T Manovah David1, K I Gnanasekar2, Paul Wilson3, Pappu Sagayaraj4, Tom Mathews1. 1. Thin Films and Coatings Section, Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603102, India. 2. Novel Chemical Sensors Section, Materials Chemistry and Metal Fuel Cycle Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603102, India. 3. Department of Chemistry, Madras Christian College (Autonomous), Tambaram, Chennai 600059, India. 4. Department of Physics, Loyola College (Autonomous), Nungambakkam, Chennai 600034, India.
Abstract
Crystal structure, morphological features, and hydrogen-sensing properties of thick film sensors of TiO2 nanotubes (NTs) impregnated with nanoparticles of elements of Group 10, viz., nickel, palladium, and platinum, having average grain size of about 25, 20, and 20 nm, respectively, are presented. The sensitivity is observed to be higher for Pd/TiO2 NTs than for Pt/TiO2 NTs. Ni/TiO2 NTs exhibited very poor sensitivity. X-ray photoelectron spectroscopy (XPS) studies confirm reduction of the oxide layer of palladium nanoparticles, which, in turn, is responsible for the generation of Ti3+ ion in TiO2 NTs through hydrogen spillover. For Pt/TiO2 NTs, only reduction of the oxide layer over Pt nanoparticles takes place without any spillover effect. For Ni/TiO2 NTs, neither NiO nor TiO2 undergoes any reduction. Changes in the Fermi level difference of PdO and TiO2 along with Ti3+ generation synergistically operate for Pd/TiO2 NTs, whereas the difference in Fermi levels of PtO and TiO2 alone operates for Pt/TiO2 NTs during sensing.
Crystal structure, morphological features, and hydrogen-sensing properties of thick film sensors of TiO2 nanotubes (NTs) impregnated with nanoparticles of elements of Group 10, viz., nickel, palladium, and platinum, having average grain size of about 25, 20, and 20 nm, respectively, are presented. The sensitivity is observed to be higher for Pd/TiO2 NTs than for Pt/TiO2 NTs. Ni/TiO2 NTs exhibited very poor sensitivity. X-ray photoelectron spectroscopy (XPS) studies confirm reduction of the oxide layer of palladium nanoparticles, which, in turn, is responsible for the generation of Ti3+ ion in TiO2 NTs through hydrogen spillover. For Pt/TiO2 NTs, only reduction of the oxide layer over Pt nanoparticles takes place without any spillover effect. For Ni/TiO2 NTs, neither NiO nor TiO2 undergoes any reduction. Changes in the Fermi level difference of PdO and TiO2 along with Ti3+ generation synergistically operate for Pd/TiO2 NTs, whereas the difference in Fermi levels of PtO and TiO2 alone operates for Pt/TiO2 NTs during sensing.
Commercially available
hydrogen (H2) sensors operate on different principles:
combustion, pellister type, semiconductor type, electrochemical, fiber
optic, and field-effect transistor, each of which is designed for
a selected purpose.[1−5] Among them,
semiconductor oxide-based sensors are simple, robust, and economically
cheap. Different types of semiconductor oxides have been surveyed
to exploit their surface conductivity for sensing a specific analyte.
