| Literature DB >> 32344792 |
Marco Moretti Sala1, Marco Salluzzo2, Matteo Minola3, Gabriella Maria De Luca2,4, Greta Dellea1, Vesna Srot3, Yi Wang3, Peter A van Aken3, Matthieu Le Tacon5, Bernhard Keimer3, Claudia Dallera1, Lucio Braicovich1, Giacomo Ghiringhelli1,6.
Abstract
Epitaxial films of high critical temperature ( T c ) cuprate superconductors preserve their transport properties even when their thickness is reduced to a few nanometers. However, when approaching the single crystalline unit cell (u.c.) of thickness, T c decreases and eventually, superconductivity is lost. Strain originating from the mismatch with the substrate, electronic reconstruction at the interface and alteration of the chemical composition and of doping can be the cause of such changes. Here, we use resonant inelastic x-ray scattering at the Cu L 3 edge to study the crystal field and spin excitations of NdBa 2 Cu 3 O 7 - x ultrathin films grown on SrTiO 3 , comparing 1, 2 and 80 u.c.-thick samples. We find that even at extremely low thicknesses, the strength of the in-plane superexchange interaction is mostly preserved, with just a slight decrease in the 1 u.c. with respect to the 80 u.c.-thick sample. We also observe spectroscopic signatures for a decrease of the hole-doping at low thickness, consistent with the expansion of the c-axis lattice parameter and oxygen deficiency in the chains of the first unit cell, determined by high-resolution transmission microscopy and x-ray diffraction.Entities:
Keywords: resonant inelastic x-ray scattering; superconductivity; unit cell-thick films
Year: 2020 PMID: 32344792 PMCID: PMC7221900 DOI: 10.3390/nano10040817
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1Scanning Transmission Electron Microscopy (STEM) images of epitaxial NBCO ultrathin films grown on STO with an overlay of the NBCO structural model. Images were obtained with the high-angle annular dark-field (HAADF) (panels a,c) and annular bright-field (ABF) (panels b,d) techniques. Panels (a,b) are for the 1 u.c. thick film, panels (c,d) for the 2 u.c. thick film. The details of atom position assignment is shown in panel (f). The scheme of the film growth structure is shown in panel (e).
Figure 2Panel (a) XAS measurements in total electron yield (TEY) mode of 2 u.c.-thick NdBaCuO film covered with a 2.4 nm-thick amorphous layer of the same material (red line) and of the 2.4 nm-thick amorphous layer alone (black line). Panel (b) Resistivity measurements of 1 u.c. (black symbols), 2 u.c. (red symbols), 9 u.c. (gray symbols) -thick NdBaCuO films covered with a 2.4 nm-thick amorphous layer of the same material and of 80 u.c.-thick NdBaCuO film (blue symbols) with no capping layer.
Figure 3Panel (a) RIXS measurements of magnetic excitations in 1 u.c.-thick NdBaCuO film as a function of momentum transfer . Panel (b) Comparison between the RIXS spectra at r.l.u. of 1, 2 and 80 u.c.-thick NdBaCuO films after normalization to the area of the excitations. Also shown is the RIXS spectrum of a 2.4 nm-thick amorphous layer of NdBaCuO, rescaled by a factor 10. The inset shows the same data normalized to the acquisition time.
Figure 4Panels (a–c): Fit to the RIXS spectra of 80, 2 and 1 u.c-thick NdBaCuO films at r.l.u.
Figure 5(a) Dispersion and (b) FWHM of magnetic excitations in 1 (black circles), 2 (red diamonds) and 80 (blue squares) u.c.-thick NdBaCuO films. Continuous (dotted) lines show the corresponding optical (acoustic) magnetic branch used to fit the dispersion.