Literature DB >> 32455425

Magnetic-structure imaging in polycrystalline materials by specimen-tilt-series averaged DPC STEM.

Yoshiki O Murakami1, Takehito Seki1, Akihito Kinoshita2, Tetsuya Shoji2, Yuichi Ikuhara1,3, Naoya Shibata1,3.   

Abstract

Differential phase contrast (DPC) imaging in scanning transmission electron microscopy is a technique to visualize electromagnetic field distribution inside specimens at high spatial resolution. However, diffraction contrast strongly hampers electromagnetic contrast in DPC images especially in polycrystalline samples. In this paper, we develop an imaging technique to effectively suppress diffraction contrast in DPC images. It is shown that a magnetic structure in a Nd-Fe-B permanent magnet was clearly visualized by averaging 64 DPC images with various specimen-tilt conditions. This is because the diffraction contrast in DPC images sensitively and randomly varies with crystal orientation and thus almost vanishes by averaging specimen-tilt image series. We further investigated two types of residual diffraction contrast in the tilt-series averaged DPC images: weak contrast inside grains and strong contrast at grain boundaries. We found that the former can be suppressed by averaging more DPC images, while the latter can be suppressed by the tilt-series averaging with wider range of specimen tilt. The tilt-series averaging method enables DPC to visualize electromagnetic structures even inside polycrystalline materials.
© The Author(s) 2020. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.

Entities:  

Keywords:  LACBED; Nd-Fe-B; differential phase contrast; diffraction contrast; magnetic domain; permanent magnet

Year:  2020        PMID: 32455425     DOI: 10.1093/jmicro/dfaa029

Source DB:  PubMed          Journal:  Microscopy (Oxf)        ISSN: 2050-5698            Impact factor:   1.571


  1 in total

1.  Development of tilt-scan system for differential phase contrast scanning transmission electron microscopy.

Authors:  Yuji Kohno; Akiho Nakamura; Shigeyuki Morishita; Naoya Shibata
Journal:  Microscopy (Oxf)       Date:  2022-04-01       Impact factor: 1.571

  1 in total

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