SnO2, TiO2, WO3, ZnO, etc., are some
of the semiconductor oxides[6−8] that have been demonstrated for sensing H2. The gas–solid
interaction that leads to changes in electrical conductivity is exploited
in this type of sensors. For sensing trace levels of gases, the probability
of chemical interaction needs to be maximized, which is achieved either
by porous structures or in nanostructured thick/thin films as they
offer high specific surface area with higher probability for interaction
along with a reduction activation energy owing to high surface free
energy of the nanoparticles.[9] The developments
in nanoscience trigger the immediate application in the field of chemical
sensors for trace level detection (ppm and ppb) of a variety of harmful,
pollutant gases for environmental and process control. The wide band
gap semiconductors with variety of donors and acceptors to alter the
carrier concentration are desirable for this purpose. Moreover, the
base semiconductor oxides should not form any irreversible permanent
damage upon interaction with the gaseous species and based on the
above considerations, the following materials, viz., SnO2, In2O3, and TiO2, are shortlisted
and among them TiO2 is chosen (Eg: 3.4 eV) for
our study. Generally, this type of sensor is not selective yet the
kinetics of the specific interaction of the analyte with TiO2 could be made selective by manipulating the temperature. Although,
sensor studies on nanocrystalline TiO2 are already reported,
most of them are centered on the general response to gases without
any specificity to an analyte.First of all, for sensing H2, the strong covalent bond in H2 with the bond
dissociation energy of 436 kJ mol–1 needs to be
broken, which requires a very high temperature.[10] Hence, the first step would be to use an appropriate catalyst
to break this bond at as low a temperature as possible. Elements of
group 10 in the periodic table, viz., Ni, Pd, and Pt, or their alloys
have been known for their catalytic hydrogenation reactions.[11] Their partially filled “d” orbitals
play an important role in the hydrogenation reactions. The literature
shows that H2 gets chemisorbed on these metals and dissociates
into nascent hydrogen (highly reactive), which subsequently spills
over to the neighborhoods to reduce them.[12] To improve the efficiency, nanoparticles of Ni, Pd, and Pt have
been chosen in addition to TiO2 nanotubes (NTs) for this
purpose. Therefore, it is proposed to exploit the catalytic role of
nanocrystalline Ni, Pd, and Pt for gas-sensing behavior of TiO2 NTs. For this purpose, TiO2 NTs were impregnated
with nanoparticles (NPs) of Ni, Pd, and Pt, respectively. The fabrication
of these group metals-loaded TiO2 sensors to detect H2 in an Ar ambience is needed to monitor ppm to the percentage
level of H2 in Ar cover gas to identify steam generation
leaks in sodium-cooled fast breeder reactors during low operation
or during shutdown or during startup of the reactor.[13,14] We report the results of our investigation in this paper.
Results and Discussion
Structural Studies
X-ray
diffraction (XRD) pattern of TiO2 NTs (Table ) confirms the anatase phase
as most of the reflections are indexed in terms of JCPDS file No:
89-4921 (Figure ).
The additional peaks correspond to characteristic reflections of the
respective metals, as marked in Figure . XRD data from Table affirms the face-centered cubic (FCC) structure of
Pt, Pd, and Ni NPs dispersed on TiO2 NTs [JCPDS Nos. 87-0646,
89-4897 and 04-0850], respectively.[15−17]
Table 1
XRD Data of TiO2 NTs
2θ
25.35
37.67
47.71
53.74
54.84
62.49
70.03
75.11
peaks
(101)
(004)
(200)
(105)
(211)
(204)
(220)
(215)
Figure 1
XRD patterns of TiO2 NTs and their composites.
Table 2
XRD Data
of TiO2 NT Composites
2θ (Pt)
peaks (Pt)
2θ (Pd)
peaks
(Pd)
2θ (Ni)
peaks (Ni)
39.73
(111)
39.67
(111)
45.41
(111)
46.28
(200)
46.28
(200)
51.82
(200)
67.80
(220)
68.61
(220)
77.49
(220)
XRD patterns of TiO2 NTs and their composites.Selected area electron diffraction (SAED) pattern
discloses the polycrystalline nature of pristine TiO2 NTs
(Figure a) as well
as nanocomposites (Figure b,c). The ring patterns of Pt and Pd NPs in their respective
SAED micrographs of the composites show that they are crystalline,
as observed in Figure b,c. The SAED patterns of the nanocomposites reveal that the NPs
are dispersed on the surface of TiO2 NTs only as there
was no change in lattice parameters of TiO2.
Figure 2
SAED patterns
of (a) TiO2 NTs, (b) Pt/TiO2 NTs, and (c) Pd/TiO2 NTs.
SAED patterns
of (a) TiO2 NTs, (b) Pt/TiO2 NTs, and (c) Pd/TiO2 NTs.
