| Literature DB >> 32456159 |
Yuyang Ma1, Xiujuan Hu2, Zhenlin Hu1, Ziqian Sheng1, Shixiang Ma1, Yanwu Chu1, Qing Wan1, Wei Luo3, Lianbo Guo1.
Abstract
Metal-based additive manufacturing (AM) is a disruptive technique with great potential across multiple industries; however, its manufacturing quality is unstable, leading to an urgent requirement for component properties detection. The distribution of grain size has an important effect on many mechanical properties in AM, while the distribution of added elements, such as titanium (Ti), has a measurable effect on the grain size of an aluminum (Al) alloy. Therefore, the detection of the distributions of grain size and elements is of great significance for AM. In this study, we investigated the distribution of grain size and elements simultaneously for wire + arc additive manufacturing (WAAM) with an Al alloy using laser opto-ultrasonic dual (LOUD) detection. The average grain size obtained from the acoustic attenuation of ultrasonic signals was consistent with the results of electron backscatter diffraction (EBSD), with a coefficient of determination (R2) of 0.981 for linear fitting. The Ti element distribution obtained from optical spectra showed that the enrichment of Ti corresponded to the grain refinement area in the detected area. The X-ray diffraction (XRD) spectra showed that the spectral peaks were moved from Al to AlTi and Al2Ti forms in the Ti-rich areas, which confirmed the LOUD results. The results indicated that LOUD detection holds promise for becoming an effective method of analyzing the mechanical and chemical properties of components simultaneously, which could help explain the complex physical and chemical changes in AM and ultimately improve the manufacturing quality.Entities:
Keywords: LOUD detection; elemental composition; grain size distribution; wire + arc additive manufacturing
Year: 2020 PMID: 32456159 PMCID: PMC7287923 DOI: 10.3390/ma13102404
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.623
Figure 1Schematic diagram of the experimental setup. A 532 nm Nd: YAG laser was used to ablate the sample surface. The optical spectrum signals were collected by an optical collector and guided by a fiber to a spectrometer. The ultrasonic signals were gathered with an ultrasound probe and guided to a data acquisition card (DAQ). A digital delay generator (DDG) was utilized to trigger the laser, DAQ card, and charge-coupled device (CCD) detector in the experiments.
Figure 2Pictures of five wire + arc additive manufacturing (WAAM) samples with different processing parameters.
Processing Parameters.
| Sample | Arc Current (A) | Arc Voltage (V) | Wire Feed (m/min) | Scanning Speed (mm/s) | Interlayer Wait-Time (s) | Heat Input (J/mm) |
|---|---|---|---|---|---|---|
| 1 | 117 | 12 | 9 | 8.42 | 180 | 150 |
| 2 | 117 | 12 | 9 | 7.22 | 180 | 175 |
| 3 | 117 | 12 | 9 | 6.32 | 180 | 200 |
| 4 | 117 | 12 | 9 | 6.32 | 120 | 200 |
| 5 | 117 | 12 | 9 | 6.32 | 60 | 200 |
Chemical compositions.
| Elements (wt. %) | Cu | Mg | Si | Fe | Cr | Zr | Zn | Mn | Ti | Al |
|---|---|---|---|---|---|---|---|---|---|---|
| Wire (ER2319) | 6.010 | 0.004 | 0.044 | 0.172 | 0.003 | 0.100 | 0.007 | 0.270 | 0.104 | rest |
Figure 3Schematic of optical spectra and ultrasonic signals simultaneously detected using laser opto-ultrasonic dual (LOUD) detection. (a) The optical spectrum and ultrasonic wave generated by laser ablation. The electron backscatter diffraction (EBSD) surface was parallel to the ultrasonic wave propagation direction. (b) Optical spectra peaks of Ti collected from the samples. (c) The ultrasonic signals show the amplitude attenuation from head wave to first echo.
Figure 4The measurements of grain size using EBSD and LOUD. (a) The EBSD maps of Samples 1–5 showing the grain size distribution. (b) The grain size measurements from the EBSD maps. (c) The distributions of grain size determined from the acoustic attenuation coefficient by LOUD for Samples 1–5, presented as blue histograms.
Figure 5Comparison of characterization of grain size in Samples 1–5 between LOUD and EBSD. (a) The average grain size of Samples 1–5 was measured using EBSD (solid black line), and the acoustic attenuation coefficient of Samples 1–5 was detected using LOUD (dotted red line). (b) Linear fitting for grain size dependent on acoustic attenuation coefficient.
Figure 6The measurements of Sample 3. (a) Schematic of LOUD mapping for Sample 3. (b) The mapping of Ti for Sample 3. (c) The mapping of the acoustic attenuation coefficient for Sample 3. (d) The EBSD map from the area of the abnormal acoustic attenuation coefficient (black dotted line area in (c)) in Sample 3. (e) The X-ray diffraction (XRD) pattern of normal areas and Ti-rich areas (white dotted line area in (b)) for Al and Al-Ti in Sample 3.