| Literature DB >> 32244429 |
Mariano Andrés Paulin1, Gaston Garbarino2, Ana Gabriela Leyva3,4, Mohamed Mezouar2, Joaquin Sacanell3,5.
Abstract
Ceria (CeO2)-based materials are widely used in applications such as catalysis, fuel cells and oxygen sensors. Its cubic fluorite structure with a cell parameter similar to that of silicon makes it a candidate for implementation in electronic devices. This structure is stable in a wide temperature and pressure range, with a reported structural phase transition to an orthorhombic phase. In this work, we study the structure of CeO2 under hydrostatic pressures up to 110 GPa simultaneously for the nanometer- and micrometer-sized powders as well as for a single crystal, using He as the pressure-transmitting medium. The first-order transition is clearly present for the micrometer-sized and single-crystal samples, while, for the nanometer grain size powder, it is suppressed up to at least 110 GPa. We show that the stacking fault density increases by two orders of magnitude in the studied pressure range and could act as an internal constraint, avoiding the nucleation of the high-pressure phase.Entities:
Keywords: X-ray diffraction; ceria; high pressure; nanoparticles; stacking faults
Year: 2020 PMID: 32244429 PMCID: PMC7221606 DOI: 10.3390/nano10040650
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1X-ray diffraction patterns for different pressure of MICRO (a) and NANO (b) CeO2, symbols * and † represent reflections from Helium and Rhenium, respectively. (c) and (d) show reciprocal space reconstructions of (h1l) and (hkh) layers, respectively, of the single-crystal at 10 GPa.
Figure 2(a) Lattice parameters of the cubic structure (aCUBIC) for the CRYSTAL, MICRO and NANO samples in the function of pressure. In the case of the NANO sample, the cubic lattice parameter was calculated for each independent reflection ((111), (200), (220) and (311)). (b) Pressure dependence of the logarithmic derivative of the lattice parameter respect to the pressure, for both the MICRO and NANO samples. (c) Pressure dependence of the ratio ; a clear deviation from pressure above 50 GPa can be observed.
Figure 3Pressure dependence of the stacking fault density calculated for the NANO sample using Equation (4), see text.
Figure 4(a) Pressure dependence of the unit cell volume obtained using a LeBail refinement for the CRYSTAL and MICRO samples and using Equation (5) for the NANO sample in order to get the volume without the effect of stacking faults (see text). (b) Pressure dependence of the difference between the experimental data and the third-order Birch–Murnaghan equation of state.
The equation of state parameters for the CRYSTAL, MICRO and NANO samples. For the CRYSTAL sample, only the low-pressure phase parameters are presented. For the MICRO sample, the low- and high-pressure parameters are shown.
| Sample/Parameter |
| ||
|---|---|---|---|
| CRYSTAL low pressure | 158.4 ± 0.2 | 195 ± 10 | 5.2 ± 0.7 |
| MICRO low pressure | 158.39 ± 0.04 | 202 ± 1 | 4.25 ± 0.04 |
| MICRO high pressure | 146.2 ± 0.4 | 219 ± 6 | 4.1 ± 0.1 |
| NANO | 159.9 ± 0.2 | 169.5 ± 3 | 5.2 ± 0.1 |