Vibrational and Thermal Studies
The Raman spectrum
of the TiO2 NTs shows six characteristic
Raman peaks at wavenumbers 146 (Eg), 199 (Eg), 397.5 (B1g), 510 (A1g), 515.1 (B1g), and 639.2 (Eg) cm–1 for TiO2 NTs[18,19] and all of them characteristic of the tetragonal
anatase phase, are indexed to RRUFF id: R120064, as shown in Figure a. Further, the broadened
peaks signify the nanoparticulate nature of the TiO2 NTs.
On the other hand, the Fourier transform infrared (FT-IR) spectrum
of TiO2 NTs shows three major peaks at 454, 1622, and 3382
cm–1 characteristic peaks of TiO6 octahedral,
deformation mode of chemisorbed water, and stretching mode of hydroxyl
group, respectively (Figure b). The bending and stretching vibration of chemisorbed moisture
are observed at 1622 and 3382 cm–1.[20] Thermal history of TiO2 NTs at higher temperatures
was studied using thermogravimetry–differential thermal analysis
(TG–DTA) (Figure c). Endothermic events marked by gradual weight losses were noticed
at 135 and 225 °C, which are attributed to loss of adsorbed moisture
and chemisorbed hydroxyl groups, whereas the exothermic event at 632
°C without the weight loss is characteristic of phase transformation
of anatase TiO2 to rutile TiO2.[7][7]
Figure 3
(a) Raman spectrum, (b) FT-IR spectrum, and
(c) TG–DTA curves of TiO2 NTs.
(a) Raman spectrum, (b) FT-IR spectrum, and
(c) TG–DTA curves of TiO2 NTs.
Morphological
Studies
The field emission
scanning electron microscope (FESEM) micrographs of TiO2 NT powder and its composites obtained through the rapid breakdown
anodization (RBA) technique are shown in Figure . Well-defined bundles of TiO2 NTs were formed and composed of uniform tubes of length of typically
about 5 μm with wall thickness of around 20–25 nm (Figure a). The length indicates
that the growth rate of the TiO2 NTs is about 20 μm
h–1 since the present length is attained within
the reaction time of 20 min in 0.3 M NaCl electrolyte. Notably, the
literature reports that the bundles could be separated into individual
TiO2 NTs.[21] On the other hand,
TiO2 NT composites loaded with Pt (Figure b), Pd (Figure c), and Ni (Figure d) nanoparticles displayed a slightly different
surface morphology. Each of the composites exhibit the existence of
agglomerated metal NPs as spheres that are present over the bundles
of TiO2 NTs. There is a significant reduction in the wall
thickness of the TiO2 NTs to about 3–4 nm and the
inner tubular diameter to about 15–20 nm, as seen from the
transmission electron microscopy (TEM) image displayed in Figure a.[16] The diameter of the Pt and Pd nanoparticles was about 20
nm (Figure c,e). The
dark and bright field images of pristine TiO2 NTs and nanocomposites
clearly indicate that the metal nanoparticles are present at the periphery
of the tube walls (Figure b,d,f).
Figure 4
FESEM images
of (a) pristine TiO2 NTs, (b) Pt/TiO2 NTs, (c)
Pd/TiO2 NTs, and
(d) Ni/TiO2 NTs.
Figure 5
TEM micrographs;
bright and dark field images corresponding
to (a, b) TiO2 NTs, (c, d) Pt/TiO2 NTs, (e,
f) Pd/TiO2 NTs.
FESEM images
of (a) pristine TiO2 NTs, (b) Pt/TiO2 NTs, (c)
Pd/TiO2 NTs, and
(d) Ni/TiO2 NTs.TEM micrographs;
bright and dark field images corresponding
to (a, b) TiO2 NTs, (c, d) Pt/TiO2 NTs, (e,
f) Pd/TiO2 NTs.
