilayer device with temperature for varying Pt concentrations. (b) and (c) Temperature dependence of for Cu-rich and Pt-rich PtCu1− (5 nm)/Co(5 nm)/Ta(5 nm) trilayer device with x = 29% and 75% respectively.
Figure 5(a) Contour plot of ratio for PtCu1−(5 nm)/Co(5 nm)/Ta(5 nm) trilayer device with temperature. (b) Damping parameter due to spin pumping of PtCu1−(t nm)/Co(20 nm)/Ru(5 nm) with varying t thickness of Co for x = 20%, 47%, 56% and 70%. (c,d) Alloy composition dependence of spin diffusion length and spin transparency, respectively, for PtCu1−(5 nm)/Co(20 nm)/Ru(5 nm)[44–46].