H2 Sensor Studies
H2 sensing response
of thick film sensors made of Pt/TiO2 NTs, Pd/TiO2 NTs, and Ni/TiO2 NTs at the operating temperature of
150 °C in Ar ambience are shown in Figure . All sensors demonstrated a stable baseline
in the Ar atmosphere. While a specified concentration of H2 is introduced into the Ar stream, the resistance of the corresponding
sample decreases systematically. The sensors retrace to the baseline
once the H2 is withdrawn. The origin of the response is
with basic semiconductor oxideTiO2 and is measured by
the changes in resistance. Moreover, the addition of H2 in the ppm level does not change the metallic properties of the
loaded metals significantly. The relative change in the Fermi level
of metals with addition of H2 can also be a factor in the
changes in resistance. Generally, H2 directly interacts
with semiconductors like SnO2,[22] ZnO,[23] etc., leading to the changes in
conductivity, whereas in this case, it does not interact with TiO2 at least in the chosen temperature range. But the addition
of metals introduces the gas-sensing phenomenon. Among the three sensors,
Pt/TiO2 NTs (Figure a) responded to H2 in the range of 500–9000
ppm with the response time of 2–3 s and recovery time of 2–3
s, whereas Pd/TiO2 NTs (Figure b) exhibited a higher response with a working
range of 1000–9000 ppm having nearly same response and recovery
times. On the hand, sensors made of Ni/TiO2 NTs (Figure c) showed a very
poor response to H2. These sensors compared with the reported
sensors with similar materials in the literature[24−32] indicate
the effectiveness of the present sensors (Table ). The mechanism of H2 sensing
by each of the samples is investigated using X-ray photoelectron spectroscopy
(XPS).
Figure 6
Typical H2 sensing response of (a) Pt/TiO2 NTs, (b) Pd/TiO2 NTs, and (c) Ni/TiO2 NTs nanocomposites.
Table 3
Comparison of H2 Sensors Based on Semiconductor
Oxides
semiconductor
oxides
or its composites
synthesis method
operating temperature (°C)
concentration of H2 gas (ppm)
response time (s)
refs
Au or Pt/SnO2
sol–gel annealing
150
10 000
few minutes
(24)
Pd/WO3
sol–gel annealing
20
1000
<100
(25)
Pt/WO3
RF magnetron sputtering
200
200
42
(26)
NiO
magnetron sputtering
400
5000
300
(27)
Pd/SnO2
reactive
magnetron sputtering
200
1000
few minutes
(28)
NiO
pulsed laser
deposition
125
30 000
600
(29)
NiO
hydrothermal
200
100
180
(30)
anatase TiO2
micro-arc oxidation
250
1000
45
(31)
nanoporous TiO2
thermal oxidation
500
500
10
(32)
Pt/TiO2 NTs
rapid breakdown anodization
150
1000
2–3
this
work
Pd/TiO2 NTs
rapid breakdown anodization
150
1000
2–3
this work
Ni/TiO2 NTs
rapid breakdown
anodization
150
1000
15
this work
Typical H2 sensing response of (a) Pt/TiO2 NTs, (b) Pd/TiO2 NTs, and (c) Ni/TiO2 NTs nanocomposites.
Core–Shell
XPS Studies on Pt/TiO2 NT, Pd/TiO2 NT, and Ni/TiO2 NT Nanocomposites
Elements of group 10 of the periodic
table, viz., Ni, Pd, and Pt having electronic configurations 3d8, 4d8, and 5d8, respectively are known
to be efficient hydrogenation catalysts[33,34] with catalytic
activity proportional to their specific surface area. Nanoparticles
of these elements with high specific surface area when dispersed in
TiO2 NTs, are expected to enhance the gas-sensing properties
of TiO2 toward H2. X-ray photoelectron spectroscopy,
the surface-sensitive tool, is ideal to probe the mechanism of interaction
of H2 with TiO2. XPS patterns were recorded
before and after exposure to a specified concentration of 1000 ppm
of H2 in argon (Ar).
Pt/TiO2 NT
Composite before and after Exposure to
H2
The XPS patterns of Pt dispersed TiO2 recorded for the Ti 2p level before and after exposure to H2 are shown in Figure . The patterns are nearly identically exhibiting characteristic
satellites, and no significant changes could be seen after exposure
to 1000 ppm H2. The Ti 2p3/2 pattern of Pt/TiO2 NTs before exposure to H2 shows features that
can be fitted with two peaks. The less intense peak with the center
of 456.8 eV and the high intense peak with the center of 458 eV are
observed. The same features are also seen for the corresponding Ti
2p1/2 components. The binding energy values show that the
peak at 456.8 eV corresponds to Ti3+ ion whereas the peak
at 458 eV corresponds to Ti4+ ion.[35] The 3+ valence for Ti could be due to the oxygen nonstoichiometry
in TiO2. The overall fit gives rise to a correlation coefficient
of 0.99. After exposure to 1000 ppm of H2, the Ti 2p pattern
remains identical without any changes in full width at half-maximum
(FWHM), as shown in Figure b. On the basis of the curve fit, there is no significant
change in the peak characteristic of Ti3+ ion, which implies
that there is no reduction of TiO2 although hydrogen spillover
normally operates in hydrogenation reactions.
Figure 7
Curve fitting of Ti 2p level of Pt/TiO2 NTs (a) in the
presence of 1000 ppm of H2 and (b) absence of H2.
Curve fitting of Ti 2p level of Pt/TiO2 NTs (a) in the
presence of 1000 ppm of H2 and (b) absence of H2.A drastic decrease
in conductivity of the sensor during exposure to 1000 ppm of H2 shows that Pt should have a different role in sensing and
therefore demands the investigation of the oxidation state of Pt.
The XPS pattern of the Pt 4f level in Pt/TiO2 NTs before
exposure shows a complex pattern, indicating at least two different
oxidation states for Pt (Figure a).[36,37] The weak shoulder at the low
binding energy of about 71.5 eV shows the fingerprints of Pt in an
elemental form, whereas the intense peak at around 73.2 eV is characteristic
of Pt2+. Peak fit was carried out for these two species,
and the overall fit gives rise to a correlation coefficient of 0.99.
The two species are elemental Pt and most likely PtO as chemisorption
of oxygen can cause surface oxidation, giving rise to PtO, although
there are no evidences from XRD to support this claim. On the other
hand, the Pt 4f pattern recorded after exposure to H2 shows
reversal in intensity of peaks under consideration, as seen from Figure b. That is, the peak
intensity of the elemental Pt increased at the expense of the Pt2+ peak intensity. This shows that a fraction of the surface
species in which Pt is in +2 oxidation state undergoes reduction upon
exposure to H2 to form elemental Pt.[38] The reduction of surface PtO is responsible for the changes
in conductivity during sensing. Hence, TiO2 remains more
or less a passive medium in Pt/TiO2 NT composite and the
hydrogen spillover by Pt does not operate during sensing. This leaves
the only option that the relative changes in Fermi levels between
PtO/TiO2 and Pt/TiO2 are responsible for the
changes in conductivity of Pt/TiO2 NT composite during
sensing. Incidentally, this reduction reaction (eq ) can occur at as low as 150 °C. The
schematic diagram of the H2 sensing mechanism of Pt/TiO2 NTs is presented in Figure .
Figure 8
Curve fitting of the
Pt 4f level of Pt/TiO2 NTs (a) in the presence of 1000
ppm of H2 and (b) absence of H2.
Figure 9
Schematic diagram of
the probable H2 gas-sensing mechanism for Pt/TiO2 NTs.
Curve fitting of the
Pt 4f level of Pt/TiO2 NTs (a) in the presence of 1000
ppm of H2 and (b) absence of H2.Schematic diagram of
the probable H2 gas-sensing mechanism for Pt/TiO2 NTs.
Pd/TiO2 NTs Nanocomposite
before and after Exposure to H2
XPS studies on
Pd 3d and Ti 2p levels of Pd/TiO2 NT composites were recorded
before and after exposure to 1000 ppm of H2. The Ti 2p
level before exposure to 1000 ppm of H2 is shown in Figure a. A weak shoulder
observed around 456 eV followed by an intense peak at 458 eV shows
that the Ti 2p3/2 curve can be fitted with two peaks, as
shown in the Figure a. The overall fit gives rise to a correlation coefficient of 0.99.
The peaks at 456 and 458 eV are characteristic of Ti3+ and
Ti4+ ions, respectively.[35] The
Ti 2p pattern after exposure to H2 gas shows an increase
in the intensity of the shoulder at 456 eV, which allows us to perform
the curve fitting with two components, and the fitted curves are shown
in Figure b. It
is clear that after exposure to H2, the area under the
peak of Ti3+ is higher than that of the virgin sample,
which confirms the surface reduction of TiO2. This implies
that TiO2 NTs undergo a reduction process upon exposure
to 1000 ppm H2.
Figure 10
Curve fitting
of the Ti 2p level of Pd/TiO2 NTs (a) in the presence of
1000 ppm of H2 and (b) absence of H2.
Curve fitting
of the Ti 2p level of Pd/TiO2 NTs (a) in the presence of
1000 ppm of H2 and (b) absence of H2.The XPS pattern of the Pd 3d level
recorded before exposure is shown in Figure a. The pattern is fitted with a doublet
having the peak position of 336.6 eV for Pd 3d5/2 with
its component Pd 3d3/2 at 342 eV having a spin–orbit
coupling of 5.4 eV.[39] The peak at 336 eV
implies that Pd is in +2 valence state, whereas the XRD pattern provides
the evidence for elemental Pd only and not for PdO. The only way this
can be resolved is that the oxide layer should extend up to a depth
of at least few tens of angstroms as the escape depth of XPS is only
about 10–20 Å. The XPS pattern of the Pd 3d level after
exposure to H2 looks complex showing additional features
(Figure b). A new
peak at 334 eV emerges, which corresponds to elemental Pd along with
the characteristic peak of PdO. A curve fit constrained by the spin–orbit
separation of 5.6 eV among the components and the intensity ratio
of (2J + 1) was carried out, and the fitted curve is shown in Figure b. Upon exposure
to 1000 ppm H2, partial reduction of PdO is observed. XPS
studies show that it is likely that the outer PdO layer undergoes
reduction first to form Pd (eq ), which subsequently transfers hydrogen to TiO2 through the spillover mechanism, causing surface reduction of the
latter. Thus, in the case of Pd/TiO2 NTs, the spillover
mechanism operates during sensing. The observed increase in conductivity
is due to the generation of Ti3+, which acts as a donor
for the conduction band of TiO2 NTs (eqs and 3) (Figure b) in addition to Fermi level
changes of PdO/TiO2 to Pd/TiO2. Incidentally,
the higher response exhibited by thick films of Pd/TiO2 sensor toward H2 than that of Pt/TiO2 indirectly
confirms this result. The schematic diagram of the H2 sensing
mechanism of Pd/TiO2 NTs is presented in Figure , and the proposed sensing
reactions at 150 °C proceed through the following reactions (eqs –4).
Figure 11
Curve fitting of the
Pd 3d level of Pd/TiO2 NTs (a) in the presence of 1000
ppm of H2 and (b) absence of H2.
Figure 12
Schematic diagram of
the probable H2 gas-sensing mechanism for Pd/TiO2 NTs.
Curve fitting of the
Pd 3d level of Pd/TiO2 NTs (a) in the presence of 1000
ppm of H2 and (b) absence of H2.Schematic diagram of
the probable H2 gas-sensing mechanism for Pd/TiO2 NTs.
Ni/TiO2 NTs Nanocomposite before and
after Exposure to 1000 ppm H2
The Ti 2p recorded
before and after exposure to 1000 ppm H2 of Ni/TiO2 NT composite is shown in Figure a. The curve fit was carried using constraints
of spin–orbit separation of about 6.0 eV and the intensity
ratio of (2J + 1). Only a single doublet of Ti 2p3/2 and
Ti 2p1/2 without any additional feature is observed. The
position of the 2p3/2 peak shows that Ti is in a +4 valence
state. After exposure, the pattern remains the same, indicating nearly
all of the Ti is in the +4 valence state even after exposure.
Figure 13
Curve fitting
of the Ti 2p level of Ni/TiO2 NTs (a) in the presence of
1000 ppm H2 and (b) absence of H2.
Curve fitting
of the Ti 2p level of Ni/TiO2 NTs (a) in the presence of
1000 ppm H2 and (b) absence of H2.The Ni 2p pattern before exposure exhibits a complex pattern with
different valence states for nickel, as shown in Figure a. However, the XRD pattern
shows a face-centered cubic nickel pattern without any impurity lines
for NiO, implying that the valence state higher than the elemental
state should be arising from the oxidized surface of nickel, as attested
by the characteristic satellites at 852 and 870 eV for Ni2+ and elemental Ni.[40,41] Curve fitting was carried out
using spin–orbit coupling of 17.3 eV and the intensity ratio
of (2J + 1) and is shown in Figure b. A strong line at 853 eV shows elemental Ni and another
strong peak at 856 eV shows the Ni2+ in Ni/TiO2 NT composite before exposure.[42] However,
after exposure to H2, a nearly identical pattern is observed,
as seen from Figure b. Neither the peak shape nor FWHM undergo a change, implying that
hydrogen interaction did not have any effect on Ni at this operating
temperature. In other words, although nickel is used as a catalyst
for hydrogenation reactions, the temperature is too low for nickel
to interact with H2 (Figure ). Hence, the response toward H2 was very insignificant compared to that of Pt or Pd dispersed TiO2 NTs.
Figure 14
Curve fitting of Ni
2p level of Ni/TiO2 NTs (a) in the presence of 1000 ppm
H2 and (b) absence of H2.
Figure 15
Schematic
diagram of the probable H2 gas-sensing mechanism for Ni/TiO2 NTs.
Curve fitting of Ni
2p level of Ni/TiO2 NTs (a) in the presence of 1000 ppm
H2 and (b) absence of H2.Schematic
diagram of the probable H2 gas-sensing mechanism for Ni/TiO2 NTs.
Conclusions
Hydrogen-sensing
properties of TiO2 NTs impregnated with nanoparticles of
Ni, Pd, and Pt are presented.
Among the three, the sensitivity is the highest for Pd/TiO2 NTs. The sensitivity of Pt/TiO2 NTs is reasonably good,
whereas it is poor for Ni/TiO2 NTs. XPS studies show that
the oxide surface of Pd reduces to elements and causes the generation
of Ti3+ ion in TiO2 nanotubes through hydrogen
spillover. In the case of Pt/TiO2 NTs, only reduction of
the oxide layer of Pt nanoparticle takes place without any changes
in TiO2 NTs. For Ni/TiO2 NTs, neither the reduction
of oxide surface over Ni nor Ti4+ to Ti3+ in
TiO2 occurs. Relative to Ni 3d or Pt 5d, the overlap of
Pd 4d orbitals with the conduction band of TiO2 along with
spillover effect is responsible for the high sensitivity for Pd.
Experimental Section
Materials and Reagents
The RBA technique was applied using a two-electrode system with
Ti foil (99.7%, 1 × 2.5 × 2.5 mm3, Good Fellow)
as the anode and Pt gauze (99.9%, 52 mesh, 2.5 × 2.5 cm2, Sigma-Aldrich) as the cathode. NaCl (0.3 M, Merck) was prepared
using Millipore water and employed as the electrolyte. Chloroplatinic
acid, H2PtCl6 (Sigma-Aldrich), palladium chloride,
PdCl2 (Sigma-Aldrich), and NiCl2·6H2O (Sigma-Aldrich) were employed as precursors for Pt, Pd,
and Ni, respectively. Sodium borohydride, NaBH4 (Merck)
was used as the reducing agent.
Preparation
of TiO2 NT Powder and Metal NPs/TiO2 NTs
The rapid breakdown anodization (RBA) process
was conducted using degreased Ti foil and Pt gauze as the working
and counter electrodes, respectively, in a two-electrode cell with
0.3 M NaCl of pH 4.4 as the electrolyte.[35] A potential of 20 V was applied for conduction of the RBA process.
As the RBA process proceeded, TiO2 NTs fell into the electrolyte
as bundles and were later collected in their powder form to dry overnight
in an oven at 70 °C.[43] Thereafter,
the dried sample was annealed at 450 °C for 3 h to achieve better
crystallinity for the TiO2 NT powder.[3,44] The
Pt/TiO2 NT, Pd/TiO2 NT, and Ni/TiO2 NT composites were prepared by the chemical reduction of H2PtCl6, PdCl2, and NiCl2·6H2O over TiO2 NTs using NaBH4 as the reducing
agent, correspondingly.
Sensor Assembly and Measurement
Conditions
About 1
g of Pt/TiO2 NT powder was mixed thoroughly with a calculated
quantity of tetraethyl orthosilicate (TEOS) and an organic binder.
The composition was allowed to cure for about 12 h, and thereafter
it was screen-printed on alumina substrates coated with electrodes
for the sensing process. The thick films were annealed at 425 °C
for 10 h. The substrates were mounted on a specially designed testing
chamber provided with an inlet and outlet valve for argon (Ar) containing
a specified concentration of H2 gas, and the sensor studies
were carried out at 150 °C. The sensor was tested in an Ar ambience,
since the condition is required to monitor trace levels of H2 gas in Ar cover gas of the sodium-cooled fast breeder reactors at
low operation, in shutdown monitoring, and at startup of the reactor.[13,14,45] The sensor samples displayed
a steady baseline at around 90 MΩ in pristine Ar ambience, and
at the introduction of H2 gas in Ar (H2/Ar),
the baseline signal indicated increase in conductance. The changes
in resistivity were measured using Agilent digital multimeter (34972A)
interfaced to a computer. XPS studies were carried out on thick films
before and after exposure to hydrogen to understand the mechanism
of sensing. For this study, the virgin sensor (i.e., before the injection
of H2/Ar) was subjected to XPS studies. Thereafter, the
sensor after being purged with 1000 ppm H2/Ar at 150 °C
was analyzed for the surface phenomenon using XPS. Both the XPS studies
are compared to understand the changes with respect to injection of
H2/Ar and are utilized to propose the plausible mechanism.
Likewise, the studies were also performed on Pd/TiO2 NTs
and Ni/TiO2 NTs to assess their response patterns and sensing
mechanisms.[45]
Characterization
of Materials
The
Inel Equinox 2000 X-ray Diffractometer (XRD) of ThermoFisher Scientific
was utilized to acquire the real-time crystal pattern of the sample
using Cu Kα1 radiation of wavelength 1.5406 Å.
Transmission electron microscopy (TEM, LIBRA 200 TEM, Carl Zeiss,
Germany) was employed to investigate the crystal structures of modified
Pt, Pd, and Ni and pristine TiO2 NTs. Raman spectroscopy
was carried out using the Raman Microscope, inVia, U.K. FT-IR analysis
was performed using Perkin-Elmer spectrum 2. Morphology of the samples
was analyzed using FESEM (Carl Zeiss Auriga system, Germany) in the
secondary emission mode. The thermal history of the samples was evaluated
using TG–GTA using Perkin-Elmer FTA 6000. The chemical states
of the elements Ni, Pd, Pt, Ti, and O, before and after the exposure
to hydrogen gas of the prepared composites, were analyzed using the
SPECS X-ray photoelectron spectrometer (XPS), Germany.
Authors: M Horprathum; T Srichaiyaperk; B Samransuksamer; A Wisitsoraat; P Eiamchai; S Limwichean; C Chananonnawathorn; K Aiempanakit; N Nuntawong; V Patthanasettakul; C Oros; S Porntheeraphat; P Songsiriritthigul; H Nakajima; A Tuantranont; P Chindaudom Journal: ACS Appl Mater Interfaces Date: 2014-12-09 Impact factor: 9.229